BS EN ISO 2808:2019 – TC
$258.95
Tracked Changes. Paints and varnishes. Determination of film thickness
Published By | Publication Date | Number of Pages |
BSI | 2019 | 125 |
This document describes methods for measuring the thickness of coatings applied to a substrate. Methods for determining wet-film thickness, dry-film thickness and the film thickness of uncured powder layers are described.
For each method described, this document provides an overview of the field of application, existing standards and the precision.
Information on measuring film thickness on rough surfaces is given in Annexร B.
Information on measuring film thickness on wooden substrates is given in Annexร C.
PDF Catalog
PDF Pages | PDF Title |
---|---|
1 | compares BS EN ISO 2808:2019 |
2 | TRACKED CHANGES Test example 1 |
3 | BS EN ISO 2808:2019 to BS EN ISO 2808:2007 |
5 | BS EN ISO 2808:20072019 BRITISH STANDARD National foreword Compliance with a British Standard cannot confer immunity from legal obligations. This British Standard was published under the authority of the Standards Policy and Strategy Committee on 30 MarchSeptember 20072019. Amendmentscorrigenda issued since publication |
7 | ForewordEuropean foreword |
9 | Untitled |
11 | Foreword |
13 | Introduction |
14 | 1 Scope 2 Normative references 3 Terms and definitions 3.1 |
15 | 3.53.3 3.63.4 3.73.5 3.83.6 3.93.7 3.103.8 3.113.9 |
16 | 3.123.10 |
18 | 3.163.14 3.173.15 |
19 | 4 Determination of wet-film thickness 4.1 General 4.2 Mechanical methods 4.2.1 Principle 4.2.2 Field of application 4.2.3 General 4.2.4 Method 1A โ Comb gauge |
20 | Figure 1 โ Example of a comb gauge 4.2.5 Method 1B โ Wheel gauge |
21 | Figure 2 โ Example of a wheel gauge 4.2.6 Method 1C โ Dial gauge |
22 | Figure 3 โ Example of a Examples of an analogue and a digital dial gauge |
23 | 4.2.6.2 Procedure 4.3 Gravimetric method 4.3.1 Principle 4.3.2 Field of application 4.3.3 General |
24 | 4.3.4 Method 2 โ By difference in mass 4.3.4.2 Procedure 4.4 Photothermal method 4.4.1 Principle |
25 | Figure 4 โ Representation of radiometric detection 4.4.2 Field of application 4.4.3 General 4.4.4 Method 3 โ Determination using thermal properties 4.4.4.1.2 Reference standardsmaterial |
26 | 4.4.4.2 Calibration 4.4.4.3 Procedure 5 Determination of dry-film thickness 5.1 General 5.2 Mechanical methods 5.2.1 Principle 5.2.2 Field of application 5.2.3 General |
27 | 5.2.4 Method 4A โ By difference in thickness 5.2.4.1.1.2 Version 1 โ Fixed to a stand 5.2.4.1.1.3 Version 2 โ Hand-held (see Figure 5) Figure 5 โ Outside micrometermicrometre |
28 | 5.2.4.1.2.2 Version 1 โ Fixed to a stand Figure 6 โ Dial gauge fixed to a stand |
29 | Figure 7 โ Foil thickness gauge |
30 | 5.2.5 Method 4B โ Depth gauging Figure 8 โ Micrometer depth gauge |
31 | Figure 9 โ Dial depth gauge 5.2.5.2 Procedure 5.2.6 Method 4C โ Surface profile scanning |
32 | Figure 10 โ Surface profile scanner 5.3 Gravimetric method 5.3.1 Principle The dry-film thickness, td, in micrometres, is calculated from the difference between the mass of the uncoated specimen and that of the coated specimen using the following equationFormula (2): (2) |
33 | 5.3.2 Field of application 5.3.3 General 5.3.4 Method 5 โ By difference in mass 5.3.4.2 Procedure 5.4 Optical methods 5.4.1 Principle |
34 | Figure 11 โ Cross-sectioned specimen |
35 | Figure 12 โ Symmetrical cut, conical bore and sloping cut |
36 | Figure 13 โ White-light interferometry 5.4.2 Field of application 5.4.3 General |
37 | 5.4.4 Method 6A โ Cross-sectioning 5.4.4.1.1.2 Embedding medium 5.4.4.1.1.3 Grinding and polishing media 5.4.4.1.1.4 Measuring microscope 5.4.4.1.2 Procedure 5.4.4.2 Version 2 โ By cutting 5.4.4.2.1.2 Measuring microscope 5.4.4.2.2 Procedure |
38 | 5.4.5 Method 6B โ Wedge cut 5.4.5.1.2 Cutter 5.4.5.1.3 Measuring microscope or digital measurement equipment 5.4.5.2 Procedure 5.4.6 Method 6C โ White-light interferometry 5.4.6.1.2 Reference material 5.4.6.2 Procedure |
39 | 5.5 Magnetic methods 5.5.25.5.1 Principle 5.5.35.5.2 Field of application 5.5.45.5.3 General 5.5.55.5.4 Method 7A โ Magnetic pull-off gauge |
40 | Figure 1314 โ Magnetic pull-off gauge 5.5.65.5.5 Method 7B.1 โ Magnetic-flux gauge |
41 | Figure 1415 โ Hall probe 5.5.75.5.6 Method 7C7B.2 โ Magnetic field change, magnetic-induction gaugeprinciple |
42 | Figure 16 โ Principle of magnetic-induction gauge (Adapted from ISO 2178:2016, Figure 2) |
43 | 5.5.85.5.7 Method 7D7C โ Eddy-current gauge |
44 | Figure 17 โ Example for the eddy current method (Adapted from ISO 2360:2017, Figure 1) 5.6 Radiological method 5.6.1 Principle 5.6.2 Field of application 5.6.3 General |
45 | 5.6.4 Method 8 โ Beta backscatter method Figure 1718 โ Beta backscatter method 5.6.4.3 Procedure 5.7 Photothermal method 5.7.1 Principle |
46 | Figure 19 โ Representation of radiometric detection |
47 | 5.7.2 Field of application 5.7.3 General 5.7.4 Method 9 โ Determination using thermal properties 5.7.4.1.2 Reference standardsmaterials 5.7.4.2 Verification 5.7.4.3 Procedure |
48 | 5.8 Acoustic method 5.8.1 Principle 5.8.2 Field of application 5.8.3 General 5.8.4 Method 10 โ Ultrasonic thickness gaugereflection |
49 | Figure 1920 โ Ultrasonic thickness gaugemethod |
50 | 5.9 Electromagnetic method 5.9.1 Method 11 โ Terahertz method Figure 21 โ Principle of terahertz measurement |
51 | 5.9.1.2 Field of application 5.9.1.3 General 6 Determination of thickness of uncured powder layers 6.1 General 6.2 Gravimetric method 6.2.1 Principle 6.2.2 Field of application |
52 | 6.2.3 General 6.2.4 Method 1112 โ By difference in mass 6.2.4.2 Procedure 6.3 Magnetic methods 6.3.1 Principle 6.3.2 Field of application 6.3.3 General 6.3.4 Method 12A13A โ Magnetic-induction gaugemethod |
53 | Figure 22 โ Measurement of a powder coating illustrated with the example of a magnetic induction probe |
54 | 6.3.4.2 Procedure 6.3.5 Method 12B13B โ Eddy-current gauge Figure 23 โ Eddy current method 6.3.5.2 Procedure |
55 | 6.4 Photothermal method 6.4.1 Principle 6.4.2 Field of application 6.4.3 General 6.4.4 Method 1314 โ Determination using thermal properties 6.4.4.1.2 Reference standardsmaterials 6.4.4.2 Verification |
56 | 6.4.4.3 Procedure 87 Test report |
57 | Annex A (informative) |
59 | Table A.1 โ Overview: Determination of wet-film thickness |
61 | Table A.3 โ Overview: Determination of the thickness of uncured powder layers |
63 | 7.3B.3 Procedure 7.3.1B.3.1 Verification 7.3.2B.3.2 Measurement 7.3.3B.3.3 Number of readings |
64 | Annex C (informative) C.1 General C.2 Random sampling Figure C.1 โ Spacing of chips on the panel C.3 Penetrating coating material |
65 | Figure C.2 โ Measurements on porous substrates Figure C.3 โ Measurements on softwoods C.4 Orientation of measurements |
66 | Bibliography |
69 | undefined |
71 | European foreword Endorsement notice |
74 | Foreword |
75 | Introduction |
76 | 1 Scope 2 Normative references 3 Terms and definitions |
80 | 4 Determination of wet-film thickness 4.1 General 4.2 Mechanical methods 4.2.1 Principle 4.2.2 Field of application 4.2.3 General 4.2.4 Method 1A โ Comb gauge |
81 | 4.2.5 Method 1B โ Wheel gauge |
82 | 4.2.6 Method 1C โ Dial gauge |
84 | 4.3 Gravimetric method 4.3.1 Principle 4.3.2 Field of application 4.3.3 General 4.3.4 Method 2 โ By difference in mass |
85 | 4.4 Photothermal method 4.4.1 Principle 4.4.2 Field of application 4.4.3 General |
86 | 4.4.4 Method 3 โ Determination using thermal properties 5 Determination of dry-film thickness 5.1 General 5.2 Mechanical methods 5.2.1 Principle |
87 | 5.2.2 Field of application 5.2.3 General 5.2.4 Method 4A โ By difference in thickness |
90 | 5.2.5 Method 4B โ Depth gauging |
92 | 5.2.6 Method 4C โ Surface profile scanning |
93 | 5.3 Gravimetric method 5.3.1 Principle |
94 | 5.3.2 Field of application 5.3.3 General 5.3.4 Method 5 โ By difference in mass 5.4 Optical methods 5.4.1 Principle |
97 | 5.4.2 Field of application 5.4.3 General |
98 | 5.4.4 Method 6A โ Cross-sectioning |
99 | 5.4.5 Method 6B โ Wedge cut 5.4.6 Method 6C โ White-light interferometry |
100 | 5.5 Magnetic methods 5.5.1 Principle 5.5.2 Field of application 5.5.3 General 5.5.4 Method 7A โ Magnetic pull-off gauge |
101 | 5.5.5 Method 7B.1 โ Magnetic-flux gauge |
102 | 5.5.6 Method 7B.2 โ Magnetic field change, magnetic-induction principle |
103 | 5.5.7 Method 7C โ Eddy-current gauge |
104 | 5.6 Radiological method 5.6.1 Principle 5.6.2 Field of application 5.6.3 General |
105 | 5.6.4 Method 8 โ Beta backscatter method 5.7 Photothermal method 5.7.1 Principle |
106 | 5.7.2 Field of application 5.7.3 General 5.7.4 Method 9 โ Determination using thermal properties |
107 | 5.8 Acoustic method 5.8.1 Principle 5.8.2 Field of application 5.8.3 General 5.8.4 Method 10 โ Ultrasonic reflection |
108 | 5.9 Electromagnetic method 5.9.1 Method 11 โ Terahertz method |
110 | 6 Determination of thickness of uncured powder layers 6.1 General 6.2 Gravimetric method 6.2.1 Principle 6.2.2 Field of application 6.2.3 General 6.2.4 Method 12 โ By difference in mass |
111 | 6.3 Magnetic methods 6.3.1 Principle 6.3.2 Field of application 6.3.3 General 6.3.4 Method 13A โ Magnetic-induction method |
112 | 6.3.5 Method 13B โ Eddy-current |
113 | 6.4 Photothermal method 6.4.1 Principle |
114 | 6.4.2 Field of application 6.4.3 General 6.4.4 Method 14 โ Determination using thermal properties 7 Test report |
116 | Annex A (informative) Overview of methods |
119 | Annex B (informative) Measurement of film thickness on rough surfaces |
121 | Annex C (informative) Factors affecting the precision of readings obtained when measuring on wooden substrates |
123 | Bibliography |