BS IEC 62525:2007

$215.11

Standard test interface language (STIL) for digital test vector data

Published By	Publication Date	Number of Pages
BSI	2007	144

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Description

Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.

Additional information

Status	Definitive
Pages	144
Publication Date	2007-12-31
ISBN	978 0 580 59313 0
Standard Number	BS IEC 62525:2007
Title	Standard test interface language (STIL) for digital test vector data
Identical National Standard Of	IEC 62525:2007
Descriptors	Automatic, Vectors (mathematics), Information exchange, Programming languages, Interfaces (data processing), Data processing, Computer applications, Data representation, Data transfer, Simulation, Test equipment
Publisher	BSI
Committee	EPL/501
ICS Codes	19.080 - Electrical and electronic testing

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BS IEC 62525:2007

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