BS IEC 63003:2015:2016 Edition

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Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505^TM

Published By	Publication Date	Number of Pages
BSI	2016	174

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Categories: 25.040.01 - Industrial automation systems in general, BSI

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Description

The scope of this standard is the definition of a pin map utilizing the IEEE 1505^{™ 1} receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.

Additional information

Status	Definitive
Pages	174
Publication Date	2016-01-31
ISBN	978 0 580 91106 4
Standard Number	BS IEC 63003:2015
Title	Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505TM
Identical National Standard Of	IEC 63003:2015
Descriptors	Records (documents), Data processing, Life cycle, Software engineering techniques, Data management, Documents, Information, Process control, Data, Life (durability), Computer software
Publisher	BSI
Committee	EPL/501
ICS Codes	25.040.01 - Industrial automation systems in general

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BS IEC 63003:2015:2016 Edition

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