IEEE 592-1990
$61.21
IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors
| Published By | Publication Date | Number of Pages |
| IEEE | 1990 | 10 |
Revision Standard – Inactive-Withdrawn. This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | Title page |
| 3 | Introduction Participants |
| 5 | CONTENTS |
| 7 | 1. Scope 2. References 3. Performance Requirements |
| 8 | 4. Test Procedures 4.1 Test Specimens 4.2 Shield Resistance Test 4.3 Fault-Current Initiation Test |
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