This standard describes the measurement of screening attenuation by the reverberation chamber measurement method, also called mode stirred chamber method. This standard is applicable to screening attenuation measurements of cable assemblies, cables, connectors, and passive microwave components, such as waveguides, phase shifters, diplexers\/multiplexers, power dividers\/combiners and etc. Modern electronic equipments have shown a demand for methods for testing screening attenuation performance of microwave components over their whole frequency range. Convenient measurement methods have existed for lower frequencies and components of regular shape. These measurement methods are described in IEC 62153 series standards. For much higher frequencies and for components of irregular shape, the reverberation chamber method should be used. Theoretically, the reverberation chamber method has no upper limit of the measurement frequency, but it is limited by the quality and sensitivity of the measurement system, and the lower limit of the measurement frequency is restricted by the size of the reverberation chamber.<\/p>\n
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| 2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
| 5<\/td>\n | Annex ZA (normative)Normative references to international publicationswith their corresponding European publications <\/td>\n<\/tr>\n | ||||||
| 6<\/td>\n | Blank Page <\/td>\n<\/tr>\n | ||||||
| 7<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
| 9<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 11<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | 4 Principle of screening attenuation measurement Figure 1 \u2013 System configuration example of screening attenuation by reverberation chamber <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | 5 Measurement equipment 5.1 General test instruments 5.1.1 Frequency synthesizer 5.1.2 Spectrum analyser 5.1.3 Reverberation chamber Figure 2 \u2013 System configuration example of screening attenuation by reverberation chamber with only one spectrum analyser <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | 5.1.4 Mode stirrer 5.1.5 Input antenna 5.1.6 Reference antenna 5.1.7 Stepper motor 5.1.8 Linking devices Table 1 \u2013 Recommended antennas <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | 5.1.9 Other instruments 5.2 Return loss requirements for linking devices 5.3 Sampling system 5.3.1 General 5.3.2 Normal sampling system <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | 5.3.3 Fast sampling system 6 DUT 6.1 DUT preparation 6.1.1 Cables Table 2 \u2013 Number of sampling positions recommended for calibration and test <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 6.1.2 Connector 6.1.3 Cable assemblies 6.1.4 Passive microwave components 6.2 Installation of DUT 7 Measurement procedure <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | 8 Caution notes 8.1 Speed of mode stirrer 8.2 Measurement of lossy DUT 8.3 Oscillation and resonance <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | 8.4 Positioning of spectrum analyser 8.5 High power signal test 8.6 High dynamic range test 9 Acceptance criterion 10 Information to be given in the relevant specification 11 Test report <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | Annex A (informative)Example of a calibrator A.1 Relationship between transfer impedance and screening attenuation <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | A.2 Example of a calibrator Figure A.1 \u2013 Basic construction details <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Cable assemblies, cables, connectors and passive microwave component \u2014 Screening attenuation measurement by the reverberation chamber method<\/b><\/p>\n |