BS ISO 16700:2004
$142.49
Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
| Published By | Publication Date | Number of Pages |
| BSI | 2004 | 26 |
| Status | Withdrawn |
|---|---|
| Title | Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification |
| Publisher | BSI |
| Committee | CII/9 |
| Pages | 26 |
| Publication Date | 2004-09-29 |
| Withdrawn Date | 2016-07-31 |
| Replaced By | BS ISO 16700:2016 |
| ISBN | 0 580 44519 4 |
| Standard Number | BS ISO 16700:2004 |
| Identical National Standard Of | ISO 16700:2004 |
| Descriptors | Electron microscopes, Microscopes, Electron optics, Magnification, Control samples, Optical instruments, Electron beams, Scanning electron microscopes, Accuracy, Optical phenomena, Calibration |
| ICS Codes | 37.020 - Optical equipment |
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