BS ISO 3951-1:2022 – TC
$280.87
Tracked Changes. Sampling procedures for inspection by variables – Specification for single sampling plans indexed by acceptance quality limit (AQL) for lot-by-lot inspection for a single quality characteristic and a single AQL
Published By | Publication Date | Number of Pages |
BSI | 2022 | 320 |
PDF Catalog
PDF Pages | PDF Title |
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1 | compares BS ISO 3951-1:2022 |
2 | TRACKED CHANGES Text example 1 — indicates added text (in green) |
3 | National foreword Contractual and legal considerations Compliance with a British Standard cannot confer immunity from legal obligations. Amendments/corrigenda issued since publication |
5 | COPYRIGHT PROTECTED DOCUMENT |
8 | Foreword |
10 | Introduction CAUTION — The procedures in this part of ISO 3951document are not suitable for application to lots that have been screened for nonconforming items. |
11 | Table 1 — Summary table |
13 | INTERNATIONAL STANDARD ISO 3951-1:2013ISO 3951-1:2022(E) 1 Scope 2 Normative references |
14 | 3 Terms and definitions 3.1 3.2 3.3 3.4 3.5 |
15 | 3.6 3.7 3.8 3.9 3.10 3.11 |
16 | 3.12 3.123.13 3.133.14 3.143.15 L 3.153.16 U 3.163.17 3.173.18 k |
17 | 3.19 3.183.20 Q 3.193.21 3.203.22 3.21 |
18 | 3.223.23 3.233.24 3.243.25 |
19 | 4 Symbols |
21 | 5 Acceptance quality limit (AQL) 5.1 Concept |
22 | 5.2 Use 5.3 Specifying AQLs 5.4 Preferred AQLs 5.5 Caution 5.6 Limitation 5 Choice of a sampling plan 5.1 Choice between variables and attributes |
23 | 5.2 General 5.3 Choice between the s-method and σ-method |
24 | 5.4 Choice of inspection level and AQL |
25 | 6 Standard procedures for the s-method 6.1 General 6.2 Single specification limits |
26 | 6.3 Double specification limits 7 Standard procedures for the σ-method 7.1 General 7.2 Single specification limits |
27 | 7.3 Double specification limits 8 The p*-method |
28 | 6 Switching rules for normal, tightened, and reduced inspection 9 Switching between inspection severities |
29 | 9.1 Rules for switching between inspection severities |
30 | 9.2 Records for switching between inspection severities |
31 | 710 Relation to ISO 2859-1 7.110.1 Similarities 7.210.2 Differences |
32 | 8 Consumer protection 8.1 Use of individual plans 8.2 Consumer’s risk quality (CRQ) tables 8.3 Producer’s risk tables |
33 | 8.4 Operating characteristic (OC) curves 911 Allowing for measurement uncertainty 10 Planning 11 Choice between variables and attributes |
34 | 12 Choice between the s-method and σ-method |
35 | 12 Normality, data transformations and outliers 12.1 Normality 12.2 Data transformations 12.3 Outliers 13 Choice of inspection level and AQL |
36 | 13 Monitoring and recording of inspection results 13.1 Monitoring of inspection results 13.2 Process capability and performance assessment 13.3 Monitoring of process parameters 14 Choice of sampling scheme 14.1 Standard plans |
37 | 14.2 Special plans 14 Tables 14.1 Form k for single sampling plans: s-method |
38 | Table 2 — Single sampling plans of form k for normal inspection: s–method |
40 | Table 3 — Single sampling plans of form k for tightened inspection: s–method |
42 | Table 4 — Single sampling plans of form k for reduced inspection: s–method |
44 | 14.2 Form k for single sampling plans: σ-method |
45 | Table 5 — Single sampling plans of form k for normal inspection: σ–method |
47 | Table 6 — Single sampling plans of form k for tightened inspection: σ–method |
48 | Table 6 (continued) |
49 | Table 7 — Single sampling plans of form k for reduced inspection: σ–method |
50 | Table 7 (continued) |
51 | 14.3 Form p* single sampling plans |
52 | Table 8 — Single sampling plans of form p* for normal inspection (ns sample size for s-method, nσ sample size for σ–method) |
54 | Table 9 — Single sampling plans of form p* for tightened inspection (ns sample size for s-method, nσ sample size for σ–method) |
56 | Table 10 — Single sampling plans of form p* for reduced inspection (ns sample size for s-method, nσ sample size for σ–method) |
58 | 14.4 Values of fσ for maximum process standard deviation (MPSD) Table 11 — Values of fσ for maximum process standard deviation for combined control of double specification limits: σ–method 14.5 Supplementary acceptance constants for qualifying towards reduced inspection Table 12 — Supplementary acceptance constants for qualifying towards reduced inspection |
59 | 15 Preliminary operations 15 Examples 15.1 General |
60 | 15.2 Examples for the s-method |
61 | Figure 2 — Example of the use of an acceptance diagram, s–method |
62 | Figure 3 — Example of the use of an acceptance diagram, s–method |
64 | Figure 4 — Example of the use of an acceptance diagram, s–method |
65 | Figure 5 — Example of the use of a standardized acceptance diagram, s–method |
66 | Figure 6 — Example of the use of an acceptance diagram, s–method |
67 | 15.3 Examples for the σ-method |
68 | Figure 8 — Example of the use of an acceptance diagram, σ–method |
69 | Figure 9 — Example of the use of an acceptance diagram, σ–method |
71 | 15.4 Examples for the p*-method |
74 | 16 Standard procedures for the s-method 16.1 Obtaining a plan, sampling, and preliminary calculations 16.2 Acceptability criteria for single specification limits |
76 | 16.3 Graphical method for a single specification limit Figure 1 — Example of the use of an acceptance chart for a single specification limit, s—method 16.4 Acceptability criterion for combined control of double specification limits 16.4.1 General |
77 | 16.4.2 Procedure for sample size 3 |
78 | 16.4.3 Procedure for sample size 4 For sample size 4 under the s–method, proceed as follows. After calculating the sample mean, , and the sample standard deviation, s, find the applicable value of the coefficient f s from Table D.1, D.2, or D.3. Determine the MSSD (i.e. the maximum all… |
79 | 16.4.4 Procedure for sample sizes greater than 4 |
81 | Figure 2 — Example of the use of an acceptance chart for combined control of double specification limits: s-method with actual scales 17 Standard procedures for the σ-method 17.1 Obtaining a plan, sampling, and preliminary calculations |
82 | Figure 3 — Example of the use of an acceptance chart for combined control of double specification limits: s-method with normalized scales 17.2 Acceptability criteria for a single specification limit |
83 | 17.3 Acceptability criterion for combined control of double specification limits |
84 | 18 Procedure during continuing inspection 19 Normality and outliers 19.1 Normality 19.2 Outliers |
85 | 20 Records 20.1 Control charts 20.2 Lots that are not accepted 21 Operation of switching rules |
86 | 22 Discontinuation and resumption of inspection 23 Switching between the s-method and σ-method 23.1 Estimating the process standard deviation 23.2 State of statistical control 23.3 Switching from the s -method to the σ -method 23.4 Switching from the σ -method to the s -method |
88 | 24 Charts B to R — Operating characteristic curves and tabulated values for single sampling plans, normal inspection: s-method 24.1 Operating characteristic curves and tabulated values for sample size code letter B: s-method |
89 | 24.2 Operating characteristic curves and tabulated values for sample size code letter C: s-method |
90 | 24.3 Operating characteristic curves and tabulated values for sample size code letter D: s-method |
102 | 24.15 Operating characteristic curves and tabulated values for sample size code letter R: s-method |
103 | 25 Charts s-D to s-R — Acceptance curves for combined control of double specification limits: s-method |
105 | Figure 22 — Chart s-F: Acceptance curves for combined control of double specification limits for sample size code letter F under normal and tightened inspection and for sample size code letter H under reduced inspection |
109 | Figure 26 — Chart s-K: Acceptance curves for combined control of double specification limits for sample size code letter K under normal and tightened inspection and for sample size code letter M under reduced inspection |
110 | Figure 27 — Chart s-L: Acceptance curves for combined control of double specification limits for sample size code letter L under normal and tightened inspection and for sample size code letter N under reduced inspection |
111 | Figure 28 — Chart s-M: Acceptance curves for combined control of double specification limits for sample size code letter M under normal and tightened inspection and for sample size code letter P under reduced inspection |
112 | Figure 29 — Chart s-N: Acceptance curves for combined control of double specification limits for sample size code letter N under normal and tightened inspection and for sample size code letter Q under reduced inspection |
113 | Figure 30 — Chart s-P: Acceptance curves for combined control of double specification limits for sample size code letter P under normal and tightened inspection and for sample size code letter R under reduced inspection |
114 | Figure 31 — Chart s-Q: Acceptance curves for combined control of double specification limits for sample size code letter Q under normal and tightened inspection |
116 | Annex A Table for determining the sample size code letter |
117 | Annex A Procedures for obtaining s and σ A.1 Procedure for obtaining s A.1.1 Definition A.1.2 One-pass formula A.1.3 Potential numerical inaccuracy |
118 | A.1.4 An updating algorithm for sequential data A.1.5 Spreadsheets and pocket calculators |
119 | A.2 Procedure for obtaining σroot A.2.1 Definition A.2.2 Simplication for equal sample sizes |
120 | Annex B Form k for single sampling plans: s-method Table B.1 — Single sampling plans of Form k for normal inspection: s–method |
121 | Table B.2 — Single sampling plans of Form k for tightened inspection: s–method |
122 | Table B.3 — Single sampling plans of Form k for reduced inspection: s–method |
123 | Annex B Accommodating measurement variability B.1 General |
124 | B.2 Process standard deviation σ and measurement standard deviation σm are both known B.3 Process standard deviation σ is unknown but measurement standard deviation σm is known B.4 Process standard deviation σ and measurement standard deviation σm are both unknown |
126 | Table B.1 — Sample results for the example of B.4 Table B.2 — Sample results with subtraction of 12,9 for the example of B.4 |
128 | Annex C Form k for single sampling plans: σ-method Table C.1 — Single sampling plans of Form k for normal inspection: σ–method |
129 | Table C.2 — Single sampling plans of Form k for tightened inspection: σ–method |
130 | Table C.3 — Single sampling plans of Form k for reduced inspection: σ–method |
131 | Annex C Sampling strategies Figure C.1 — Examples of different sampling strategies with a two-dimensional population |
133 | Annex D Values of f s for maximum sample standard deviation (MSSD) Table D.1 — Values of f s for maximum sample standard deviation for combined control of double specification limits: normal inspection, s–method |
134 | Table D.2 — Values of f s for maximum sample standard deviation for combined control of double specification limits: tightened inspection, s–method Table D.3 — Values of f s for maximum sample standard deviation for combined control of double specification limits: reduced inspection, s–method |
136 | Annex D Operating characteristics for the σ–method D.1 Probability of acceptance for the σ-method D.2 Example D.3 Comparison with tabulated value for the s–method |
137 | Annex E Values of fσ for maximum process standard deviation (MPSD) Table E.1 — Values of f σ for maximum process standard deviation for combined control of double specification limits: σ–method |
138 | Annex E Operating characteristic for the s-method – tabulated values for single sampling plans, normal inspection E.1 Probability of acceptance for the s-method |
147 | Annex F Estimating the process fraction nonconforming for sample size 3: s-method |
150 | Annex F Consumer’s risk qualities F.1 The consumer’s risk quality for the s-method plans F.2 Tables for the consumer’s risk qualities for the s–method plans F.3 The consumer’s risk quality for the σ–method plans |
151 | F.4 Tables for the consumer’s risk qualities for the σ–method plans |
158 | Annex G Single sampling plans of Form p* |
159 | Annex G Producer’s risks G.1 The producer’s risk for the s-method plans G.2 Tables for the producer’s risks for the s–method plans G.3 The producer’s risk for the σ–method plans G.4 Tables for the producer’s risk for the σ–method plans |
166 | Annex H Values of c U for upper control limit on the sample standard deviation Table H.1 — Values of c U for upper control limit on the sample standard deviation |
167 | Annex H Construction of acceptance diagrams for double specification H.1 General H.2 s-method acceptance diagrams for double specification limits under separate control Figure H.1 — acceptance region, s-method, separate control |
168 | H.3 s-method acceptance diagrams for double specification limits under combined control |
169 | Figure H.2 — acceptance region, s-method, combined control – construction lines and |
170 | Figure H.3 — acceptance region, s-method, combined control with construction lines and |
171 | H.4 σ-method – determination of combined specification limits acceptance criteria |
174 | Figure H.8 — acceptance region, σ-method, combined control with sample mean and standard deviation |
175 | H.5 standardized acceptance diagrams for double specification limits under separate control Figure H.10 — standardized acceptance region, s-method, combined control with sample mean and standard deviation |
176 | H.6 Spreadsheet implementation |
177 | Annex I Supplementary acceptability constants for qualifying towards reduced inspection Table I.1 — Supplementary acceptability constants for qualifying towards reduced inspection |
178 | Annex I Use of the underlying software I.1 Execution of the standard Table I.1 — Function ISO3951_1 |
179 | I.2 Operating characteristic functions Table I.2 — Function OC |
180 | I.3 Confidence intervals Table I.3 — Function confint |
181 | I.4 Consumer’s risk quality and the producer’s risk I.5 Constructing the acceptance curve for the case with two specification limits and the s-method |
183 | Annex J Procedures for obtaining s and σ J.1 Procedure for obtaining s |
184 | J.2 Procedure for obtaining σ |
185 | Annex K Consumer’s risk qualities Table K.1 — Consumer’s risk quality (in percent) for normal inspection: s–method |
186 | Table K.2 — Consumer’s risk quality (in percent) for normal inspection: σ–method Table K.3 — Consumer’s risk quality (in percent) for tightened inspection: s–method |
187 | Table K.4 — Consumer’s risk quality (in percent) for tightened inspection: σ–method Table K.5 — Consumer’s risk quality (in percent) for reduced inspection: s–method |
188 | Table K.6 — Consumer’s risk quality (in percent) for reduced inspection: σ–method |
189 | Annex L Producer’s risks Table L.1 — Producer’s risk (in percent) for normal inspection: s–method |
190 | Table L.2 — Producer’s risk (in percent) for normal inspection: σ–method Table L.3 — Producer’s risk (in percent) for tightened inspection: s–method |
191 | Table L.4 — Producer’s risk (in percent) for tightened inspection: σ–method Table L.5 — Producer’s risk (in percent) for reduced inspection: s–method |
192 | Table L.6 — Producer’s risk (in percent) for reduced inspection: σ–method |
193 | Annex M Operating characteristics for the σ-method M.1 Formula for probability of acceptance M.2 Example M.3 Comparison with tabulated value for the s–method |
194 | Annex N Estimating the process fraction nonconforming for sample sizes 3 and 4: s-method N.1 General formula for sample size, n N.2 Formula for sample size 3 |
195 | N.3 Formula for sample size 4 |
196 | Annex O Accommodating measurement variability O.1 General |
197 | O.2 Process standard deviation σ and measurement standard deviation σm both known O.3 Process standard deviation σ unknown but measurement standard deviation σ m known O.4 Process standard deviation σ and measurement standard deviation σ m both unknown |
201 | Bibliography |
202 | Bibliography [25] R Foundation for Statistical Computing [online database]. Available from http://www.R-project.org [viewed 17 September 2020]. |
204 | National foreword |
209 | Foreword |
210 | Introduction |
213 | 1 Scope 2 Normative references |
214 | 3 Terms and definitions |
218 | 4 Symbols |
219 | 5 Choice of a sampling plan 5.1 Choice between variables and attributes |
220 | 5.2 General 5.3 Choice between the s-method and σ-method |
221 | 5.4 Choice of inspection level and AQL |
222 | 6 Standard procedures for the s-method 6.1 General 6.2 Single specification limits |
223 | 6.3 Double specification limits 7 Standard procedures for the σ-method 7.1 General 7.2 Single specification limits |
224 | 7.3 Double specification limits 8 The p*-method |
225 | 9 Switching between inspection severities |
226 | 9.1 Rules for switching between inspection severities |
227 | 9.2 Records for switching between inspection severities 10 Relation to ISO 2859-1 10.1 Similarities |
228 | 10.2 Differences |
229 | 11 Allowing for measurement uncertainty 12 Normality, data transformations and outliers 12.1 Normality 12.2 Data transformations |
230 | 12.3 Outliers 13 Monitoring and recording of inspection results 13.1 Monitoring of inspection results 13.2 Process capability and performance assessment 13.3 Monitoring of process parameters |
231 | 14 Tables 14.1 Form k for single sampling plans: s-method |
238 | 14.2 Form k for single sampling plans: σ-method |
245 | 14.3 Form p* single sampling plans |
252 | 14.4 Values of fσ for maximum process standard deviation (MPSD) 14.5 Supplementary acceptance constants for qualifying towards reduced inspection |
253 | 15 Examples 15.1 General 15.2 Examples for the s-method |
260 | 15.3 Examples for the σ-method |
264 | 15.4 Examples for the p*-method |
267 | Annex A (informative) Procedures for obtaining s and σ |
270 | Annex B (informative) Accommodating measurement variability |
275 | Annex C (informative) Sampling strategies |
277 | Annex D (informative) Operating characteristics for the σ–method |
278 | Annex E (informative) Operating characteristic for the s-method – tabulated values for single sampling plans, normal inspection |
287 | Annex F (informative) Consumer’s risk qualities |
294 | Annex G (informative) Producer’s risks |
302 | Annex H (informative) Construction of acceptance diagrams for double specification limits |
313 | Annex I (informative) Use of the underlying software |
318 | Bibliography |