BSI 19/30393421 DC:2019 Edition
$13.70
BS EN IEC 62899-503-3. Printed electronics – Part 503-3. Quality assessment. Measuring method of contact resistance for the printed thin film transistor by transfer length method
| Published By | Publication Date | Number of Pages |
| BSI | 2019 | 13 |
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 5 | FOREWORD |
| 7 | INTRODUCTION |
| 8 | 1 Scope 2 Normative references 3 Terms, definitions and abbreviations 3.1 Terms and definitions 3.1.1 3.1.2 3.1.3 3.2 Abbreviations 4 Measuring method of contact resistance 4.1 General |
| 9 | 4.2 Preparation of TEGs 4.3 Measuring apparatus 4.4 Environmental condition and precondition for measuring |
| 10 | 4.5 Measuring procedure 4.6 Data analysis 4.6.1 Calculations procedure of normalized resistances for each TEGs 4.6.2 Derivation procedure of contact resistance |
| 11 | 4.7 Report |
| 12 | Annex A (informative) Examples of sets of source and drain electrodes layouts in the TEG A.1 Examples of layouts of source and drain electrodes sets in TEG |
| 13 | Bibliography |
