IES LM 79 2019
$27.08
ANSI IES LM-79-19 Approved Method: Optical and Electrical Measurements of Solid-State Lighting Products
Published By | Publication Date | Number of Pages |
IES | 2019 | 35 |
This approved method describes the procedures to be followed and precautions to be observed in performing reproducible accurate measurements of total luminous, radiant, or photon flux; electrical power; system efficacy; luminous, radiant, or photon intensity distribution; and color quantities and/or spectrum of solid-state lighting (SSL) products for illumination purposes, under standard conditions. This approved method covers LED luminaires, OLED luminaires, integrated LED lamps, integrated OLED lamps, non-integrated LED lamps operated with a driver designated by a manufacturer’s identification number or by a defined [ANSI] reference circuit, and LED light engines, all of which will be referred to as SSL products or device under test (DUT). SSL products, excluding non-integrated LED lamps, are intended to directly connect to AC mains power or to a DC voltage power supply to operate. This document does not cover SSL products that require external heat sinks, nor does it cover components of other than this recommended temperature constitute a nonstandard condition and shall be noted in the test report.
PDF Catalog
PDF Pages | PDF Title |
---|---|
1 | Cover |
4 | Copyright |
5 | DISCLAIMER |
7 | CONTENTS |
11 | Foreword 1.0 Introduction and Scope 1.1 Introduction 1.2 Scope |
12 | 2.0 Normative References 3.0 Definitions 3.1 acceptance interval 3.2 current crest factor 3.3 tolerance interval 4.0 Physical and EnvironmentalTest Conditions 4.1 General 4.2 Temperature |
13 | 4.3 Airflow 4.4 Thermal Conditions for Mounting SSLProducts 4.5 Vibration 4.6 Stray Light |
14 | 4.7 Humidity 5.0 Electrical Test Conditions 5.1 Power Supply Requirements 5.2 Test and Reference Circuit Requirements |
15 | 5.3 Electrical Measurement InstrumentCalibration |
16 | 5.4 Electrical Settings 6.0 Test Preparation 6.1 DUT Identification 6.2 DUT Handling 6.3 Seasoning |
17 | 6.4 Pre-burn and Stabilization 6.5 Operating Position and Orientation 6.6 Optical and Electrical Waveforms 7.0 Total Luminous Flux andIntegrated Optical Measurements 7.1 General 7.2 Integrating Sphere Systems |
18 | 7.3 Angular Integration Systems |
20 | 8.0 Luminous Intensity or OpticalAngular Distribution Measurement 8.1 General 8.2 Photometer and SpectroradiometerCharacteristics 8.3 Test Distance 8.4 Goniometer Alignment |
21 | 9.0 Chromaticity UniformityMeasurements 9.1 General 9.2 Angular Resolution 9.3 Angular Range 9.4 Angular Color Uniformity 9.5 Signal Limit and Verification |
22 | 10.0 Measurement Uncertainty 11.0 Reporting Requirements 11.1 Typical Report Content |
23 | 11.2 Nonstandard Conditions or OperatingProcedures Annex A – Airflow Considerationsfor Testing SSL Products |
24 | Annex B – High FrequencyCurrent and MeasurementCircuit Capacitance |
26 | Annex C – Power Supply Resistanceand Inductance Dependency |
27 | Annex D – Tolerance Interval vs.Acceptance Interval |
29 | Annex E – Benefits of WaveformMeasurement Annex F – Lower Luminous Intensityfor Chromaticity Uniformity |
32 | References |