IEEE 1149.6 2003

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IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks

Published By	Publication Date	Number of Pages
IEEE	2003	139

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Description

New IEEE Standard – Active. his standard augments IEEE Std 1149.1 to improve the ability for testing differential and/or ac-coupled interconnections between integrated circuits on circuit boards and systems.

PDF Catalog

PDF Pages	PDF Title
2	IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks
4	Introduction Participants
6	Contents
8	1. Overview 1.1 Scope 1.2 Organization of the standard
9	1.3 Context
10	1.4 Objectives 2. References 3. Definitions and acronyms 3.1 Definitions
16	3.2 Acronyms
17	4. Technology 4.1 Signal pin types 4.2 Signal coupling and coupling combinations
22	4.3 The effects of defects
24	4.4 Defects targeted by the standard
26	4.5 Differential termination and testability
27	4.6 Test signal implementation
31	4.7 Test receiver support for AC testing instructions
35	4.8 Test receiver support for the (DC) EXTEST instruction
36	4.9 A general test receiver for DC and AC testing instructions
37	4.10 Boundary-Scan capture data versus configuration
39	4.11 Noise sources and sensitivities
42	5. Instructions 5.1 IEEE Std 1149.1 instructions 5.2 AC testing instructions
44	5.3 The EXTEST_PULSE instruction
46	5.4 The EXTEST_TRAIN instruction
49	5.5 AC Test Signal generation 6. Pin implementation specifications 6.1 Pin identification
50	6.2 Input test receivers
67	6.3 Output drivers
70	6.4 Bidirectional pins
71	6.5 AC/DC selection cells
75	7. Conformance and documentation requirements 7.1 Conformance
76	7.2 Documentation
78	7.3 BSDL package for Advanced I/O description (STD_1149_6_2003)
81	7.4 BSDL extension structure
82	7.5 BSDL attribute definitions
88	7.6 Example BSDL
101	Annex A
114	Annex B
117	Annex C
123	Annex D
135	Annex E
138	Annex F