{"id":79834,"date":"2024-10-17T18:38:23","date_gmt":"2024-10-17T18:38:23","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1160-1993\/"},"modified":"2024-10-24T19:41:32","modified_gmt":"2024-10-24T19:41:32","slug":"ieee-1160-1993","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1160-1993\/","title":{"rendered":"IEEE 1160 1993"},"content":{"rendered":"

New IEEE Standard – Active. This standard applies to the measurement of bulk properties of high-purity germanium as they relate to fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity center per cm3, usually on the order of 1010 cm-3.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nTitle Page <\/td>\n<\/tr>\n
3<\/td>\nIntroduction <\/td>\n<\/tr>\n
5<\/td>\nCONTENTS <\/td>\n<\/tr>\n
7<\/td>\n1. Overview
1.1 Scope
1.2 Purpose <\/td>\n<\/tr>\n
8<\/td>\n2. References
3. Letter symbols <\/td>\n<\/tr>\n
9<\/td>\n4. Introduction <\/td>\n<\/tr>\n
10<\/td>\n5. Sample preparation and measurement of net electrically active impurity concentration |NA \u2013 ND|
5.1 Sample preparation for van der Pauw measurements <\/td>\n<\/tr>\n
12<\/td>\n5.2 Measurement and analysis <\/td>\n<\/tr>\n
17<\/td>\n5.3 Spatial dependence of (NA \u2013 ND) <\/td>\n<\/tr>\n
19<\/td>\n6. Deep-level transient spectroscopy (DLTS) for the characterization of point-defect trapping cen… <\/td>\n<\/tr>\n
20<\/td>\n6.1 Equipment <\/td>\n<\/tr>\n
21<\/td>\n6.2 Sample selection and preparation for DLTS
6.3 Measurement procedure <\/td>\n<\/tr>\n
25<\/td>\n6.4 Majority-carrier deep levels in p-type HPGe <\/td>\n<\/tr>\n
26<\/td>\n6.5 Majority-carrier deep levels in n-type HPGe
6.6 Reporting
7. Crystallographic properties
7.1 Crystallographic orientation
7.2 Sample preparation <\/td>\n<\/tr>\n
28<\/td>\n7.3 Reporting
8. Bibliography <\/td>\n<\/tr>\n
30<\/td>\nAnnex A <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n1993<\/td>\n36<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":79835,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-79834","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/79834","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/79835"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=79834"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=79834"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=79834"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}