Shopping Cart

No products in the cart.

UNE-EN 62047-6:2010

$21.45

Semiconductor devices – Micro-electromechanical devices — Part 6: Axial fatigue testing methods of thin film materials

Published By Publication Date Number of Pages
AENOR 2010-06-01 19
Guaranteed Safe Checkout
Categories: ,

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

Published Code

AENOR

Published By

Asociación Española de Normalización

Publication Date

2010-06-01

Pages Count

19

Language

English

File Size

399.4 KB

ICS Codes 31.080.99 - Other semiconductor devices
UNE-EN 62047-6:2010
$21.45