Name: ASME BPVC.V-2023 Section V, Nondestructive Examination PDF - PDF Standards Store
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PDF Pages	PDF Title
5	Table of Contents
29	List of Sections
30	Foreword
32	Statement of Policy on the Use of the ASME Single Certification Mark and Code Authorization in Advertising Statement of Policy on the Use of ASME Marking to Identify Manufactured Items
33	Personnel
55	ASTM Personnel
56	Correspondence With the Committee
58	Summary of Changes
61	Cross-Referencing in the ASME BPVC
63	Subsection A Nondestructive Methods of Examination Article 1 General Requirements T-110 Scope T-120 General
65	T-130 Equipment T-150 Procedure T-160 Calibration
66	T-170 Examinations and Inspections T-180 Evaluation T-190 Records/Documentation
67	Mandatory Appendix I Glossary of Terms for Nondestructive Examination I-110 Scope I-120 General Requirements I-121 General Terms
89	Mandatory Appendix II Supplemental Personnel Qualification Requirements for NDE Certification II-110 Scope II-120 General Requirements II-121 Level I and Level II Training and Experience Requirements II-122 Level I and Level II Examinations II-123 Level III Requirements II-124 Training Outlines
90	II-121-1 Initial Training and Experience Requirements for CR and DR Techniques
91	II-121-2 Additional Training and Experience Requirements for PAUT, TOFD, and FMC Ultrasonic Techniques II-122.1 Minimum CR and DR Examination Questions II-122.2 Minimum Ultrasonic Technique Examination Questions
92	Mandatory Appendix III Exceptions and Additional Requirements for Use of ASNT SNT-TC-1A 2016 Edition
93	Mandatory Appendix IV Exceptions to ANSI/ASNT CP-189 2020 Edition
94	Nonmandatory Appendix A Imperfection vs. Type of NDE Method A-110 Scope A-110 Imperfection vs. Type of NDE Method
96	Article 2 Radiographic Examination T-210 Scope T-220 General Requirements T-221 Procedure Requirements T-222 Surface Preparation T-223 Backscatter Radiation T-224 System of Identification T-225 Monitoring Density Limitations of Radiographs T-226 Extent of Examination
97	T-230 Equipment and Materials T-231 Film T-232 Intensifying Screens T-233 Image Quality Indicator (IQI) Design T-233.1 Hole-Type IQI Designation, Thickness, and Hole Diameters T-233.2 Wire IQI Designation, Wire Diameter, and Wire Identity
98	T-234 Facilities for Viewing of Radiographs T-260 Calibration T-261 Source Size T-262 Densitometer and Step Wedge Comparison Film T-270 Examination T-271 Radiographic Technique
99	T-272 Radiation Energy T-273 Direction of Radiation T-274 Geometric Unsharpness T-275 Location Markers
100	T-275 Location Marker Sketches
101	T-276 IQI Selection T-277 Use of IQIs to Monitor Radiographic Examination
102	T-276 IQI Selection
103	T-280 Evaluation T-281 Quality of Radiographs T-282 Radiographic Density T-283 IQI Sensitivity
104	T-284 Excessive Backscatter T-285 Evaluation by Manufacturer T-290 Documentation T-291 Radiographic Technique Documentation Details T-292 Radiograph Review Form T-283 Equivalent Hole-Type IQI Sensitivity
105	Mandatory Appendix I In-Motion Radiography I-210 Scope I-220 General Requirements I-223 Backscatter Detection Symbol Location I-260 Calibration I-263 Beam Width I-270 Examination I-274 Geometric and In-Motion Unsharpness I-275 Location Markers I-277 Placement and Number of IQIs
106	I-279 Repaired Area I-263 Beam Width Determination
107	Mandatory Appendix II Real-Time Radioscopic Examination II-210 Scope II-220 General Requirements II-221 Procedure Requirements II-230 Equipment and Materials II-231 Radioscopic Examination Record II-235 Calibration Block II-236 Calibrated Line Pair Test Pattern and Step Wedge II-237 Equivalent Performance Level II-260 Calibration II-263 System Performance Measurement II-264 Measurement With a Calibration Block
108	II-270 Examination II-278 System Configuration II-280 Evaluation II-286 Factors Affecting System Performance II-290 Documentation II-291 Radioscopic Technique Information II-292 Evaluation by Manufacturer
109	Mandatory Appendix III Digital Image Acquisition, Display, and Storage for Radiography and Radioscopy III-210 Scope III-220 General Requirements III-221 Procedure Requirements III-222 Original Image Artifacts III-230 Equipment and Materials III-231 Digital Image Examination Record III-234 Viewing Considerations III-236 Calibrated Optical Line Pair Test Pattern and Optical Density Step Wedge III-250 Image Acquisition and Storage III-255 Area of Interest III-258 System Configuration III-260 Calibration III-263 System Performance Measurement III-280 Evaluation III-286 Factors Affecting System Performance
110	III-287 System-Induced Artifacts III-290 Documentation III-291 Digital Imaging Technique Information III-292 Evaluation by Manufacturer
111	Mandatory Appendix IV Interpretation, Evaluation, and Disposition of Radiographic and Radioscopic Examination Test Results Produced by the Digital Image Acquisition and Display Process IV-210 Scope IV-220 General Requirements IV-221 Procedure Requirements IV-222 Original Image Artifacts IV-230 Equipment and Materials IV-231 Digital Image Examination Record IV-234 Viewing Considerations IV-236 Calibrated Optical Line Pair Test Pattern and Optical Density Step Wedge
112	IV-250 Image Acquisition, Storage, and Interpretation IV-255 Area of Interest IV-258 System Configuration IV-260 Calibration IV-263 System Performance Measurement IV-280 Evaluation IV-286 Factors Affecting System Performance IV-287 System-Induced Artifacts IV-290 Documentation IV-291 Digital Imaging Technique Information IV-292 Evaluation by Manufacturer
113	Mandatory Appendix VI Acquisition, Display, Interpretation, and Storage of Digital Images of Radiographic Film for Nuclear Applications VI-210 Scope VI-220 General Requirements VI-221 Supplemental Requirements VI-222 Written Procedure VI-223 Personnel Requirements VI-230 Equipment and Materials VI-231 System Features VI-232 System Spot Size
114	VI-240 System Performance Requirements VI-241 Spatial Resolution VI-242 Contrast Sensitivity VI-243 Dynamic Range VI-244 Spatial Linearity VI-250 Technique VI-251 Spatial Resolution Evaluation VI-252 Contrast Sensitivity Evaluation VI-253 Dynamic Range Evaluation VI-254 Spatial Linearity Evaluation VI-260 Demonstration of System Performance VI-261 Procedure Demonstration VI-262 Processed Targets VI-263 Changes in Essential Variables VI-264 Frequency of Verification
115	VI-265 Changes in System Performance VI-270 Examination VI-271 System Performance Requirements VI-272 Artifacts VI-273 Calibration VI-280 Evaluation VI-281 Process Evaluation VI-282 Interpretation VI-283 Baseline VI-290 Documentation VI-291 Reporting Requirements VI-292 Archiving
116	Mandatory Appendix VI Supplement A VI-A-210 Scope VI-A-220 General VI-A-221 Reference Film VI-A-230 Equipment and Materials VI-A-231 Reference Targets VI-A-232 Spatial Resolution Targets VI-A-233 Constrast Sensitivity Targets VI-A-234 Dynamic Range Targets VI-A-235 Spatial Linearity Targets VI-A-240 Miscellaneous Requirements
117	VI-A-1 Reference Film
118	VI-A-241 Material VI-A-242 Film Size VI-A-243 Spatial Resolution VI-A-244 Density VI-A-245 Linearity
119	Mandatory Appendix VII Radiographic Examination of Metallic Castings VII-210 Scope VII-220 General Requirements VII-224 System of Identification VII-270 Examination VII-271 Radiographic Technique VII-276 IQI Selection VII-280 Evaluation VII-282 Radiographic Density VII-290 Documentation VII-293 Layout Details
120	Mandatory Appendix VIII Radiography Using Phosphor Imaging Plate VIII-210 Scope VIII-220 General Requirements VIII-221 Procedure Requirements VIII-225 Monitoring Density Limitations of Radiographs VIII-230 Equipment and Materials VIII-231 Phosphor Imaging Plate VIII-234 Facilities for Viewing of Radiographs VIII-260 Calibration VIII-262 Densitometer and Step Wedge Comparison Film VIII-270 Examination VIII-277 Use of IQIs to Monitor Radiographic Examination
121	VIII-280 Evaluation VIII-281 System-Induced Artifacts VIII-282 Image Brightness VIII-283 IQI Sensitivity VIII-284 Excessive Backscatter VIII-287 Dimensional Measuring VIII-288 Interpretation
122	VIII-290 Documentation VIII-291 Digital Imaging Technique Documentation Details VIII-293 Embedded Data
123	Mandatory Appendix VIII Supplement A VIII-A-210 Scope VIII-A-220 General VIII-A-221 Demonstration Block VIII-A-230 Equipment and Materials VIII-A-231 Scan Parameters VIII-A-232 Gray Scale Values VIII-A-233 Image Quality Indicators VIII-A-240 Miscellaneous Requirements VIII-A-241 Sensitivity VIII-A-242 Records
124	VIII-A-221-1 Procedure Demonstration Block
125	Mandatory Appendix IX Radiography Using Digital Detector Systems IX-210 Scope IX-220 General Requirements IX-221 Procedure Requirements IX-225 Monitoring Density Limitations of Radiographs IX-230 Equipment and Materials IX-231 Film IX-232 Intensifying Screens IX-234 Facilities for Viewing of Radiographs IX-260 Detector Pixel Correction IX-261 Bad Pixel Maps
126	IX-262 Densitometer and Step Wedge Comparison Film IX-263 Beam Width IX-270 Examination IX-274 Geometric and Motion Unsharpness IX-275 Location Markers IX-277 Use of IQIs to Monitor Radiographic Examination
127	IX-280 Evaluation IX-281 Quality of Digital Images IX-282 Image Brightness IX-263 Beam Width Determination
128	IX-283 IQI Sensitivity IX-284 Excessive Backscatter IX-287 Dimensional Measuring IX-288 Interpretation IX-290 Documentation IX-291 Digital Imaging Technique Documentation Details IX-293 Embedded Data
129	Mandatory Appendix IX Supplement A IX-A-210 Scope IX-A-220 General IX-A-221 Demonstration Block IX-A-230 Equipment and Materials IX-A-231 Acquisition Parameters IX-A-232 Gray Scale Values IX-A-233 Image Quality Indicators IX-A-240 Miscellaneous Requirements IX-A-241 Sensitivity IX-A-242 Records
130	Nonmandatory Appendix A Recommended Radiographic Technique Sketches for Pipe or Tube Welds A-210 Scope
131	A-210-1 Single-Wall Radiographic Techniques
132	A-210-2 Double-Wall Radiographic Techniques
133	Nonmandatory Appendix C Hole-Type IQI Placement Sketches for Welds C-210 Scope
134	C-210-1 Side and Top Views of Hole-Type IQI Placements
135	C-210-2 Side and Top Views of Hole-Type IQI Placements
136	C-210-3 Side and Top Views of Hole-Type IQI Placements
137	C-210-4 Side and Top Views of Hole-Type IQI Placements
138	Nonmandatory Appendix D Number of IQIs (Special Cases) D-210 Scope D-210-1 Complete Circumference Cylindrical Component D-210-2 Section of Circumference 240 deg or More Cylindrical Component (Example is Alternate Intervals) D-210-3 Section(s) of Circumference Less Than 240 deg Cylindrical Component
139	D-210-4 Section(s) of Circumference Equal to or More Than 120 deg and Less Than 240 deg Cylindrical Component Option D-210-5 Complete Circumferential Welds Spherical Component D-210-6 Welds in Segments of Spherical Component D-210-7 Plan View A-A
140	D-210-8 Array of Objects in a Circle
141	Article 4 Ultrasonic Examination Methods for Welds T-410 Scope T-420 General T-421 Written Procedure Requirements T-430 Equipment T-431 Instrument Requirements T-432 Search Units
142	T-421 Requirements of an Ultrasonic Examination Procedure
143	T-433 Couplant T-434 Calibration Blocks
144	T-434.1.7.2 Ratio Limits for Curved Surfaces
145	T-434.2.1 Nonpiping Calibration Blocks
146	T-434.3-1 Calibration Block for Piping
147	T-434.3-2 Alternate Calibration Block for Piping
148	T-434.4.1 Calibration Block for Technique One
149	T-434.4.2.1 Alternate Calibration Block for Technique One
150	T-434.4.2.2 Alternate Calibration Block for Technique One T-434.4.3 Calibration Block for Technique Two
151	T-434.5.1 Calibration Block for Straight Beam Examination of Nozzle Side Weld Fusion Zone and/or Adjacent Nozzle Parent Metal
152	T-440 Miscellaneous Requirements T-441 Identification of Weld Examination Areas T-450 Techniques T-451 Coarse Grain Materials T-452 Computerized Imaging Techniques T-453 Scanning Techniques T-460 Calibration T-461 Instrument Linearity Checks
153	T-462 General Calibration Requirements T-463 Calibration for Nonpiping
154	T-464 Calibration for Piping T-465 Calibration for Weld Metal Overlay Cladding T-466 Calibration for Nozzle Side Weld Fusion Zone and/or Adjacent Nozzle Parent Metal
155	T-467 Calibration Confirmation T-470 Examination T-471 General Examination Requirements
156	T-472 Weld Joint Distance–Amplitude Technique T-473 Weld Metal Overlay Cladding Techniques T-474 Nondistance–Amplitude Techniques
157	T-475 Nozzle Side Weld Fusion Zone and/or Adjacent Nozzle Parent Metal T-477 Post-Examination Cleaning T-480 Evaluation T-481 General T-482 Evaluation Level T-483 Evaluation of Laminar Reflectors T-484 Alternative Evaluations T-490 Documentation T-491 Recording Indications T-492 Examination Records
158	T-493 Report T-494 Storage Media
159	Mandatory Appendix I Screen Height Linearity I-410 Scope I-440 Miscellaneous Requirements I-440 Linearity
160	Mandatory Appendix II Amplitude Control Linearity II-410 Scope II-440 Miscellaneous Requirements
161	Mandatory Appendix III Time-of-Flight Diffraction (TOFD) Technique III-410 Scope III-420 General III-421 Written Procedure Requirements III-430 Equipment III-431 Instrument Requirements III-432 Search Units III-421 Requirements of a TOFD Examination Procedure
162	III-434 Calibration Blocks III-435 Mechanics III-434.2.1(a) TOFD Reference Block
163	III-460 Calibration III-463 Calibration III-464 Calibration for Piping III-465 Calibration for Cladding III-434.2.1(b) Two-Zone Reference Block Example
164	III-467 Encoder Confirmation III-470 Examination III-471 General Examination Requirements III-463.5 Offset Scans
165	III-472 Weld Joint Distance–Amplitude Technique III-473 Cladding Technique III-475 Data Sampling Spacing III-480 Evaluation III-485 Missing Data Lines III-486 Flaw Sizing and Interpretation III-490 Documentation III-492 Examination Record III-493 Report
166	Mandatory Appendix IV Phased Array Manual Raster Examination Techniques Using Linear Arrays IV-410 Scope IV-420 General IV-421 Written Procedure Requirements IV-422 Scan Plan IV-460 Calibration IV-461 Instrument Linearity Checks IV-462 General Calibration Requirements IV-490 Documentation IV-492 Examination Record
167	IV-421 Requirements of a Manual Linear Phased Array Raster Scanning Examination Procedure
168	Mandatory Appendix V Phased Array E-Scan and S-Scan Linear Scanning Examination Techniques V-410 Scope V-420 General V-421 Written Procedure Requirements V-422 Scan Plan V-460 Calibration V-461 Instrument Linearity Checks V-462 General Calibration Requirements V-467 Encoder Calibration V-470 Examination V-471 General Examination Requirements
169	V-421 Requirements of Phased Array Linear Scanning Examination Procedures
170	V-490 Documentation V-492 Examination Record
171	Mandatory Appendix VII Ultrasonic Examination Requirements for Workmanship-Based Acceptance Criteria VII-410 Scope VII-420 General VII-421 Written Procedure Requirements VII-423 Personnel Qualifications VII-430 Equipment VII-431 Instrument Requirements VII-434 Calibration Blocks VII-440 Miscellaneous Requirements VII-442 Scanning Data
172	VII-460 Calibration VII-466 Calibration for Nozzle Side Weld Fusion Zone and/or Adjacent Nozzle Parent Metal VII-470 Examination VII-471 General Examination Requirements VII-480 Evaluation VII-483 Evaluation of Laminar Reflectors VII-485 Evaluation VII-486 Supplemental Manual Techniques VII-487 Evaluation by Manufacturer VII-490 Documentation VII-492 Examination Record
173	Mandatory Appendix VIII Ultrasonic Examination Requirements for Fracture-Mechanics-Based Acceptance Criteria VIII-410 Scope VIII-420 General VIII-421 Written Procedure Requirements VIII-423 Personnel Qualifications VIII-430 Equipment VIII-431 Instrument Requirements VIII-432 Search Units VIII-434 Calibration Blocks
174	VIII-440 Miscellaneous Requirements VIII-442 Scanning Data VIII-460 Calibration VIII-467 Calibration for Nozzle Side Weld Fusion Zone and/or Adjacent Nozzle Parent Metal VIII-470 Examination VIII-471 General Examination Requirements VIII-480 Evaluation VIII-482 Evaluation Level VIII-483 Evaluation of Laminar Reflectors VIII-485 Evaluation Settings VIII-486 Size and Category VIII-487 Supplemental Manual Techniques VIII-488 Evaluation by Manufacturer
175	VIII-490 Documentation VIII-492 Examination Records
176	Mandatory Appendix IX Procedure Qualification Requirements for Flaw Sizing and Categorization IX-410 Scope IX-420 General IX-430 Equipment IX-435 Demonstration Blocks IX-440 Miscellaneous Requirements IX-442 Qualification Data
177	IX-480 Evaluation IX-481 Size and Category IX-482 Automated and Semiautomated Acceptable Performance Criteria IX-483 Supplemental Manual Technique(s) Acceptable Performance IX-490 Documentation IX-495 Demonstration Block Record
178	Mandatory Appendix X Ultrasonic Examination of High Density Polyethylene X-410 Scope X-420 General X-421 Written Procedure Requirements X-422 Scan Plan X-430 Equipment X-431 Instrument Requirements X-432 Search Units X-421 Requirements of an Ultrasonic Examination Procedure for HDPE Techniques
179	X-434 Calibration Blocks X-460 Calibration X-462 General Calibration Requirements X-464 Calibration for Piping X-467 Calibration Confirmation X-470 Examination X-471 General Examination Requirements
180	X-490 Documentation X-492 Examination Record X-471.1 Fusion Pipe Joint Examination Volume
181	Mandatory Appendix XI Full Matrix Capture XI-410 Scope XI-420 General XI-421 Written Procedure Requirements XI-422 Scan Plan XI-423 Personnel Qualifications XI-430 Equipment XI-432 Search Unit(s) XI-434 Calibration Blocks
182	XI-435 Reference Standards XI-450 Techniques XI-451 Data Reconstruction Techniques XI-421.1-1 Requirements of an FMC Examination Procedure
183	XI-434.1-1 Calibration Block
184	XI-460 Calibration XI-461 Instrument Calibration XI-462 General Calibration Requirements
185	XI-464 XI-467 Encoder Calibration XI-470 Examination XI-471 General Examination Requirements XI-474 XI-480 Evaluation XI-481 General Evaluation Requirements
186	XI-482 Evaluation Level XI-483 Evaluation of Laminar Reflectors XI-485 Evaluation Settings XI-486 Size and Category XI-488 Evaluation by Manufacturer XI-490 Documentation XI-492 Examination Records
187	XI-494 Data Storage
188	Nonmandatory Appendix A Layout of Vessel Reference Points A-410 Scope A-440 Miscellaneous Requirements A-441 Circumferential (Girth) Welds A-442 Longitudinal Welds A-443 Nozzle-to-Vessel Welds
189	Nonmandatory Appendix B General Techniques for Angle Beam Calibrations B-410 Scope B-460 Calibration B-461 Sweep Range Calibration B-461.1 Sweep Range (Side-Drilled Holes)
190	B-461.2 Sweep Range (IIW Block) B-461.3 Sweep Range (Notches)
191	B-462 Distance–Amplitude Correction B-462.1 Sensitivity and Distance–Amplitude Correction (Side-Drilled Holes)
192	B-463 Distance–Amplitude Correction Inner 1/4 Volume (See Nonmandatory Appendix J, Figure J-431 View A) B-464 Position Calibration (See Figure B-464) B-462.3 Sensitivity and Distance–Amplitude Correction (Notches)
193	B-465 Calibration Correction for Planar Reflectors Perpendicular to the Examination Surface at or Near the Opposite Surface (See Figure B-465) B-466 Beam Spread (See Figure B-466) B-464 Position Depth and Beam Path B-465 Planar Reflections
194	B-466 Beam Spread
195	Nonmandatory Appendix C General Techniques for Straight Beam Calibrations C-410 Scope C-460 Calibration C-461 Sweep Range Calibration (See Figure C-461) C-462 Distance–Amplitude Correction (See Figure C-462) C-461 Sweep Range
196	C-462 Sensitivity and Distance–Amplitude Correction
197	Nonmandatory Appendix D Examples of Recording Angle Beam Examination Data D-410 Scope D-420 General D-470 Examination Requirements D-471 Reflectors With Indication Amplitudes Greater Than 20% of DAC or Reference Level D-472 Reflectors With Indication Amplitudes Greater Than the DAC Curve or Reference Level D-473 Flaw Sizing Techniques to Be Qualified and Demonstrated D-490 Documentation
198	D-491 Reflectors With Indication Amplitudes Greater Than 20% of DAC or Reference Level D-490 Search Unit Location, Position, and Beam Direction D-490 Example Data Record
199	D-492 Reflectors With Indication Amplitudes Greater Than the DAC Curve or Reference Level D-493 Reflectors That Require Measurement Techniques to Be Qualified and Demonstrated
200	Nonmandatory Appendix E Computerized Imaging Techniques E-410 Scope E-420 General E-460 Calibration E-470 Examination E-471 Synthetic Aperture Focusing Technique for Ultrasonic Testing (SAFT-UT)
201	E-472 Line-Synthetic Aperture Focusing Technique (L-SAFT) E-473 Broadband Holography Technique
202	E-460.1 Lateral Resolution and Depth Discrimination Block for 45 deg and 60 deg Applications
203	E-474 UT-Phased Array Technique
204	E-460.2 Lateral and Depth Resolution Block for 0 deg Applications
205	E-475 UT-Amplitude Time-of-Flight Locus-Curve Analysis Technique E-476 Automated Data Acquisition and Imaging Technique
206	Nonmandatory Appendix F Examination of Welds Using Full Matrix Capture F-410 Scope F-420 General F-421 Post-Processing F-430 Equipment F-432 Search Unit Selection
207	F-440 Miscellaneous F-441 Full Matrix Capture F-442 Total Focusing Method F-450 Techniques F-451 Conventional Phased-Array vs. FMC/TFM F-441-1 An Illustrated Elementary Transmit/Receive Matrix
208	F-460 Calibration F-462 General Calibration Requirements F-451.1-1 FMC/TFM Generic Workflow
209	F-451.1-2 Active Focusing Workflow F-451.1-3 Active Focusing Workflow With FMC Data Acquisition
210	F-470 Examination F-471 Ultrasonic Modes F-472 Selection of the Modes F-473 Defect Orientation and Sensitivity F-451.1-4 Example of an Iterative FMC/TFM Workflow as an Adaptation of That Shown in Figure F-451.1-1
211	F-480 Evaluation F-481 Detection F-471-1 Ultrasonic Imaging Modes
212	F-471-1 Examples of Ultrasonic Imaging Modes
213	Nonmandatory Appendix G Alternate Calibration Block Configuration G-410 Scope G-460 Calibration G-461 Determination of Gain Correction G-461 Transducer Factor, F1, for Various Ultrasonic Transducer Diameters and Frequencies
214	G-461(a) Critical Radius, RC, for Transducer/Couplant Combinations
215	G-461(b) Correction Factor (Gain) for Various Ultrasonic Examination Parameters
216	Nonmandatory Appendix H Examination of Welds Using Angle Beam Search Units H-410 Scope H-470 Examination H-471 General Scanning Requirements H-472 Exceptions To General Scanning Requirements H-473 Examination Coverage
217	Nonmandatory Appendix J Alternative Basic Calibration Block J-410 Scope J-430 Equipment J-431 Basic Calibration Block J-432 Basic Calibration Block Material J-433 Calibration Reflectors
218	J-431 Basic Calibration Block
220	Nonmandatory Appendix K Recording Straight Beam Examination Data for Planar Reflectors K-410 Scope K-470 Examination K-471 Overlap K-490 Records/Documentation
221	Nonmandatory Appendix L TOFD Sizing Demonstration/Dual Probe — Computer Imaging Technique L-410 Scope L-420 General L-430 Equipment L-431 System L-432 Demonstration Block L-460 Calibration L-461 System L-462 System Checks L-470 Examination L-480 Evaluation L-481 Sizing Determinations L-482 Sizing Accuracy Determinations
222	L-483 Classification/Sizing System L-432 Example of a Flat Demonstration Block Containing Three Notches
223	L-490 Documentation L-491 Demonstration Report
224	Nonmandatory Appendix M General Techniques for Angle Beam Longitudinal Wave Calibrations M-410 Scope M-460 Calibration M-461 Sweep Range Calibration M-461.1 Sweep Range (Side-Drilled Holes)
225	M-461.2 Sweep Range (Cylindrical Surfaces) M-461.3 Sweep Range (Straight Beam Search Unit)
226	M-462 Distance–Amplitude Correction (DAC) (See Figure M-462) M-462 Sensitivity and Distance–Amplitude Correction
227	Nonmandatory Appendix N Time-of-Flight Diffraction (TOFD) Interpretation N-410 Scope N-420 General N-421 TOFD Images — Data Visualization N-421(a) Schematic Showing Waveform Transformation Into Grayscale
228	N-421(b) Schematic Showing Generation of Grayscale Image From Multiple A-Scans N-421(c) Schematic Showing Standard TOFD Setup and Display With Waveform and Signal Phases
229	N-450 Procedure N-451 Measurement Tools N-452 Flaw Position Errors N-453 Measuring Flaw Length N-454 Measuring Flaw Depth N-421(d) TOFD Display With Flaws and Displayed A-Scan
230	N-451 Measurement Tools for Flaw Heights N-452(a) Schematic Showing the Detection of Off-Axis Flaws
231	N-452(b) Measurement Errors From Flaw Position Uncertainty N-453 TOFD Image Showing Hyperbolic “Tails” From the Ends of a Flaw Image Used to Measure Flaw Length
232	N-454(a) TOFD Image Showing Top and Bottom Diffracted Signals From Midwall Flaw and A-Scan Interpretation N-454(b) TOFD Image Showing Top and Bottom Diffracted Signals From Centerline Crack and A-Scan Interpretation
233	N-480 Evaluation N-481 Single Flaw Images N-481(a) Schematics of Image Generation, Scan Pattern, Waveform, and TOFD Display Showing the Image of the Point Flaw
234	N-481(b) Schematics of Image Generation, Flaw Location, and TOFD Display Showing the Image of the Inside (ID) Surface-Breaking Flaw N-481(c) Schematics of Image Generation, Flaw Location, and TOFD Display Showing the Image of the Outside (OD) Surface-Breaking Flaw
235	N-481(d) Schematics of Flaw Location, Signals, and TOFD Display Showing the Image of the Midwall Flaw
236	N-481(e) Flaw Location and TOFD Display Showing the Image of the Lack of Root Penetration N-481(f) Flaw Location and TOFD Display Showing the Image of the Concave Root Flaw
237	N-481(g) Flaw Location, TOFD Display Showing the Image of the Midwall Lack of Fusion Flaw, and the A-Scan N-481(h) Flaw Location and TOFD Display Showing the Image of the Porosity
238	N-481(i) Flaw Location and TOFD Display Showing the Image of the Transverse Crack N-481(j) Schematics of Image Generation, Flaw Location, and TOFD Display Showing the Image of the Interpass Lack of Fusion
239	N-482 Multiple Flaw Images N-482(a) Schematic of Flaw Locations and TOFD Image Showing the Lateral Wave, Back Wall, and Three of the Four Flaws
240	N-483 Typical Problems With TOFD Interpretation N-482(b) Schematic of Flaw Locations and TOFD Display Showing the Lateral Wave, Back Wall, and Four Flaws
241	N-483(a) Acceptable Noise Levels, Flaws, Lateral Wave, and Longitudinal Wave Back Wall
242	N-483(b) TOFD Image With Gain Too Low
243	N-483(c) TOFD Image With Gain Set Too High N-483(d)(1) TOFD Image With the Gate Set Too Early
244	N-483(d)(2) TOFD Image With the Gate Set Too Late N-483(d)(3) TOFD Image With the Gate Set Too Long
245	N-483(e) TOFD Image With Transducers Set Too Far Apart N-483(f) TOFD Image With Transducers Set Too Close Together
246	N-483(g) TOFD Image With Transducers Not Centered on the Weld Axis N-483(h) TOFD Image Showing Electrical Noise Interference
247	Nonmandatory Appendix O Time-of-Flight Diffraction (TOFD) Technique — General Examination Configurations O-410 Scope O-430 Equipment O-432 Search Units O-470 Examination O-432(a) Search Unit Parameters for Single Zone Examinations Up to 3 in. (75 mm) O-432(b) Search Unit Parameters for Multiple Zone Examinations Up to 12 in. (300 mm) Thick O-470 Recommended TOFD Zones for Butt Welds Up to 12 in. (300 mm) Thick
248	O-470(a) Example of a Single Zone TOFD Setup O-470(b) Example of a Two Zone TOFD Setup (Equal Zone Heights) O-470(c) Example of a Three Zone TOFD Setup (Unequal Zone Heights With Zone 3 Addressed by Two Offset Scans)
249	O-470(d) Example of a Four Zone TOFD Setup (Equal Zone Heights)
250	Nonmandatory Appendix P Phased Array (PAUT) Interpretation P-410 Scope P-420 General P-421 PAUT Images — Data Visualization P-450 Procedure P-451 Measurement Tools P-452 Flaw Sizing Techniques P-480 Evaluation
251	P-481 I.D. (Inside Diameter) Connected Crack
252	P-421-1 Black and White (B&W) Version of Color Palette P-421-2 Scan Pattern Format
253	P-421-3 Example of an E-Scan Image Display
254	P-421-4 Example of an S-Scan Image Display P-452.1 Flaw Length Sizing Using Amplitude Drop Technique and the Vertical Cursors on the C-Scan Display
255	P-452.2-1 Scan Showing Flaw Height Sizing Using Amplitude Drop Technique and the Horizontal Cursors on the B-Scan Display P-452.2-2 Flaw Height Sizing Using Tip Diffraction Technique and the Horizontal Cursors on the S-Scan Display
256	P-481 S-Scan of I.D. Connected Crack P-481.1 E-Scan of LOF in Midwall
257	P-481.2 S-Scan of Porosity, Showing Multiple Reflectors P-481.3 O.D. Toe Crack Detected Using S-Scan
258	P-481.4 IP Signal on S-Scan, Positioned on Root P-481.5 Slag Displayed as a Midwall Defect on S-Scan
259	Nonmandatory Appendix Q Example of a Split DAC Curve Q-410 Scope Q-420 General Q-421 First DAC Q-422 Second DAC Q-423 Notch Reflectors Q-410 Distance–Amplitude Correction
260	Q-421 First DAC Curve Q-422 Second DAC Curve
261	Nonmandatory Appendix R Straight Beam Calibration Blocks for Restricted Access Weld Examinations R-410 Scope R-420 General R-430 Equipment R-434 Calibration Blocks
262	R-434-1 Corner Weld Example
263	R-434-2 Tee Weld Example
264	Nonmandatory Appendix S General Techniques for Straight-Beam Transfer Correction S-410 Scope S-420 Calibration S-430 Signal Adjustment S-440 Distance–Amplitude Correction (DAC) S-450 Test Material Adjustment S-460 Calculate the Transfer Correction S-430-1 Signal Adjustment (Back Wall)
265	S-440-1 DAC Curve for Straight-Beam Transfer Correction S-460-1 Example 1 (Straight-Beam Transfer Correction)
266	S-460-2 Example 2 (Straight-Beam Transfer Correction)
267	Nonmandatory Appendix U General Techniques for Angle-Beam Transfer Correction U-410 Scope U-420 Calibration U-430 Signal Adjustment U-440 Distance–Amplitude Correction (DAC) U-450 Test Material Adjustment U-460 Calculate the Transfer Correction
268	U-430-1 Signal Adjustment (Angle Beam) U-440-1 DAC Curve U-450-1 Signal Adjustment (Angle Beam)
269	U-460-1 Example 1 (Angle-Beam Transfer Correction) U-460-2 Example 2 (Angle-Beam Transfer Correction)
270	Nonmandatory Appendix W Pulse‐Echo Method Examination of Brazed Joints W-410 Scope W-430 Equipment W-431 Ultrasonic Examination Instrument W-432 Immersion System W-433 Couplant W-434 Reference Standards W-434-1 Assembly Partially Brazed Around the Fitting Circumference
271	W-460 Calibration W-461 Sweep Range Calibration W-470 Examination W-471 Preparation of Component for Examination W-472 Component Configuration W-473 Contact Testing W-474 Coverage W-461.4-1 Filled and Unfilled Zones of a Joint
272	W-480 Evaluation W-481 Indication Evaluation
273	Article 5 Ultrasonic Examination Methods for Materials T-510 Scope T-520 General T-521 Basic Requirements T-522 Written Procedure Requirements T-530 Equipment T-531 Instrument T-532 Search Units T-533 Couplant T-534 Calibration Block Requirements
274	T-560 Calibration T-561 Instrument Linearity Checks T-522 Variables of an Ultrasonic Examination Procedure
275	T-534.3 Straight-Beam Calibration Blocks for Bolting
276	T-562 General Calibration Requirements T-563 Calibration Confirmation T-564 Casting Calibration for Supplementary Angle Beam Examinations T-570 Examination T-571 Examination of Product Forms
277	T-572 Examination of Pumps and Valves T-573 Inservice Examination T-574 Thickness Measurement T-577 Post-Examination Cleaning T-580 Evaluation T-590 Documentation T-591 Recording Indications T-592 Examination Records
278	T-593 Report T-594 Storage Media
279	Mandatory Appendix I Ultrasonic Examination of Pumps and Valves I-510 Scope I-530 Equipment I-531 Calibration Blocks I-560 Calibration I-561 System Calibration I-570 Examination
280	Mandatory Appendix II Inservice Examination of Nozzle Inside Corner Radius and Inner Corner Regions II-510 Scope II-530 Equipment II-531 Calibration Blocks II-560 Calibration II-561 System Calibration II-570 Examination
281	Mandatory Appendix IV Inservice Examination of Bolts IV-510 Scope IV-530 Equipment IV-531 Calibration Blocks IV-560 Calibration IV-561 DAC Calibration IV-570 Examination IV-571 General Examination Requirements
282	Article 6 Liquid Penetrant Examination T-610 Scope T-620 General T-621 Written Procedure Requirements T-630 Equipment T-640 Miscellaneous Requirements T-641 Control of Contaminants T-642 Surface Preparation
283	T-621.1 Requirements of a Liquid Penetrant Examination Procedure T-621.3 Minimum and Maximum Time Limits for Steps in Penetrant Examination Procedures
284	T-643 Drying After Preparation T-650 Technique T-651 Techniques T-652 Techniques for Standard Temperatures T-653 Techniques for Nonstandard Temperatures T-654 Technique Restrictions T-660 Calibration T-670 Examination T-671 Penetrant Application T-672 Penetration (Dwell) Time T-673 Excess Penetrant Removal
285	T-674 Drying After Excess Penetrant Removal T-675 Developing T-672 Minimum Dwell Times
286	T-676 Interpretation T-677 Post-Examination Cleaning T-680 Evaluation T-690 Documentation T-691 Recording of Indications
287	T-692 Examination Records
288	Mandatory Appendix II Control of Contaminants for Liquid Penetrant Examination II-610 Scope II-640 Requirements II-641 Nickel Base Alloys II-642 Austenitic or Duplex Stainless Steel and Titanium II-643 Water II-690 Documentation
289	Mandatory Appendix III Qualification Techniques for Examinations at Nonstandard Temperatures III-610 Scope III-630 Materials III-640 Requirements III-641 Comparator Application III-630 Liquid Penetrant Comparator
291	Article 7 Magnetic Particle Examination T-710 Scope T-720 General T-721 Written Procedure Requirements T-730 Equipment T-731 Examination Medium
292	T-740 Miscellaneous Requirements T-741 Surface Conditioning T-750 Technique T-751 Techniques T-752 Prod Technique T-721 Requirements of a Magnetic Particle Examination Procedure
293	T-753 Longitudinal Magnetization Technique T-754 Circular Magnetization Technique
294	T-755 Yoke Technique T-756 Multidirectional Magnetization Technique T-754.2.1 Single-Pass and Two-Pass Central Conductor Technique T-754.2.2 The Effective Region of Examination When Using an Offset Central Conductor
295	T-760 Calibration T-761 Frequency of Calibration T-762 Lifting Power of Yokes T-763 Gaussmeters T-764 Magnetic Field Adequacy and Direction
296	T-765 Wet Particle Concentration and Contamination T-764.2(a) Pie-Shaped Magnetic Particle Field Indicator T-764.2(b)(1) Artificial Flaw Shims
297	T-764.2(b)(2) Artificial Flaw Shims
298	T-766 System Performance of Horizontal Units T-770 Examination T-771 Preliminary Examination T-772 Direction of Magnetization T-773 Method of Examination
299	T-766.1 Ketos (Betz) Test Ring
300	T-774 Examination Coverage T-775 Rectified Current T-776 Excess Particle Removal T-777 Interpretation
301	T-778 Demagnetization T-779 Post-Examination Cleaning T-780 Evaluation T-790 Documentation T-791 Multidirectional Magnetization Technique Sketch T-792 Recording of Indications T-793 Examination Records
302	Mandatory Appendix I Magnetic Particle Examination Using the AC Yoke Technique on Ferromagnetic Materials Coated With Nonferromagnetic Coatings I-710 Scope I-720 General I-721 Written Procedure Requirements I-722 Personnel Qualification I-721 Requirements of AC Yoke Technique on Coated Ferritic Component
303	I-723 Procedure/Technique Demonstration I-730 Equipment I-740 Miscellaneous Requirements I-741 Coating Thickness Measurement I-750 Technique I-751 Technique Qualification I-760 Calibration I-761 Yoke Maximum Lifting Force
304	I-762 Light Intensity Measurement I-770 Examination I-780 Evaluation I-790 Documentation I-791 Examination Record
305	Mandatory Appendix III Magnetic Particle Examination Using the Yoke Technique With Fluorescent Particles in an Undarkened Area III-710 Scope III-720 General III-721 Written Procedure Requirements III-723 Procedure Demonstration III-750 Technique III-751 Qualification Standard III-760 Calibration III-761 Black Light Intensity Measurement III-762 White Light Intensity Measurement III-770 Examination III-721 Requirements for an AC or HWDC Yoke Technique With Fluorescent Particles in an Undarkened Area
306	III-777 Interpretation III-790 Documentation III-791 Examination Record
307	Mandatory Appendix IV Qualification of Alternate Wavelength Light Sources for Excitation of Fluorescent Particles IV-710 Scope IV-720 General IV-721 Written Procedure Requirements IV-723 Procedure Demonstration IV-750 Technique IV-751 Qualification Standard IV-752 Filter Glasses IV-770 Qualification Examinations IV-771 Black Light Intensity IV-772 Examination Requirements IV-721 Requirements for Qualifying Alternate Wavelength Light Sources for Excitation of Specific Fluorescent Particles
308	IV-773 Qualification of Alternate Wavelength Light Source and Specific Particles IV-790 Documentation IV-791 Examination Record
309	Mandatory Appendix V Requirements for the Use of Magnetic Rubber Techniques V-710 Scope V-720 General Requirements V-721 Written Procedure Requirements V-730 Equipment V-731 Magnetizing Apparatus V-732 Magnetic Rubber Materials V-733 Magnetic Field Strength V-734 Magnification V-740 Miscellaneous Requirements V-741 Surface Preparation
310	V-742 Taping and Damming V-743 Release Treatment V-750 Techniques V-751 Techniques V-752 Application of Magnetic Field V-721 Requirements of a Magnetic Rubber Examination Procedure
311	V-760 Calibration V-764 Magnetic Field Adequacy and Direction V-770 Examination V-773 Application of Liquid Polymer- Magnetic Particle Material V-774 Movement During Cure V-776 Removal of Replicas V-780 Evaluation V-790 Documentation V-793 Examination Records
312	Nonmandatory Appendix A Measurement of Tangential Field Strength With Gaussmeters A-710 Scope A-720 General Requirements A-730 Equipment A-750 Procedure A-790 Documentation/Records
313	Article 8 Eddy Current Examination T-810 Scope
314	Mandatory Appendix II Eddy Current Examination of Nonferromagnetic Heat Exchanger Tubing II-810 Scope II-820 General II-821 Written Procedure Requirements II-822 Personnel Requirements II-830 Equipment II-831 Data Acquisition System II-832 Analog Data Acquisition System
315	II-833 Digital Data Acquisition System II-834 Bobbin Coils II-821 Requirements of an Eddy Current Examination Procedure
316	II-835 Data Analysis System II-836 Analog Data Analysis System II-837 Digital Data Analysis System II-838 Hybrid Data Analysis System II-840 Requirements II-841 Recording and Sensitivity Level II-842 Probe Traverse Speed II-843 Fixture Location Verification II-844 Automated Data Screening System II-860 Calibration II-861 Equipment Calibration
317	II-862 Calibration Reference Standards II-863 Analog System Setup and Adjustment
318	II-864 Digital System Off-Line Calibration II-870 Examination II-880 Evaluation II-881 Data Evaluation II-882 Means of Determining Indication Depth II-863.1 Differential Technique Response From Calibration Reference Standard II-863.2 Absolute Technique Response From Calibration Reference Standard
319	II-883 Frequencies Used for Data Evaluation II-890 Documentation II-891 Reporting II-892 Records II-880 Flaw Depth as a Function of Phase Angle at 400 kHz [Ni–Cr–Fe 0.050 in. (1.24 mm) Wall Tube]
321	Mandatory Appendix III Eddy Current Examination on Coated Ferromagnetic Materials III-810 Scope III-820 General III-821 Personnel Qualification III-822 Written Procedure Requirements III-823 Procedure Demonstration III-830 Equipment III-850 Technique III-860 Calibration
322	III-870 Examination III-890 Documentation III-891 Examination Report III-893 Record Retention
323	Mandatory Appendix IV External Coil Eddy Current Examination of Tubular Products IV-810 Scope IV-820 General IV-821 Performance IV-822 Personnel Qualification IV-823 Written Procedure Requirements IV-830 Equipment IV-831 Test Coils and Probes IV-823 Requirements of an External Coil Eddy Current Examination Procedure
324	IV-832 Scanners IV-833 Reference Specimen IV-850 Technique IV-860 Calibration IV-861 Performance Verification IV-862 Calibration of Equipment IV-870 Examination IV-880 Evaluation IV-890 Documentation IV-891 Examination Reports IV-893 Record Retention
325	Mandatory Appendix V Eddy Current Measurement of Nonconductive-Nonferromagnetic Coating Thickness on a Nonferromagnetic Metallic Material V-810 Scope V-820 General V-821 Written Procedure Requirements V-822 Personnel Qualification V-823 Procedure/Technique Demonstration V-830 Equipment V-821 Requirements of an Eddy Current Examination Procedure for the Measurement of Nonconductive-Nonferromagnetic Coating Thickness on a Metallic Material
326	V-831 Probes V-850 Technique V-860 Calibration V-870 Examination V-880 Evaluation V-890 Documentation V-891 Examination Report V-893 Record Retention
327	V-860 Typical Lift-off Calibration Curve for Coating Thickness Showing Thickness Calibration Points Along the Curve
328	Mandatory Appendix VI Eddy Current Detection and Measurement of Depth of Surface Discontinuities in Nonferromagnetic Metals With Surface Probes VI-810 Scope VI-820 General VI-821 Written Procedure Requirements VI-822 Personnel Qualification VI-823 Procedure/Technique Demonstration VI-821 Requirements of an Eddy Current Examination Procedure for the Detection and Measurement of Depth for Surface Discontinuities in Nonferromagnetic Metallic Materials
329	VI-830 Equipment VI-831 Probes VI-832 Reference Specimen VI-850 Technique VI-860 Calibration VI-870 Examination VI-880 Evaluation
330	VI-890 Documentation VI-891 Examination Report VI-893 Record Retention VI-832 Reference Specimen VI-850 Impedance Plane Representations of Indications From Figure VI-832
331	Mandatory Appendix VII Eddy Current Examination of Ferromagnetic and Nonferromagnetic Conductive Metals to Determine If Flaws Are Surface Connected VII-810 Scope VII-820 General VII-821 Performance VII-822 Personnel Qualification VII-823 Written Procedure Requirements VII-830 Equipment VII-831 System Description VII-832 Surface Probes VII-833 Cables VII-823 Requirements of an Eddy Current Surface Examination Procedure
332	VII-834 Instrumentation VII-835 Reference Specimen VII-850 Technique VII-860 Calibration VII-861 General VII-862 Calibration Response VII-870 Examination VII-880 Evaluation VII-890 Documentation VII-891 Examination Report
333	VII-892 Record Retention VII-835 Eddy Current Reference Specimen
334	VII-862 Impedance Plane Responses for Stainless Steel and Carbon Steel Reference Specimens
335	Mandatory Appendix VIII Alternative Technique for Eddy Current Examination of Nonferromagnetic Heat Exchanger Tubing, Excluding Nuclear Steam Generator Tubing VIII-810 Scope VIII-820 General VIII-821 Written Procedure Requirements VIII-830 Equipment VIII-831 Data Acquisition System VIII-832 Analog Data Acquisition System
336	VIII-833 Digital Data Acquisition System VIII-834 Bobbin Coils VIII-821 Requirements of an Eddy Current Examination Procedure
337	VIII-850 Technique VIII-851 Probe Data Acquisition Speed VIII-852 Recording VIII-853 Automated Data Screening System VIII-860 Calibration VIII-861 Equipment Calibration VIII-862 Calibration Reference Standards VIII-863 Base Frequency
338	VIII-864 Setup and Adjustment VIII-864.1 Differential Technique Response From Calibration Reference VIII-864.2 Absolute Technique From Calibration Reference Standard
339	VIII-870 Examination VIII-880 Evaluation VIII-881 Data Evaluation VIII-882 Means of Determining Indication Depth VIII-883 Frequencies Used for Data Evaluation VIII-890 Documentation VIII-891 Reporting VIII-892 Support Members VIII-893 Records
341	Mandatory Appendix IX Eddy Current Array Examination of Ferromagnetic and Nonferromagnetic Materials for the Detection of Surface-Breaking Flaws IX-810 Scope IX-820 General Requirements IX-821 ECA Technique IX-822 Written Procedure Requirements IX-823 Procedure Qualification IX-824 Personnel Qualification IX-821-1 ECA Technique Compared to Raster Scan
342	IX-825 Procedure Demonstration IX-830 Equipment IX-831 Digital Data Acquisition Equipment IX-832 Probes IX-833 Reference Standard (See Figure IX-833-1) IX-832-1 Array Coil Sensitivity Variance IX-822-1 Written Procedure Requirements for an ECA Examination
343	IX-840 Application Requirements IX-841 Scanning Speed IX-842 Coated Surfaces IX-843 Magnetic Permeability Variance IX-844 Automated Data Screening System IX-850 Technique IX-851 Frequency, Probe Drive, and Gain Selection IX-833-1 Example Reference Standard
344	IX-852 Channel Standardization IX-853 Color Palette Adjustment IX-860 Calibration IX-861 Equipment Calibration IX-862 System Calibration and Verification IX-870 Examination IX-871 Surface Condition IX-872 Scanning Method (See Figure IX-872-1) IX-873 Secondary Scanning IX-880 Evaluation IX-881 Relevant vs. Nonrelevant Indications IX-882 Length Sizing IX-890 Documentation IX-891 Examination Report
345	IX-892 Record Retention IX-872-1 Scanning Overlap
346	Mandatory Appendix X Eddy Current Array Examination of Ferromagnetic and Nonferromagnetic Welds for the Detection of Surface-Breaking Flaws X-810 Scope X-820 General Requirements X-821 ECA Technique X-822 Written Procedure Requirements X-823 Procedure Qualification X-824 Personnel Qualification X-825 Procedure Demonstration X-830 Equipment X-831 Digital Data Acquisition Equipment
347	X-832 Probes X-833 Reference Standard (See Figure X-833-1) X-822-1 Written Procedure Requirements for an ECA Examination
348	X-840 Application Requirements X-841 Scanning Speed X-842 Coated Surfaces X-843 Magnetic Permeability Variance X-844 Automated Data Screening System X-850 Technique X-851 Frequency, Probe Drive, and Gain Selection X-852 Channel Standardization X-853 Color Palette Adjustment X-860 Calibration X-861 Equipment Calibration X-833-1 Example Reference Standard
349	X-862 Calibration and Verification X-870 Examination X-871 Surface Condition X-872 Scanning Method (See Mandatory Appendix IX, Figure IX-872-1) X-873 Secondary Scanning X-880 Evaluation X-881 Relevant vs. Nonrelevant Indications X-882 Length Sizing X-890 Documentation X-891 Examination Report X-892 Record Retention
350	Mandatory Appendix XI Tangential Field Examination of Ferromagnetic and Nonferromagnetic Materials and Welds for the Detection and Measurement of Surface-Breaking Discontinuities XI-810 Scope XI-820 General Requirements XI-821 Technique XI-822 Written Procedure Requirements XI-823 Procedure Qualification XI-821-1 Induced Eddy Currents Flow Around and Under a Surface-Breaking Discontinuity
351	XI-821-2 Example Coil Arrangement: Tangentially Oriented Driver Coil With Passive Receiver Coils Oriented Perpendicular and Tangential to the Examination Surface XI-822-1 Written Procedure Requirements for a TF Technique Examination
352	XI-824 Personnel Qualification XI-825 Procedure Demonstration XI-830 Equipment XI-831 Digital Data Acquisition Equipment XI-832 Probes XI-833 Reference Standard
353	XI-832-1 Array Coil Sensitivity Variance for Defect Detection XI-832-2 Array Coil Sensitivity Variance for Defect Depth Measurement
354	XI-840 Application Requirements XI-841 Scanning Speed XI-842 Coated Surfaces XI-843 Magnetic Permeability Variance XI-844 Automated Data Screening System XI-850 Technique XI-851 Frequency, Probe Driver, and Gain Selection XI-852 Channel Standardization XI-853 Color Palette Adjustment XI-833.1-1 Example Reference Standard, Welds XI-833.2-1 Example Reference Standard, Materials
355	XI-860 Calibration XI-861 Equipment Calibration XI-862 System Calibration and Verification XI-870 Examination XI-871 Surface Condition XI-872 Scanning Method XI-880 Evaluation XI-881 Relevant vs. Nonrelevant Indications XI-882 Depth Measurement — Nonvolumetric Discontinuities XI-883 Depth Measurement — Volumetric Discontinuities XI-884 Length Measurement XI-890 Documentation XI-891 Examination Report XI-892 Record Retention XI-893 Storage Media
356	XI-872-1 Scanning Overlap
357	Article 9 Visual Examination T-910 Scope T-920 General T-921 Written Procedure Requirements T-922 Personnel Requirements T-923 Physical Requirements T-921 Requirements of a Visual Examination Procedure
358	T-930 Equipment T-950 Technique T-951 Applications T-952 Direct Visual Examination T-953 Remote Visual Examination T-954 Translucent Visual Examination T-955 Light Meter Calibration T-980 Evaluation T-990 Documentation T-991 Report of Examination T-993 Record Maintenance
359	Article 10 Leak Testing T-1010 Scope T-1020 General T-1021 Written Procedure Requirements T-1022 Referencing Code T-1030 Equipment T-1031 Gages
360	T-1040 Miscellaneous Requirements T-1041 Cleanliness T-1042 Openings T-1043 Temperature T-1044 Pressure/Vacuum (Pressure Limits) T-1050 Procedure T-1051 Preliminary Leak Test T-1052 Test Sequence T-1060 Calibration T-1061 Pressure/Vacuum Gages T-1062 Temperature Measuring Devices T-1063 Calibration Leak Standards
361	T-1070 Test T-1080 Evaluation T-1081 Acceptance Standards T-1090 Documentation T-1091 Test Report T-1092 Record Retention
362	Mandatory Appendix I Bubble Test — Direct Pressure Technique I-1010 Scope I-1020 General I-1021 Written Procedure Requirements I-1030 Equipment I-1031 Gases I-1032 Bubble Solution I-1033 Immersion Bath I-1070 Test I-1071 Soak Time I-1021 Requirements of a Direct Pressure Bubble Leak Testing Procedure
363	I-1072 Surface Temperature I-1073 Application of Solution I-1074 Immersion in Bath I-1075 Lighting and Visual Aids I-1076 Indication of Leakage I-1077 Posttest Cleaning I-1080 Evaluation I-1081 Leakage I-1082 Repair/Retest
364	Mandatory Appendix II Bubble Test — Vacuum Box Technique II-1010 Scope II-1020 General II-1021 Written Procedure Requirements II-1030 Equipment II-1031 Bubble Solution II-1032 Vacuum Box II-1021 Requirements of a Vacuum Box Leak Testing Procedure
365	II-1033 Vacuum Source II-1070 Test II-1071 Surface Temperature II-1072 Application of Solution II-1073 Vacuum Box Placement II-1074 Pressure (Vacuum) Retention II-1075 Vacuum Box Overlap II-1076 Lighting and Visual Aids II-1077 Indication of Leakage II-1078 Posttest Cleaning II-1080 Evaluation II-1081 Leakage II-1082 Repair/Retest
366	Mandatory Appendix III Halogen Diode Detector Probe Test III-1010 Introduction and Scope III-1011 Alkali-Ion Diode (Heated Anode) Halogen Leak Detectors III-1012 Electron Capture Halogen Leak Detectors III-1020 General III-1021 Written Procedure Requirements III-1030 Equipment III-1031 Tracer Gas III-1032 Instrument III-1033 Calibration Leak Standards III-1060 Calibration III-1061 Standard Leak Size
367	III-1062 Warm Up III-1063 Scanning Rate III-1064 Detection Time III-1065 Frequency and Sensitivity III-1070 Test III-1071 Location of Test III-1072 Concentration of Tracer Gas III-1073 Soak Time III-1021 Requirements of a Halogen Diode Detector Probe Testing Procedure III-1031 Tracer Gases
368	III-1074 Scanning Distance III-1075 Scanning Rate III-1076 Scanning Direction III-1077 Leakage Detection III-1078 Application III-1080 Evaluation III-1081 Leakage III-1082 Repair/Retest
369	Mandatory Appendix IV Helium Mass Spectrometer Test — Detector Probe Technique IV-1010 Scope IV-1020 General IV-1021 Written Procedure Requirements IV-1030 Equipment IV-1031 Instrument IV-1032 Auxiliary Equipment IV-1033 Calibration Leak Standards IV-1060 Calibration IV-1061 Instrument Calibration IV-1062 System Calibration
370	IV-1070 Test IV-1071 Location of Test IV-1072 Concentration of Tracer Gas IV-1073 Soak Time IV-1074 Scanning Distance IV-1075 Scanning Rate IV-1021 Requirements of a Helium Mass Spectrometer Detector Probe Testing Procedure
371	IV-1076 Scanning Direction IV-1077 Leakage Detection IV-1078 Application IV-1080 Evaluation IV-1081 Leakage IV-1082 Repair/Retest
372	Mandatory Appendix V Helium Mass Spectrometer Test — Tracer Probe Technique V-1010 Scope V-1020 General V-1021 Written Procedure Requirements V-1030 Equipment V-1031 Instrument V-1032 Auxiliary Equipment V-1033 System Calibration Leak Standard V-1060 Calibration V-1061 Instrument Calibration
373	V-1062 System Calibration V-1070 Test V-1071 Scanning Rate V-1072 Scanning Direction V-1073 Scanning Distance V-1074 Leakage Detection V-1075 Flow Rate V-1080 Evaluation V-1081 Leakage V-1021 Requirements of a Helium Mass Spectrometer Tracer Probe Testing Procedure
374	V-1082 Repair/Retest
375	Mandatory Appendix VI Pressure Change Test VI-1010 Scope VI-1020 General VI-1021 Written Procedure Requirements VI-1030 Equipment VI-1031 Pressure Measuring Instruments VI-1032 Temperature Measuring Instruments VI-1021 Requirements of a Pressure Change Testing Procedure
376	VI-1060 Calibration VI-1061 Pressure Measuring Instruments VI-1062 Temperature Measuring Instruments VI-1070 Test VI-1071 Pressure Application VI-1072 Vacuum Application VI-1073 Test Duration VI-1074 Small Pressurized Systems VI-1075 Large Pressurized Systems VI-1076 Start of Test VI-1077 Essential Variables VI-1080 Evaluation VI-1081 Acceptable Test VI-1082 Rejectable Test
377	Mandatory Appendix VIII Thermal Conductivity Detector Probe Test VIII-1010 Introduction and Scope VIII-1011 Thermal Conductivity Leak Detectors VIII-1020 General VIII-1021 Written Procedure Requirements VIII-1030 Equipment VIII-1031 Tracer Gas VIII-1032 Instrument VIII-1033 Calibration Leak Standard VIII-1060 Calibration VIII-1061 Standard Leak Size VIII-1062 Warm Up VIII-1063 Scanning Rate
378	VIII-1064 Detection Time VIII-1065 Frequency and Sensitivity VIII-1070 Test VIII-1071 Location of Test VIII-1072 Concentration of Tracer Gas VIII-1073 Soak Times VIII-1074 Scanning Distance VIII-1075 Scanning Rate VIII-1021 Requirements of a Thermal Conductivity Detector Probe Testing Procedure VIII-1031 Tracer Gases
379	VIII-1076 Scanning Direction VIII-1077 Leakage Detection VIII-1078 Application VIII-1080 Evaluation VIII-1081 Leakage VIII-1082 Repair/Retest
380	Mandatory Appendix IX Helium Mass Spectrometer Test — Hood Technique IX-1010 Scope IX-1020 General IX-1021 Written Procedure Requirements IX-1030 Equipment IX-1031 Instrument IX-1032 Auxiliary Equipment IX-1021 Requirements of a Helium Mass Spectrometer Hood Testing Procedure
381	IX-1033 System Calibration Leak Standard IX-1050 Technique IX-1051 Permeation IX-1052 Repetitive or Similar Tests IX-1053 Multiple-Mode Mass Spectrometer Leak Detectors IX-1060 Calibration IX-1061 Instrument Calibration
382	IX-1062 System Calibration IX-1070 Test IX-1071 Standard Technique
383	IX-1072 Alternative Technique IX-1080 Evaluation IX-1081 Leakage IX-1082 Repair/Retest
384	Mandatory Appendix X Ultrasonic Leak Detector Test X-1010 Introduction X-1020 General X-1021 Written Procedure Requirements X-1030 Equipment X-1031 Instrument X-1032 Capillary Calibration Leak Standard X-1021 Requirements of an Ultrasonic Leak Testing Procedure
385	X-1060 Calibration X-1061 Standard Leak Size X-1062 Warm Up X-1063 Scanning Rate X-1064 Frequency and Sensitivity X-1070 Test X-1071 Location of Test X-1072 Soak Time X-1073 Scanning Distance X-1074 Scanning Rate X-1075 Leakage Detection X-1080 Evaluation X-1081 Leakage X-1082 Repair/Retest
386	Mandatory Appendix XI Helium Mass Spectrometer — Helium-Filled-Container Leakage Rate Test XI-1010 Scope XI-1020 General XI-1021 Written Procedure Requirements XI-1030 Equipment XI-1031 Instrument XI-1032 Auxiliary Equipment XI-1033 System Calibration Leak Standard
387	XI-1050 Technique XI-1051 Helium Depletion XI-1052 Multiple-Mode Mass Spectrometer Leak Detectors XI-1053 Tracer Gas Supply in the Upstream Volume XI-1060 Calibration XI-1061 Instrument Calibration XI-1021.1-1 Requirements of a Helium Mass Spectrometer Sealed-Object Leakage Rate Test
388	XI-1062 Test Sequence and System Calibration — Standard Technique XI-1063 Test Sequence and System Calibration — Alternative Sequence for Small Upstream Volume
389	XI-1070 Calculation of Test Reliability and Corrected Leakage Rate XI-1071 Test Reliability XI-1072 Calculation and Report of Corrected Leakage Rates XI-1080 Evaluation XI-1081 Leakage XI-1082 Repair/Retest
390	Nonmandatory Appendix A Supplementary Leak Testing Equation Symbols A-1010 Applicability of the Formulas
391	Article 11 Acoustic Emission Examination of Fiber-Reinforced Plastic Vessels T-1110 Scope T-1120 General T-1121 Vessel Conditioning T-1122 Vessel Loading T-1121 Requirements for Reduced Operating Level Immediately Prior to Examination
392	T-1123 Vessel Support T-1124 Environmental Conditions T-1125 Noise Elimination T-1126 Instrumentation Settings T-1127 Sensors T-1128 Procedure Requirements T-1130 Equipment
393	T-1160 Calibration T-1161 System Calibration T-1162 Sensor Locations and Spacings T-1163 Systems Performance Check T-1170 Examination T-1171 General Guidelines T-1172 Background Noise
394	T-1173 Loading T-1174 AE Activity T-1175 Test Termination T-1180 Evaluation T-1181 Evaluation Criteria T-1182 Emissions During Load Hold, EH T-1183 Felicity Ratio Determination T-1184 High Amplitude Events Criterion T-1185 Total Counts Criterion T-1190 Documentation T-1191 Report
395	T-1192 Record
396	T-1173(a)(1) Atmospheric Vessels Loading Sequence
397	T-1173(a)(2) Vacuum Vessels Loading Sequence
398	T-1173(a)(3) Test Algorithm — Flowchart for Atmospheric Vessels
399	T-1173(b)(1) Pressure Vessel Loading Sequence
400	T-1173(b)(2) Algorithm — Flowchart for Pressure Vessels
401	T-1181 Evaluation Criteria
402	Mandatory Appendix I Instrumentation Performance Requirements I-1110 AE Sensors I-1111 High Frequency Sensors I-1112 Low Frequency Sensors I-1120 Signal Cable I-1130 Couplant I-1140 Preamplifier I-1150 Filters I-1160 Power-Signal Cable I-1161 Power Supply
403	I-1170 Main Amplifier I-1180 Main Processor I-1181 General I-1182 Peak Amplitude Detection I-1183 Signal Outputs and Recording
404	I-1183 Sample of Schematic of AE Instrumentation for Vessel Examination
405	Mandatory Appendix II Instrument Calibration II-1110 General II-1120 Threshold II-1130 Reference Amplitude Threshold II-1140 Count Criterion Nc and AM Value II-1160 Field Performance
406	Nonmandatory Appendix A Sensor Placement Guidelines A-1110 Case 1 — Atmospheric Vertical Vessel
407	A-1120 Case 2 — Atmospheric Vertical Vessel
408	A-1130 Case 3 — Atmospheric/Pressure Vessel
409	A-1140 Case 4 — Atmospheric/Pressure Vertical Vessel
410	A-1150 Case 5 — Atmospheric/Vacuum Vertical Vessel
411	A-1160 Case 6 — Atmospheric/Pressure Horizontal Tank
412	Article 12 Acoustic Emission Examination of Metallic Vessels During Pressure Testing T-1210 Scope T-1220 General T-1221 Vessel Stressing T-1222 Noise Reduction T-1223 Sensors T-1224 Location of Acoustic Emission Sources
413	T-1225 Procedure Requirements T-1230 Equipment T-1260 Calibration T-1261 System Calibration T-1262 On-Site System Calibration T-1263 Attenuation Characterization
414	T-1264 Sensor Location T-1265 Sensor Spacing T-1266 Systems Performance Check T-1270 Examination T-1271 General Guidelines T-1272 Background Noise
415	T-1273 Vessel Pressurization T-1280 Evaluation T-1281 Evaluation Criteria T-1290 Documentation T-1291 Written Report T-1292 Record
416	T-1273.2.1 An Example of Pressure Vessel Test Stressing Sequence
417	T-1273.2.2 An Example of In-Service, Pressure Vessel, Test Loading Sequence
418	T-1281 An Example of Evaluation Criteria for Zone Location
419	Mandatory Appendix I Instrumentation Performance Requirements I-1210 Acoustic Emission Sensors I-1211 General I-1212 Sensor Characteristics I-1220 Signal Cable I-1230 Couplant I-1240 Preamplifier I-1250 Filter I-1260 Power-Signal Cable I-1270 Power Supply I-1280 Main Amplifier I-1290 Main Processor I-1291 General
420	I-1292 Peak Amplitude Detection
421	Mandatory Appendix II Instrument Calibration and Cross-Referencing II-1210 Manufacturer’s Calibration II-1211 Annual Calibration II-1220 Instrument Cross-Referencing II-1221 Sensor Characterization
422	Mandatory Appendix III Methodology for the Evaluation of the Sensitivity of Acoustic Emission Instrumentation III-1210 Scope III-1211 References III-1220 General III-1221 Level of Sensitivity – Kcats Factor III-1222 Personnel Qualification III-1230 Kcats Calculation III-1231 Information Required
423	III-1232 Structure to be Examined III-1233 Sensor Array III-1234 Acquisition Threshold III-1235 Reference Source III-1240 Methodology of Calculation III-1241 Data Input III-1242 Kcats Calculation Steps
424	III-1250 Kcats Factor Benefits III-1241.1-1 Example of Planar (2D) Sensor Array
425	III-1241.2-1 Example of Attenuation Curve
426	III-1242.1-1 Graph Representing the Positions of Sensors (Stars) and the Grid for Which the Distances Are Calculated for Each Point
427	III-1242.1-2 Graph Representing the Positions of Sensors
428	III-1242.1-3 Mapping Representing the Distance to the Closest Sensor
429	III-1242.1-4 Mapping Representing the Distance to the Third-Closest Sensor
430	III-1242.2-1 Calculation of the Equivalent Minimum Amplitude Using the Planar Localization Algorithm
431	III-1242.2-2 Mapping Representing the Minimum Amplitude That Can Be Detected (Processed) by the Zonal Location Method
432	III-1242.2-3 Mapping Representing the Minimum Amplitude That Can Be Processed by the Planar Location Method
433	III-1242.3-1 Mapping Representing the Areas Where the Planar Location Method Is Efficient and Not Applicable III-1250-1 Example of Values of Kcats for Two Different Configurations
434	Nonmandatory Appendix A Sensor Placement Guidelines A-1210 Case 1 — Vertical Pressure Vessel Dished Heads, Lug or Leg Supported
435	A-1220 Case 2 — Complex Dished Head With Multiple Nozzles
436	A-1230 Case 3 — Horizontal Pressure Vessel Dished Heads, Saddle Supported
437	A-1240 Case 4 — Vertical Pressure Vessel Packed or Trayed Column Dished Heads, Lug or Skirt Supported
438	A-1250 Case 5 — Spherical Pressure Vessel, Leg Supported
439	Nonmandatory Appendix B Supplemental Information for Conducting Acoustic Emission Examinations B-1210 Frequency Selection B-1220 Combining More Than One Sensor in a Single Channel B-1230 Attenuative Welds B-1240 Production Line Testing of Identical Vessels
440	Article 13 Continuous Acoustic Emission Monitoring of Pressure Boundary Components T-1310 Scope T-1311 References T-1320 General T-1321 Relevant Indications T-1322 Personnel Qualification T-1323 Written Procedures
441	T-1330 Equipment T-1331 General T-1332 AE Sensors T-1331 Functional Flow Diagram — Continuous AE Monitoring System
442	T-1333 Signal Cables T-1334 Amplifiers T-1335 AE Instrument and Monitor T-1332.2 Response of a Waveguide AE Sensor Inductively Tuned to 500 kHz
443	T-1340 Miscellaneous Requirements T-1341 Equipment Verification T-1342 Sensor Calibration T-1343 Signal Pattern Recognition
444	T-1344 Material Attenuation/Characterization T-1345 Background Noise T-1346 Verification Records T-1347 Sensor Installation T-1348 Signal Lead Installation T-1349 AE Monitor Installation T-1350 Technique/Procedure Requirements
445	T-1351 AE System Operation T-1352 Data Processing, Interpretation, and Evaluation T-1353 Data Recording and Storage T-1354 Component Loading T-1355 Noise Interference T-1356 Coordination with Plant System Owner/Operator
446	T-1357 Source Location and Sensor Mounting T-1360 Calibration T-1361 Sensors T-1362 Complete AE Monitor System T-1363 Verification Intervals T-1364 Verification Records T-1370 Examination T-1371 Plant Startup and Shutdown T-1373 Plant Steady-State Operation
447	T-1374 Nuclear Metal Components T-1375 Non-Nuclear Metal Components T-1376 Nonmetallic Components T-1377 Limited Zone Monitoring T-1378 Hostile Environment Applications T-1379 Leak Detection Applications T-1380 Evaluation/Results T-1381 Data Processing, Interpretation, and Evaluation T-1382 Data Requirements T-1390 Reports/Records T-1391 Reports to Plant System Owner/Operator T-1392 Records
448	T-1393 Record Retention Requirements
449	Mandatory Appendix I Nuclear Components I-1310 Scope I-1330 Equipment I-1331 Preamplifiers I-1332 AE Sensors I-1333 Frequency Response I-1334 Signal Processing I-1340 Miscellaneous Requirements I-1341 Equipment Qualification I-1360 Calibration I-1361 Calibration Block I-1362 Calibration Interval I-1380 Evaluation
451	Mandatory Appendix II Non-Nuclear Metal Components II-1310 Scope II-1330 Equipment II-1331 Sensors II-1333 Amplifiers II-1334 Main Processor
452	II-1360 Calibration II-1361 System Performance Check II-1362 System Performance Check Verification II-1380 Evaluation II-1381 Evaluation Criteria — Zone Location II-1382 Evaluation Criteria — Multisource Location II-1381 An Example of Evaluation Criteria for Zone Location II-1382 An Example of Evaluation Criteria for Multisource Location
453	Mandatory Appendix III Nonmetallic Components III-1310 Scope III-1320 General III-1321 Applications III-1330 Equipment III-1331 Sensors III-1332 Source Location Accuracy III-1360 Calibration III-1361 Annual Field Calibration III-1362 Performance Verification III-1363 Low Amplitude Threshold III-1364 High Amplitude Threshold
454	III-1380 Evaluation III-1381 Evaluation Criteria III-1382 Source Mechanism
455	Mandatory Appendix IV Limited Zone Monitoring IV-1310 Scope IV-1320 General IV-1321 Guard Sensor Technique IV-1340 Miscellaneous Requirements IV-1341 Redundant Sensors IV-1350 Technique IV-1351 Techniques IV-1352 Procedure IV-1353 Other Techniques IV-1360 Calibration IV-1380 Evaluation
456	IV-1390 Documentation
457	Mandatory Appendix V Hostile Environment Applications V-1310 Scope V-1330 Equipment V-1331 AE Sensors V-1332 AE Sensor Types V-1333 Waveguide V-1334 AE Signal Transmission V-1340 Miscellaneous Requirements V-1341 Sensor Mounting
458	V-1333 Metal Waveguide AE Sensor Construction
459	V-1341 Mounting Fixture for Steel Waveguide AE Sensor
460	Mandatory Appendix VI Leak Detection Applications VI-1310 Scope VI-1320 General VI-1330 Equipment VI-1331 Sensor Type VI-1332 Waveguide
461	VI-1333 Electronic Filters VI-1350 Technique VI-1351 Procedure VI-1360 Calibration VI-1361 Calibration Checks VI-1370 Examination VI-1371 Implementation of System Requirements VI-1372 Verification Procedure VI-1373 Equipment Qualification and Calibration Data VI-1380 Evaluation VI-1381 Leak Indications VI-1382 Leak Location
462	Article 14 Examination System Qualification T-1410 Scope T-1420 General Requirements T-1421 The Qualification Process T-1422 Technical Justification T-1423 Performance Demonstration T-1424 Levels of Rigor
463	T-1425 Planning a Qualification Demonstration T-1430 Equipment T-1440 Application Requirements T-1441 Technical Justification Report
464	T-1442 Performance Demonstration
465	T-1443 Examination System Requalification T-1450 Conduct of Qualification Demonstration T-1451 Protocol Document T-1452 Individual Qualification
466	T-1460 Calibration T-1470 Examination T-1471 Intermediate Rigor Detection Test T-1472 High Rigor Detection Tests
467	T-1472.1 Total Number of Samples for a Given Number of Misses at a Specified Confidence Level and POD
468	T-1480 Evaluation T-1490 Documentation and Records T-1472.2 Required Number of First Stage Examiners vs. Target Pass Rate
469	Mandatory Appendix II UT Performance Demonstration Criteria II-1410 Scope II-1420 General II-1430 Equipment II-1434 Qualification Blocks II-1440 Application Requirements
470	II-1450 Conduct of Qualification Demonstration II-1434 Flaw Characterization for Tables II-1434-1 and II-1434-2 II-1434-1 Flaw Acceptance Criteria for 4-in. to 12-in. Thick Weld II-1434-2 Flaw Acceptance Criteria for Larger Than 12-in. Thick Weld
471	II-1460 Calibration II-1470 Examination II-1480 Evaluation II-1481 Low Level II-1482 Intermediate Level II-1483 High Level II-1490 Documentation
472	Article 15 Alternating Current Field Measurement Technique (ACFMT) T-1510 Scope T-1520 General T-1521 Supplemental Requirements T-1522 Written Procedure Requirements T-1530 Equipment T-1531 Instrument T-1532 Probes T-1533 Calibration Blocks
473	T-1540 Miscellaneous Requirements T-1541 Surface Conditioning T-1542 Demagnetization T-1543 Identification of Weld Examination Areas T-1560 Calibration T-1561 General Requirements T-1562 Calibration T-1522 Requirements of an ACFMT Examination Procedure
474	T-1563 Performance Confirmation T-1533 ACFMT Calibration Block
475	T-1570 Examination T-1571 General Examination Requirements T-1572 Examination Coverage T-1573 Overlap T-1574 Interpretation T-1580 Evaluation T-1590 Documentation T-1591 Recording Indication T-1592 Examination Record T-1593 Report
476	Article 16 Magnetic Flux Leakage (MFL) Examination T-1610 Scope T-1620 General T-1621 Personnel Qualification Requirements T-1622 Equipment Qualification Requirements T-1623 Written Procedure Requirements
477	T-1630 Equipment T-1640 Requirements T-1650 Calibration T-1660 Examination T-1622.1.1 Reference Plate Dimensions
478	T-1670 Evaluation T-1680 Documentation T-1622.1.2 Reference Pipe or Tube Dimensions
479	T-1623 Requirements of an MFL Examination Procedure
480	Article 17 Remote Field Testing (RFT) Examination Method T-1710 Scope T-1720 General T-1721 Written Procedure Requirements T-1722 Personnel Requirements T-1730 Equipment T-1750 Technique T-1721 Requirements of an RFT Examination Procedure
481	T-1760 Calibration T-1761 Instrument Calibration T-1762 System Preparation T-1763 System Setup and Calibration T-1762 Pit Reference Tube (Typical)
482	T-1763.1(a) Voltage Plane Display of Differential Channel Response for Through-Wall Hole (Through-Hole Signal) and 20% Groove Showing Preferred Angular Relationship T-1763.1(b) Voltage Plane Display of Differential Channel Response for the Tube Support Plate (TSP), 20% Groove, and Through-Wall Hole (Through-Hole Signal)
483	T-1764 Auxiliary Frequency(ies) Calibration Procedure T-1765 Calibration Confirmation T-1766 Correlation of Signals to Estimate Depth of Flaws T-1770 Examination T-1771 General T-1772 Probe Speed T-1780 Evaluation T-1790 Documentation T-1763.2 Reference Curve and the Absolute Channel Signal Response From Two Circumferential Grooves and a Tube Support Plate
484	T-1793 Record Retention
485	Article 18 Acoustic Pulse Reflectometry (APR) Examination T-1810 Scope T-1820 General T-1821 Written Procedure Requirements T-1830 Equipment T-1831 Instrumentation T-1832 Reference Specimen T-1821 Requirements of an Acoustic Pulse Reflectometry Examination Procedure
486	T-1832 Reference Specimens
487	T-1840 Miscellaneous Requirements T-1841 Tube or Pipe Precleaning T-1850 Prior to the Examination T-1860 Calibration T-1861 Instrument Calibration T-1862 System Preparation T-1863 System Setup T-1864 Functional Test
488	T-1865 Analysis of Signals to Determine Flaw Type and Estimate Flaw Size T-1870 Examination T-1880 Evaluation T-1890 Documentation T-1891 Recording Indications
489	T-1892 Examination Records T-1893 Storage Media T-1865.1 Signal Analysis From Various Types of Discontinuities
490	T-1865.2 Reflection From a Through-Wall Hole
491	Article 19 Guided Wave Examination Method for Piping T-1910 Scope T-1920 General T-1921 Written Procedure Requirements T-1922 Personnel Qualification T-1930 Equipment T-1931 Instrumentation Requirements T-1932 Sensors T-1950 Wave Modes
492	T-1951 Miscellaneous Requirements T-1960 Calibration T-1961 Instrument Calibration T-1921.1 Requirements of a GWT Examination Procedure
493	T-1962 System Calibration T-1963 Distance–Amplitude Correction (DAC) or Time-Corrected Gain (TCG) T-1964 Detection Threshold T-1965 Call Level T-1970 Examination T-1971 Examination Coverage T-1980 Evaluation T-1981 General T-1982 Evaluation Level T-1990 Documentation T-1992 Examination Records
495	Nonmandatory Appendix A Operation of GWT Systems A-1910 Scope A-1920 General
496	A-1921 Call Level A-1922 Effect of Pipe Geometry on Examination Range A-1920 Illustration of the Guided Wave Examination Procedure
497	A-1923 Effect of Pipe Coating A-1924 Effect of General Corrosion on Examination Range A-1925 Special Applications of Guided Wave Testing
498	Article 20 Computed Tomography Examination T-2010 Scope T-2020 General T-2021 Written Procedure Requirements T-2022 Image Acquisition Plan T-2023 Personnel Qualifications T-2024 System of Identification T-2025 Referencing Code Requirements T-2030 Equipment T-2031 Radiation Sources
499	T-2032 Computer Hardware T-2033 Image Display T-2060 Detector Pixel Correction T-2061 Types of Correction T-2062 Bad Pixel Maps T-2070 Examination T-2071 Extent of Examination T-2072 Image Acquisition Plan T-2073 Geometric Unsharpness T-2074 Image Quality Verification T-2080 Evaluation T-2081 Preliminary Evaluation T-2082 Evaluation by the Manufacturer
500	T-2090 Documentation T-2091 Radiographic Technique Details T-2092 Radiograph Review Form
501	T-2021.1-1 Requirements of a Computed Tomography Examination Procedure
502	Article 21 Pulsed Eddy Current (PEC) Technique for Corrosion Screening T-2110 Scope T-2120 General T-2121 Written Procedure Requirements
503	T-2122 Scan Plan T-2123 Personnel Qualifications T-2130 Equipment T-2131 Instrument T-2132 Probes T-2150 Techniques T-2151 Reference Location T-2160 Calibration
504	T-2170 Examination T-2180 Evaluation T-2181 General T-2182 Evaluation Level T-2190 Documentation T-2192 Examination Records T-2194 Data Storage
505	T-2121.1-1 Requirements of a PEC Examination Procedure
506	Nonmandatory Appendix A Applications of Pulsed Eddy Current Examination A-2110 Scope A-2120 General A-2121 Disambiguation A-2122 Basic Principle of PEC Examination A-2121-1 Basic Decay Curve in a Log-Linear Graph
507	A-2123 Effect of Materials Between the Probe and the Object A-2121-2 Basic Decay Curve in a Log-Log Graph A-2123.1-1 Impact of Aluminum Jacketing With a Thickness of 0.04 in. (1 mm) on the Decay Curve in a Log-Linear Graph
508	A-2124 Common Sources of Noise and Their Mitigation A-2125 Common Applications A-2123.1-2 Impact of Aluminum Jacketing With a Thickness of 0.04 in. (1 mm) on the Decay Curve in a Log-Log Graph
510	A-2150 Process Used With PEC Equipment A-2151 System Checks A-2152 Determination of the Footprint Diameter
511	A-2160 Reference Measurement A-2152-1 Image of Reference Plate With Two Thicknesses A-2152.1-1 Image of Trajectory A–B on Which Measurements Are Performed to Determine the Footprint A-2152.1-2 Wall Thickness Response of the Measurement of Trajectory A–B
512	A-2170 Examination A-2171 Guidelines for the Examination Grid A-2172 Examination Preparation A-2152.1-3 Derivative of the Wall Thickness Response of the Measurement of Trajectory A–B A-2152.2-1 Wall Thickness Response of the Measurement of Trajectory A–B With a Plotted Line
513	Nonmandatory Appendix B Training Outline for Pulsed Eddy Current Examination B-2110 Scope B-2120 Training Outline for Level II Personnel
515	Subsection B Documents Adopted by Section V
516	Article 22 Radiographic Standards
517	SE-94/SE-94M
531	SE-747
545	SE-999
553	SE-1025
561	SE-1030/SE-1030M
573	SE-1114
581	SE-1165
599	SE-1255
609	SE-1416
617	SE-1475
625	SE-1647
631	SE-2597/SE-2597M
632	Article 23 Ultrasonic Standards
633	SA-388/SA-388M
643	SA-435/SA-435M
647	SA-577/SA-577M
651	SA-578/SA-578M
657	SA-609/SA-609M
667	SA-745/SA-745M
673	SB-548
679	SD-7091
687	SE-213
699	SE-273
705	SE-317
719	SE-797/SE-797M
729	SE-2491
747	SE-2700
757	Article 24 Liquid Penetrant Standards
759	SD-129
765	SD-516
771	SD-808
777	SE-165/SE-165M
797	SE-2297
803	SE-3022
812	Article 25 Magnetic Particle Standards
813	SD-1186
815	SE-709
863	Article 26 Eddy Current Standard
865	SE-243
871	Article 29 Acoustic Emission Standards
873	SE-650/SE-650M
877	SE-750
889	SE-976
897	SE-1067/SE-1067M
913	SE-1118/SE-1118M
927	SE-1139/SE-1139M
935	SE-1211/SE-1211M
941	SE-1419/SE-1419M
943	SE-2075/SE-2075M
948	Article 31 Alternating Current Field Measurement Standard
949	SE-2261/SE-2261M
964	Article 32 Remote Field Testing Standard
965	SE-2096/SE-2096M
975	Article 33 Guided Wave Standards
977	SE-2775
989	SE-2929
1000	II-1 Standard Units for Use in Equations Mandatory Appendix Mandatory Appendix II Standard Units for Use in Equations
1001	Nonmandatory Appendix Nonmandatory Appendix A Guidance for the Use of U.S. Customary and SI Units in the ASME Boiler and Pressure Vessel Code A-1 Use of Units in Equations A-2 Guidelines Used to Develop SI Equivalents
1003	A-3 Soft Conversion Factors
1005	Endnotes

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ASME	2023


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Standard Title	ASME BPVC.V-2023 Section V, Nondestructive Examination
Published Code	ASME
Publication Date	2023

ASME BPVC.V-2023 Section V, Nondestructive Examination

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