ASTM-D3380 2003
$44.96
D3380-90(2003) Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates
| Published By | Publication Date | Number of Pages |
| ASTM | 2003 | 12 |
1.1 This test method permits the rapid measurement of apparent relative permittivity and loss tangent (dissipation factor) of metal-clad polymer-based circuit substrates in the X-band (8 to 12.4 GHz).
1.2 This test method is suitable for testing PTFE (polytetrafluorethylene) impregnated glass cloth or random-oriented fiber mats, glass fiber-reinforced polystyrene, polyphenyleneoxide, irradiated polyethylene, and similar materials having a nominal specimen thickness of 1.6 mm. The materials are applicable to service at nominal frequency of 9.6 GHz.
Note 1See for additional information about range of permittivity, thickness other than 1.6 mm, and tests at frequencies other than 9.6 GHz.
1.3 The values stated in inch-pound units are to be regarded as the standard.
This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | Scope Referenced Documents Terminology |
| 2 | Summary of Test Method Significance and Use Apparatus FIG. 1 FIG. 2 FIG. 3 |
| 3 | FIG. 4 FIG. 5 FIG. 6 FIG. 7 |
| 4 | FIG. 8 FIG. 9 FIG. 10 FIG. 11 FIG. 12 FIG. 13 |
| 5 | FIG. 14 FIG. 15 FIG. 16 |
| 6 | FIG. 17 FIG. 18 |
| 7 | Test Specimens Preparation of Resonator Pattern Cards |
| 8 | Temperature Control Procedure TABLE 1 |
| 9 | Calculation |
| 10 | Report Precision and Bias |
| 11 | Keywords A1. PRECISE CALCULATIONS OF L TAKING INTO ACCOUNT THICKNESS EFFECTS UPON L A1.1 Determination of the Effect of Specimen Thickness upon L X1. ADDITIONAL INFORMATION X1.1 Permittivity or ‘ X1.2 Loss Tangent, D, Dissipation Factor |
| 12 | X1.3 Measurements at Other Frequencies X1.4 Other Metal-Clad Dielectrics X1.5 Anisotropic Materials X1.6 Soft Substrates Having High Permittivity |
