ASTM-E1161:2009 Edition

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E1161-09 Standard Practice for Radiologic Examination of Semiconductors and Electronic Components

Published By	Publication Date	Number of Pages
ASTM	2009	10

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Categories: 31.080.01 - Semiconductor devices in general, ASTM

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Description

ASTM E1161-09

Historical Standard: Standard Practice for Radiologic Examination of Semiconductors and Electronic Components

ASTM E1161

Scope

1.1 This practice provides the minimum requirements for nondestructive radiologic examination of semiconductor devices, microelectronic devices, electromagnetic devices, electronic and electrical devices, and the materials used for construction of these items.

1.2 This practice covers the radiologic examination of these items to detect possible defective conditions within the sealed case, especially those resulting from sealing the lid to the case, and internal defects such as extraneous material (foreign objects), improper interconnecting wires, voids in the die attach material or in the glass (when sealing glass is used) or physical damage.

1.3 The values stated in inch-pound units are to be regarded as standard. No other units of measurement are included in this practice.

1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Keywords

capacitor; diode; electronic device; hybrid; inductor; microcircuits; microcircuit array; monolithic; multichip; nondestructive testing; radiographic; radiologic; radiology; radioscopy; rectifier; relay; resistor; semiconductor; switches; transformer; transistor; tunnel diode; voltage regulator; x-ray; Defects–semiconductors; Electrical conductors (semiconductors); Electronic materials/applications; Radiographic examination; Sealing glass defects; Voids; X-irradiation

ICS Code

ICS Number Code 31.080.01 (Semi-conductor devices in general)

DOI: 10.1520/E1161-09

PDF Catalog

PDF Pages	PDF Title
1	Scope Referenced Documents
2	Terminology Significance and Use Qualification
3	Equipment
4	Materials Precautions
5	Procedure Requirements
6	FIG. 1 FIG. 2 FIG. 3
7	FIG. 4 FIG. 5 FIG. 6 FIG. 7
9	Report Records Keywords

Additional information

Standard Title	E1161-09 Standard Practice for Radiologic Examination of Semiconductors and Electronic Components
Published Code	ASTM
Publication Date	2009
Pages Count	10
ICS Codes	31.080.01 - Semiconductor devices in general