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ASTM-E1829:2014 Edition

ASTM-E1829:2014 Edition

$40.63

E1829-14 Standard Guide for Handling Specimens Prior to Surface Analysis

Published By Publication Date Number of Pages
ASTM 2014 5
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ASTM E1829-14

Historical Standard: Standard Guide for Handling Specimens Prior to Surface Analysis

ASTM E1829

Scope

1.1 This guide covers specimen handling and preparation prior to surface analysis and applies to the following surface analysis disciplines:

1.1.1 Auger electron spectroscopy (AES),

1.1.2 X-ray photoelectron spectroscopy (XPS or ESCA), and

1.1.3 Secondary ion mass spectrometry (SIMS).

1.1.4 Although primarily written for AES, XPS, and SIMS, these methods may also apply to many surface-sensitive analysis methods, such as ion scattering spectrometry, low-energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface-sensitive measurements.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Keywords

Auger electron spectroscopy; secondary ion mass spectrometry; specimen handling; surface analysis; X-ray photoelectron spectroscopy

ICS Code

ICS Number Code 71.040.50 (Physicochemical methods of analysis)

DOI: 10.1520/E1829-14

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