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ASTM-F1893:2003 Edition

ASTM-F1893:2003 Edition

$40.63

F1893-98(2003) Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices

Published By Publication Date Number of Pages
ASTM 2003 5
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1.1 This guide defines the detailed requirements for testing microcircuits for short pulse high dose-rate ionization-induced failure. Large flash x-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are required because of the high dose-rate levels that are necessary to cause burnout. Two modes of test are possible (1) survival test, and (2) A failure level test.

1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.

PDF Catalog

PDF Pages PDF Title
1 Scope
Referenced Documents
Terminology
Summary of Guide
2 Significance and Use
Interferences
Apparatus
4 Preparation of Apparatus
Procedure
5 Report
Keywords

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