ASTM-F24 2004
$35.75
F24-04 Standard Method for Measuring and Counting Particulate Contamination on Surfaces
Published By | Publication Date | Number of Pages |
ASTM | 2004 | 4 |
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ASTM F24-04
Historical Standard: Standard Method for Measuring and Counting Particulate Contamination on Surfaces
ASTM F24
Scope
1.1 This method covers the size distribution analysis of particulate contamination, 5 m or greater in size, either on, or washed from, the surface of small electron-device components. A maximum variation of two to one (33 % of the average of two runs) should be expected for replicate counts on the same sample.
Note 1–For satisfactory results on clean parts, it is recommended that all procedures involved in sample preparation be conducted under a dust shield.
Keywords
optical particle counting; particulate contamination; size distribution analysis; surfaces
ICS Code
ICS Number Code 17.040.20 (Properties of surfaces)
DOI: 10.1520/F0024-04
Standard Title | F24-04 Standard Method for Measuring and Counting Particulate Contamination on Surfaces |
---|---|
Published Code | ASTM |
Publication Date | 2004 |
Pages Count | 4 |
ICS Codes | 17.040.20 - Properties of surfaces |
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