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ASTM-F388 1984

$40.63

F388-84 Method for Measurement of Oxide Thickness on Silicon Wafers and Metallization Thickness by Multiple-Beam Interference (Tolansky Method) (Withdrawn 1993)

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ASTM 1984
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ASTM F388-84

Withdrawn Standard: Method for Measurement of Oxide Thickness on Silicon Wafers and Metallization Thickness by Multiple-Beam Interference (Tolansky Method) (Withdrawn 1993)

ASTM F388

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Keywords

ICS Code

ICS Number Code 29.045 (Semiconducting materials)

DOI:

ASTM-F388 1984
$40.63