ASTM-F632 1990
$40.63
F632-90 Test Method for Measuring Small-Signal Comon Emitter Current Gain of Transistors at High Frequencies (Withdrawn 1995)
Published By | Publication Date | Number of Pages |
ASTM | 1990 |
ASTM F632-90
Withdrawn Standard: Test Method for Measuring Small-Signal Comon Emitter Current Gain of Transistors at High Frequencies (Withdrawn 1995)
ASTM F632
Scope
Keywords
ICS Code
ICS Number Code 31.080.30 (Transistors)
DOI: