ASTM-F744M 2010

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F744M-10 Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]

Published By	Publication Date	Number of Pages
ASTM	2010	7

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Description

ASTM F744M-10

Historical Standard: Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]

ASTM F744M

Scope

1.1 This test method covers the measurement of the threshold level of radiation dose rate that causes upset in digital integrated circuits under static operating conditions. The radiation source is either a flash X-ray machine (FXR) or an electron linear accelerator (LINAC).

1.2 The precision of the measurement depends on the homogeneity of the radiation field and on the precision of the radiation dosimetry and the recording instrumentation.

1.3 The test may be destructive either for further tests or for purposes other than this test if the integrated circuit being tested absorbs a total radiation dose exceeding some predetermined level. Because this level depends both on the kind of integrated circuit and on the application, a specific value must be agreed upon by the parties to the test (6.8).

1.4 Setup, calibration, and test circuit evaluation procedures are included in this test method.

1.5 Procedures for lot qualification and sampling are not included in this test method.

1.6 Because of the variability of the response of different device types, the initial dose rate for any specific test is not given in this test method but must be agreed upon by the parties to the test.

1.7 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.8 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Keywords

DIC; digital integrated circuits; dose rate; ionizing radiation; radiation dose rate; threshold for upset; upset; Circuitry; Current measurement–semiconductors; Destructive testing–semiconductors; Dose rate threshold; Dosimetry; Electrical conductors (semiconductors); Electron linear accelerator; Flash X-ray machines (FXR); Irradiance/irradiation–semiconductors; Lasers and laser applications; Linear threshold voltage; Radiation exposure–electronic components/devices; Upset threshold; Voltage

ICS Code

ICS Number Code 31.200 (Integrated circuits. Microelectronics)

DOI: 10.1520/F0744M-10

PDF Catalog

PDF Pages	PDF Title
1	Scope Referenced Documents Terminology
2	Summary of Test Method Significance and Use Interferences
3	Apparatus FIG. 1
4	FIG. 2
5	Sampling Preparation of Apparatus Procedure
6	Report Precision and Bias Keywords

Additional information

Standard Title	F744M-10 Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]
Published Code	ASTM
Publication Date	2010
Pages Count	7