BS CECC 90112:1987
$102.76
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits
| Published By | Publication Date | Number of Pages |
| BSI | 1987 | 20 |
| Status | Confirmed |
|---|---|
| Pages | 20 |
| Publication Date | 1987-08-15 |
| ISBN | 0 580 35840 2 |
| Standard Number | BS CECC 90112:1987 |
| Title | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits |
| Identical National Standard Of | CECC 90112:1986 |
| Descriptors | Circuits, Integrated circuits, Digital circuits, Quality assurance systems, Electronic equipment and components, Computer storage devices, Inspection, Statistical quality control, Approval testing, Assessed quality, Electronic storage, Digital integrated circuits, Semiconductor storage, Integrated memory circuits, Specification (approval), Semiconductor devices, Qualification approval, Quality control, Silicon, Detail specification, Metal oxide semiconductors, Direct-access storage, Testing conditions, Monolithic integrated circuits |
| Publisher | BSI |
| Committee | EPL/47 |
| ICS Codes | 31.200 - Integrated circuits. Microelectronics |
