BS EN 55017:2011
$215.11
Methods of measurement of the suppression characteristics of passive EMC filtering devices
| Published By | Publication Date | Number of Pages |
| BSI | 2011 | 72 |
CISPR 17:2011 specifies methods to measure the radio interference suppression characteristics of passive EMC filtering devices used in power and signal lines, and in other circuits. The defined methods may also be applied to combinations of over-voltage protection devices and EMC filtering devices. The measurement method covers the frequency range from 9 kHz to several GHz depending on the device and test circuit. The standard describes procedures for laboratory tests (type tests) as well as factory tests. The suppression characteristics of EMC filters and components used for the suppression of EM disturbances, are a function of numerous variables such as impedance of the circuits to which they connect, operating voltage and current, and ambient temperature. This standard specifies uniform test methods that will enable comparison of filtering and suppression characteristics determined by test laboratories or specified by manufacturers. Measurement procedures are provided for unbiased and bias conditions. Measurements under bias conditions are performed to determine potential non-linear behaviour of the EMC filtering devices such as saturation effects in inductors with magnetic cores. This testing serves to show the usability in a specific application (such as frequency converters that produce high amplitudes of common mode pulse current and thus may drive inductors into saturation). Measurement under bias conditions may be omitted if the non-linear behaviour can be determined by other methods (e.g. separate saturation measurement of the inductors used). The first edition of CISPR 17 (1981) prescribed the measurement methods of insertion loss mainly for power-line filters. Today, however, many types of sophisticated EMC filters and suppression components can be found in various electronic devices. Those filters need to be characterized using standardized measurement methods. New methods for measurement of impedance and S-parameters for such EMI devices are included in this second edition.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 6 | English CONTENTS |
| 10 | FOREWORD |
| 12 | INTRODUCTION |
| 13 | 1 Scope 2 Normative references 3 Terms, definitions and abbreviations 3.1 Terms and definitions |
| 16 | 3.2 Abbreviations 4 Classification of EMC filtering devices |
| 17 | Tables Table 1 – Examples of EMC filtering devices |
| 18 | 4.1 Insertion loss 4.2 Impedance |
| 19 | 4.3 S-parameters Figures Figure 1 – Measurement arrangement for S-parameters of a two-terminal device Figure 2 – Measurement arrangement for S-parameters of a three-terminal device |
| 20 | Figure 3 – Measurement arrangement for four-port S-parameters |
| 21 | 5 Insertion loss measurement 5.1 General |
| 22 | 5.2 Measurement set-up Figure 4 – Test circuit for insertion loss measurement (example: 4-line-filter) |
| 23 | Figure 5 – Test circuit for asymmetrical insertion loss measurement (example: 4linefilter) |
| 24 | Figure 6 – Test circuit for symmetrical insertion loss measurement (example: 4-line-filter) |
| 25 | 5.3 Measurement methods (procedure) Figure 7 – Test circuit for unsymmetrical insertion loss measurement (example: 4line filter) |
| 26 | Figure 8 – Test circuit for insertion loss measurement without bias Figure 9 – Test circuit for insertion loss measurement with bias |
| 27 | 5.4 Calibration and verification Figure 10 – Test circuit for verification of measurement circuit without bias |
| 28 | Table 2 – Conditions and target values for validation of test set-up without bias |
| 29 | Figure 11 – Test circuit for verification of measurement circuit with bias Table 3 – Conditions and target values for validation of test set-up with bias |
| 30 | 5.5 Uncertainty 6 Impedance measurement 6.1 General 6.2 Direct method |
| 31 | 6.3 Indirect method |
| 32 | Figure 12 – One-port measurement of a two-terminal device Figure 13 – S-parameter measurements for evaluating the impedance of a device in a series connection Figure 14 – S-parameter measurements for evaluating the impedance of a device in a shunt connection |
| 34 | 7 S-parameter measurement 7.1 Measurement set-up and procedure Figure 15 – Two-port S-parameter measurement set-up |
| 35 | Figure 16 – An alternative measurement system specifically for the insertion loss of a DUT (using a combination of tracking generator and measuring receiver) |
| 36 | Figure 17 – Symbolic expressions Figure 18 – Test fixture for a two-terminal device (series connection) |
| 37 | Figure 19 – Test fixture for a two-terminal device (shunt connection) Figure 20 – Test fixture for a three-terminal filter |
| 38 | Figure 21 – Test fixture for a two-terminal device with leads |
| 39 | Figure 22 – Test fixture for a three-terminal filter with leads Figure 23 – Test fixture for a core device |
| 40 | 7.2 Calibration of test set-up 7.3 Measurement uncertainties 8 Presentation of results 8.1 General Figure 24 – Example of the standards for TRL calibration |
| 41 | 8.2 Insertion loss 8.3 Impedance 8.4 S-parameters |
| 42 | Annex A (normative) Uncertainty estimation for the measurement of the suppression characteristics of EMC filtering devices |
| 44 | Table A.1 – Measurement uncertainty of insertion loss (example) |
| 45 | Table A.2 – Measurement uncertainty of impedance (example) Table A.3 – Measurement uncertainties of |S21| and |S12| (example) Table A.4 – Measurement uncertainties of |S11| and |S22| (example) |
| 47 | Annex B (informative) Examples of test boxes for insertion loss measurement Figure B.1 – Design of typical test box for general-purpose filters |
| 48 | Figure B.2 – 3D view of typical test box for general purpose filters |
| 49 | Figure B.3 – Design of typical test box for feedthrough components Figure B.4 – 3D view of typical test box for feedthrough components |
| 51 | Annex C (informative) Insertion loss test methods with non-50 Ω systems Figure C.1 – Test circuit |
| 53 | Annex D (informative) Realization of the buffer-network for insertion loss measurement Figure D.1 – Example of connecting buffer-networks for test with bias |
| 54 | Table D.1 – Specifications of the elements of buffer-networks |
| 55 | Annex E (informative) Insertion loss measurement – General discussion Figure E.1 – Test circuit for insertion loss measurement, reference measurement (filter replaced by a short circuit) |
| 56 | Figure E.2 – Test circuit for insertion loss measurement, measurement of filter under test |
| 58 | Annex F (informative) Set-up for impedance measurement Figure F.1 – Measurement set-up for a leaded device (DUT) |
| 59 | Figure F.2 – Four-terminal test fixture for a leaded device (DUT) Figure F.3 – Measurement set-up for an SMD |
| 60 | Figure F.4 – Clamp-type test fixture Figure F.5 – Coaxial test fixture for an SMD |
| 61 | Figure F.6 – Press-type test fixture for an SMD Figure F.7 – Connection for CMCC measurement |
| 62 | Figure F.8 – Test fixture and measurement set-up for an SMD common-mode choke coil |
| 63 | Annex G (informative) S-parameter measurement of common-mode choke coils Figure G.1 – Common-mode choke coil Figure G.2 – Set-up for measurements of common-mode characteristics |
| 64 | Figure G.3 – Test fixture for an SMD Figure G.4 – Test fixture for a leaded device |
| 65 | Figure G.5 – Set-up for measurements of differential-mode characteristics Figure G.6 – Test fixture for an SMD Figure G.7 – Test fixture for a leaded device |
| 66 | Figure G.8 – Set-up for measurement of four-port S-parameters Figure G.9 – Test fixture for the four-port S-parameters of an SMD |
| 67 | Figure G.10 – Test fixture for the four-port S-parameters of a leaded device |
| 68 | Annex H (informative) Measurement set-up for S-parameters of a DUT without wire leads Figure H.1 – S-parameters measurement of a DUT without leads |
| 69 | Figure H.2 – Procedure for TRL calibration |
| 70 | Bibliography |
