BS EN 60384-8:2015:2018 Edition
$189.07
Fixed capacitors for use in electronic equipment – Sectional specification: Fixed capacitors of ceramic dielectric, Class 1
| Published By | Publication Date | Number of Pages |
| BSI | 2018 | 50 |
This part of IEC 60384 is applicable to fixed capacitors of ceramic dielectric with a defined temperature coefficient (dielectric Class 1), intended for use in electronic equipment, including leadless capacitors but excluding fixed surface mount multilayer capacitors of ceramic dielectric, which are covered by IEC 60384-21 (Class 1).
Capacitors for electromagnetic interference suppression are not included, but are covered by IEC 60384-14.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | undefined |
| 7 | English CONTENTS |
| 11 | FOREWORD |
| 13 | 1 General 1.1 Scope 1.2 Object 1.3 Normative references 1.4 Information to be given in a detail specification 1.4.1 General |
| 14 | 1.4.2 Outline drawing and dimensions 1.4.3 Mounting 1.4.4 Ratings and characteristics |
| 15 | 1.4.5 Marking 1.5 Terms and definitions 1.6 Marking 1.6.1 General |
| 16 | 1.6.2 Marking for code of temperature coefficient 1.6.3 Marking on the body 1.6.4 Marking of the packaging 1.6.5 Additional marking 2 Preferred ratings and characteristics 2.1 Preferred characteristics 2.2 Preferred values of ratings 2.2.1 Rated temperature |
| 17 | 2.2.2 Rated voltage (UR) 2.2.3 Category voltage (UC) 2.2.4 Preferred values of nominal capacitance and associated tolerance values 2.2.5 Temperature coefficient (α) Tables Table 1 – Preferred tolerances on nominal capacitance |
| 18 | Table 2 – Nominal temperature coefficient and tolerances |
| 19 | Table 3 – Combination of temperature coefficient and tolerance |
| 21 | 3 Quality assessment procedures 3.1 Primary stage of manufacture 3.2 Structurally similar components 3.3 Certified test records of released lots 3.4 Qualification approval 3.4.1 General 3.4.2 Qualification approval on the basis of the fixed sample size procedure |
| 22 | 3.4.3 Tests |
| 23 | Table 4 – Sampling plan together with numbers of permissible non-conforming items for qualification approval tests, assessment level EZ |
| 24 | Table 5 – Test schedule for qualification approval (1 of 4) |
| 27 | 3.5 Quality conformance inspection 3.5.1 Formation of inspection lots |
| 28 | 3.5.2 Test schedule 3.5.3 Delayed delivery 3.5.4 Assessment levels Table 6 – Lot-by-lot inspection |
| 29 | 4 Test and measurement procedures 4.1 General 4.2 Visual examination and check of dimensions 4.3 Electrical tests 4.3.1 Capacitance Table 7 – Periodic tests |
| 30 | 4.3.2 Tangent of loss angle (tan δ) 4.3.3 Insulation resistance (Ri) Table 8 – Tangent of loss angle |
| 31 | 4.3.4 Voltage proof Table 9 – Insulation resistance requirements Table 10 – Test voltages for single layer ceramic capacitors Table 11 – Test voltages for leaded multilayer ceramic capacitors |
| 32 | 4.4 Temperature coefficient (α) and temperature cyclic drift of capacitance 4.4.1 General 4.4.2 Preliminary drying 4.4.3 Measuring conditions 4.4.4 Requirements 4.5 Robustness of terminations 4.6 Resistance to soldering heat 4.6.1 General 4.6.2 Initial measurement 4.6.3 Test conditions 4.6.4 Final inspection, measurements and requirements Table 12 – Temperature cyclic drift limits |
| 33 | 4.7 Solderability 4.7.1 General 4.7.2 Test conditions 4.7.3 Final inspection, measurements and requirements 4.8 Rapid change of temperature (if required) 4.8.1 General 4.8.2 Initial measurement 4.8.3 Test conditions 4.8.4 Recovery 4.9 Vibration 4.9.1 General Table 13 – Requirements |
| 34 | 4.9.2 Test conditions 4.9.3 Final inspection, measurements and requirements 4.10 Bump (repetitive shock) 4.10.1 General 4.10.2 Initial measurements 4.10.3 Test conditions 4.10.4 Final inspection, measurements and requirements 4.11 Shock (non-repetitive shock) 4.11.1 General |
| 35 | 4.11.2 Initial measurements 4.11.3 Test conditions 4.11.4 Final inspection, measurements and requirements 4.12 Climatic sequence 4.12.1 General 4.12.2 Initial measurements 4.12.3 Dry heat Table 14 – Preferred severities (of non-repetitive shock) Table 15 – Maximum capacitance change |
| 36 | 4.12.4 Damp heat, cyclic, Test Db, first cycle 4.12.5 Cold 4.12.6 Low air pressure 4.12.7 Damp heat, cyclic, Test Db, remaining cycles Table 16 – Number of damp heat cycles |
| 37 | 4.13 Damp heat, steady state 4.13.1 General 4.13.2 Initial measurement 4.13.3 Test conditions Table 17 – Final inspection, measurements and requirements Table 18 – Test conditions for damp heat, steady state |
| 38 | 4.13.4 Recovery 4.13.5 Final inspection, measurements and requirements 4.14 Endurance 4.14.1 General 4.14.2 Initial measurement 4.14.3 Test conditions Table 19 – Final inspection, measurements and requirements |
| 39 | 4.14.4 Recovery 4.14.5 Final inspection, measurements and requirements 4.15 Component solvent resistance (if required) 4.16 Solvent resistance of the marking (if required) Table 20 – Endurance test conditions Table 21 – Final inspection, measurements and requirements |
| 40 | Annex A (normative) Figures with limits of variation of capacitance with temperature for certain temperature coefficients and classes Figures Figure A.1 – α: +100 (10–6/K) |
| 41 | Figure A.2 – α: 0 –10–6/K) Figure A.3 – α: –33 (10–6/K) |
| 42 | Figure A.4 – α: –75 (10–6/K) Figure A.5 – α: –150 (10–6/K) |
| 43 | Figure A.6 – α: –220 (10–6/K) Figure A.7 – α: –330 (10–6/K) |
| 44 | Figure A.8 – α: –470 (10–6/K) Figure A.9 – α: –750 (10–6/K) |
| 45 | Figure A.10 – α: –1 000 (10–6/K) Figure A.11 – α: –1 500 (10–6/K) |
| 46 | Figure A.12 – α: –2 200 (10–6/K) Figure A.13 – α: –3 300 (10–6/K) |
| 47 | Figure A.14 – α: –4 700 (10–6/K) Figure A.15 – α: –5 600 (10–6/K) |
| 48 | Bibliography |
