BS EN 60384-9:2015 – TC:2020 Edition
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Tracked Changes. Fixed capacitors for use in electronic equipment – Sectional specification: Fixed capacitors of ceramic dielectric, Class 2
Published By | Publication Date | Number of Pages |
BSI | 2020 | 90 |
IEC 60384-9:2015 is applicable to fixed capacitors of ceramic dielectric with a defined temperature coefficient (dielectric Class 2), intended for use in electronic equipment, including leadless capacitors but excluding fixed surface mount multilayer capacitors of ceramic dielectric. This fourth edition cancels and replaces the third edition published in 2005. This fourth edition is a result of maintenance activities related to the previous edition. All changes that have been agreed upon can be categorized as minor revisions.
PDF Catalog
PDF Pages | PDF Title |
---|---|
54 | English CONTENTS |
57 | FOREWORD |
59 | 1 General 1.1 Scope 1.2 Object 1.3 Normative references 1.4 Information to be given in a detail specification 1.4.1 General |
60 | 1.4.2 Outline drawing and dimensions 1.4.3 Mounting 1.4.4 Ratings and characteristics |
61 | 1.4.5 Marking 1.5 Terms and definitions 1.6 Marking 1.6.1 General |
62 | 1.6.2 Marking on the body 1.6.3 Marking of the packaging 1.6.4 Additional marking 2 Preferred ratings and characteristics 2.1 Preferred characteristics 2.2 Preferred values of ratings 2.2.1 Rated temperature 2.2.2 Rated voltage (UR) |
63 | 2.2.3 Category voltage (UC) 2.2.4 Preferred values of nominal capacitance and associated tolerance values 2.2.5 Temperature characteristic of capacitance Tables Table 1 – Preferred tolerance on nominal capacitance Table 2 – Preferred values of temperature characteristics |
64 | 3 Quality assessment procedures 3.1 Primary stage of manufacture 3.2 Structurally similar components 3.3 Certified test records of released lots 3.4 Qualification approval 3.4.1 General 3.4.2 Qualification approval on the basis of the fixed sample size procedure |
65 | 3.4.3 Tests |
66 | Table 3 – Sampling plan together with numbers of permissible non-conforming items for qualification approval tests, assessment level EZ |
67 | Table 4 – Test schedule for qualification approval (1 of 4) |
70 | 3.5 Quality conformance inspection 3.5.1 Formation of inspection lots |
71 | 3.5.2 Test schedule 3.5.3 Delayed delivery 3.5.4 Assessment levels Table 5 – Lot-by-lot inspection |
72 | 4 Test and measurement procedures 4.1 General 4.2 Special preconditioning 4.3 Visual examination and check of dimensions 4.4 Electrical tests 4.4.1 Capacitance Table 6 – Periodic tests |
73 | 4.4.2 Tangent of loss angle (tan δ) 4.4.3 Insulation resistance (Ri) Table 7 – Measuring conditions |
74 | 4.4.4 Voltage proof Table 8 – Insulation resistance requirements Table 9 – Test voltages |
75 | 4.5 Temperature characteristic of capacitance 4.5.1 Special preconditioning 4.5.2 Measuring conditions 4.5.3 Requirements 4.6 Robustness of terminations 4.7 Resistance to soldering heat 4.7.1 General Table 10 – Details of measuring conditions |
76 | 4.7.2 Special preconditioning 4.7.3 Initial measurement 4.7.4 Recovery 4.7.5 Final inspection, measurements and requirements 4.8 Solderability 4.8.1 General 4.8.2 Test conditions 4.8.3 Final inspection, measurements and requirements 4.9 Rapid change of temperature (if required) 4.9.1 General 4.9.2 Special preconditioning Table 11 – Maximum capacitance change |
77 | 4.9.3 Initial measurement 4.9.4 Test conditions 4.9.5 Recovery 4.10 Vibration 4.10.1 General 4.10.2 Test conditions 4.10.3 Final inspection, measurements and requirements 4.11 Bump (repetitive shock) 4.11.1 General 4.11.2 Initial measurements 4.11.3 Test conditions |
78 | 4.11.4 Final inspection, measurements and requirements 4.12 Shock (non-repetitive shock) 4.12.1 General 4.12.2 Initial measurements 4.12.3 Test conditions 4.12.4 Final inspection, measurements and requirements Table 12 – Preferred severities (of non-repetitive shock) |
79 | 4.13 Climatic sequence 4.13.1 General 4.13.2 Special preconditioning 4.13.3 Initial measurements 4.13.4 Dry heat 4.13.5 Damp heat, cyclic, Test Db, first cycle 4.13.6 Cold 4.13.7 Low air pressure Table 13 – Maximum capacitance change |
80 | 4.13.8 Damp heat, cyclic, Test Db, remaining cycles 4.14 Damp heat, steady state 4.14.1 General 4.14.2 Special preconditioning Table 14 – Number of damp heat cycles Table 15 – Final inspection measurements and requirements |
81 | 4.14.3 Initial measurement 4.14.4 Test conditions 4.14.5 Recovery 4.14.6 Final inspection, measurements and requirements Table 16 – Test conditions for damp heat, steady state Table 17 – Final inspection, measurements and requirements |
82 | 4.15 Endurance 4.15.1 General 4.15.2 Special preconditioning 4.15.3 Initial measurement 4.15.4 Test conditions 4.15.5 Recovery 4.15.6 Final inspection, measurements and requirements Table 18 – Endurance test conditions Table 19 – Final inspection, measurements and requirements |
83 | 4.16 Component solvent resistance (if applicable) 4.17 Solvent resistance of the marking (if applicable) |
84 | Annex A (informative) Capacitance ageing of fixed capacitors of ceramic dielectric, Class 2 A.1 General A.2 Law of capacitance ageing |
85 | A.3 Capacitance measurements and capacitance tolerance (see 4.4.1) A.4 Special preconditioning (see 4.2) |
87 | Bibliography |