BS EN 60444-3:1997:1993 Edition
$102.76
Measurement of quartz crystal unit parameters – Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a π-network with compensation of the parallel capacitance C0
| Published By | Publication Date | Number of Pages |
| BSI | 1993 | 20 |
| Status | Definitive |
|---|---|
| Pages | 20 |
| Publication Date | 1993-09-15 |
| ISBN | 0 580 22498 8 |
| Standard Number | BS EN 60444-3:1997, IEC 60444-3:1986 |
| Title | Measurement of quartz crystal unit parameters – Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a π-network with compensation of the parallel capacitance C0 |
| Identical National Standard Of | IEC 60444-3:1986, EN 60444-3:1997 |
| Descriptors | Phase measurement (electric), Wave properties and phenomena, Test equipment, Accuracy, Calibration, Frequencies, Circuit networks, Electrical measurement, Resonators, Formulae (mathematics), Electrical wave measurement, Resonance, Resonant frequency, Quartz, Capacitance, Crystal resonators, Inductance, Dielectric devices, Circuits, Piezoelectric devices |
| Publisher | BSI |
| Committee | W/- |
| ICS Codes | 31.140 - Piezoelectric devices |
