BS EN 60749-10:2002

$86.31

Semiconductor devices. Mechanical and climatic test methods – Mechanical shock

Published By	Publication Date	Number of Pages
BSI	2002	8

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Categories: 31.080.01 - Semiconductor devices in general, BSI

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Description

Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages. The contents of the corrigendum of August 2003 have been included in this copy.

Additional information

Pages	8
Descriptors	Integrated circuits, Destructive testing, Electronic equipment and components, Mechanical shock, Environmental testing, Climate, Mechanical testing, Impact testing, Semiconductor devices
Identical National Standard Of	EN 60749-10 (IEC 60749-10:2002) AS, IEC 60749-10:2002
Standard Number	BS EN 60749-10:2002
ISBN	0 580 40292 4
Replaced By	BS EN IEC 60749-10:2022
Withdrawn Date	2023-01-18
Publication Date	2002-09-17
Committee	EPL/47
Publisher	BSI
Corrects	BS EN 60749-10:2002
Title	Semiconductor devices. Mechanical and climatic test methods – Mechanical shock
Partially Replaces	BS EN 60749:1999
Status	Withdrawn
ICS Codes	31.080.01 - Semiconductor devices in general

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BS EN 60749-10:2002

$86.31


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