BS EN 60749-11:2002:2003 Edition

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Semiconductor devices. Mechanical and climatic test methods – Rapid change of temperature. Two-fluid-bath method

Published By	Publication Date	Number of Pages
BSI	2003	12

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Categories: 31.080.01 - Semiconductor devices in general, BSI

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Description

Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification. The contents of the corrigenda of January 2003 and August 2003 have been included in this copy.

Additional information

Status	Definitive
Partially Replaces	BS EN 60749:1999
Title	Semiconductor devices. Mechanical and climatic test methods – Rapid change of temperature. Two-fluid-bath method
Corrects	BS EN 60749-11:2002
Publisher	BSI
Committee	EPL/47
Pages	12
Publication Date	2003-10-24
ISBN	0 580 40395 5
Standard Number	BS EN 60749-11:2002
Identical National Standard Of	IEC 60749-11:2002, EN 60749-11 (IEC 60749-11:2002) AS
Descriptors	Environmental testing, Integrated circuits, Mechanical testing, Temperature measurement, Electronic equipment and components, Destructive testing, Temperature, Semiconductor devices, Climate, Thermal testing
ICS Codes	31.080.01 - Semiconductor devices in general

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BS EN 60749-11:2002

$86.31


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