BS EN 60749-13:2002
$86.31
Semiconductor devices. Mechanical and climatic test methods – Salt atmosphere
| Published By | Publication Date | Number of Pages |
| BSI | 2002 | 10 |
Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. The contents of the corrigendum of August 2003 have been included in this copy.
