BS EN 61000-3-3:2013+A1:2019 – TC
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Tracked Changes. Electromagnetic compatibility (EMC) – Limits. Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current <= 16 A per phase and not subject to conditional connection
| Published By | Publication Date | Number of Pages |
| BSI | 2019 | 89 |
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 3 | BS EN 61000-3-3:2013+A1:2019 Compliance with a British Standard cannot confer immunity from legal obligations. Amendments/corrigenda issued since publication |
| 4 | August 2019 Compatibilité électromagnétique (CEM) – Partie 3-3: Limites – Limitation des variations de tension, des fluctuations de tension et du papillotement dans les réseaux publics d’alimentation basse tension, pour les matériels ayant un courant assigné ≤ 16… |
| 5 | Foreword Endorsement notice |
| 6 | Endorsement notice |
| 10 | Annex ZZA (informative) Table ZZA.1 – Correspondence between this European standard and the Essential Requirements set out in Directive 2014/30/EU [2014 OJ L96] |
| 11 | Table ZZB.1 – Correspondence between this European standard and the Essential Requirements set out in Directive 2014/53/EU [2014 OJ L153] |
| 15 | INTERNATIONAL ELECTROTECHNICAL COMMISSION |
| 17 | INTRODUCTION |
| 18 | ELECTROMAGNETIC COMPATIBILITY (EMC) – 1 Scope 2 Normative references |
| 19 | 3 Terms and definitions 3.1 3.2 d(t) 3.3 3.4 3.5 3.6 |
| 20 | 3.7 3.8 3.9 3.10 3.11 F 3.12 3.13 |
| 21 | 4 Assessment of voltage changes, voltage fluctuations and flicker 4.1 Assessment of a relative voltage change, d(t) 4.2 Assessment of the short-term flicker value, Pst 4.2.1 General |
| 22 | Table 1 – Assessment method 4.2.2 Flickermeter 4.2.3 Simulation method 4.2.4 Analytical method 4.2.4.2 Description of the analytical method 4.2.4.3 Shape factor |
| 23 | 4.2.5 Use of Pst = 1 curve 4.3 Assessment of long-term flicker value, Plt 5 Limits |
| 24 | 6 Test conditions 6.1 General |
| 25 | 6.2 Measurement uncertainty 6.3 Test supply voltage 6.4 Reference impedance 6.5 Observation period |
| 26 | 6.6 General test conditions |
| 27 | Figure 1 – Reference network for single-phase and three-phase supplies derived from a three-phase, four-wire supply |
| 28 | Figure 2 – Curve for Pst = 1 for rectangular equidistant voltage changes Figure 3 – Shape factors F for double-step and ramp-voltage characteristics |
| 29 | Figure 4 – Shape factors F for rectangular and triangular voltage characteristics Figure 5 – Shape factor F for motor-start voltage characteristics having various front times |
| 30 | Annex A (normative) A.1 Test conditions for cookers A.1.1 General A.1.2 Hotplates Table A.1 – Test conditions for hotplates A.1.3 Baking ovens |
| 31 | A.1.4 Grills A.1.5 Baking oven/grill combinations A.1.6 Microwave ovens A.2 Test conditions for lighting and similar equipment A.3 Test conditions for washing machines |
| 32 | A.4 Test conditions for tumbler dryers A.5 Test conditions for refrigerators A.6 Test conditions for copying machines, laser printers and similar appliances A.7 Test conditions for vacuum cleaners A.8 Test conditions for food mixers A.9 Test conditions for portable tools |
| 33 | A.10 Test conditions for hairdryers A.11 Test conditions for television sets, audio-equipment, computers, DVDs and similar electronic equipment A.12 Test conditions for direct water heaters |
| 34 | A.14 Test conditions for air conditioners, dehumidifiers, heat pumps, and commercial refrigerating equipment A.15 Test conditions for arc welding equipment and allied processes A.15.1 General A.15.2 Evaluation of Pst A.15.2.1 General |
| 35 | Table A.2 – Electrode parameters A.15.2.2 Test procedure A A.15.2.3 Test procedure B A.15.2.4 Pst evaluation process |
| 36 | Table A.3 – Frequency factor R related to repetition rate “r” A.15.3 Test procedure for dc A.15.3.1 General A.15.3.2 Evaluation of dc |
| 37 | Annex B (normative) B.1 Overview B.2 Procedure |
| 38 | Annex C (informative) C.1 Overview C.2 Terms and definitions C.2.1 C.2.2 C.2.3 |
| 39 | C.2.4 steady state voltage change C.2.5 C.2.6 C.2.7 C.2.8 d(t) |
| 40 | C.3 Steady state voltage, and voltage change characteristics |
| 41 | C.4 Pictorial description of the directly measured parameters dc, d(t), dmax,and Tmax |
| 43 | Figure C.1 – Evaluation of Uhp(t) |
| 44 | Annex D (informative) Table D.1 – Input relative voltage fluctuation ∆V/V for Pst = 1,0 at output |
| 45 | Bibliography |
| 47 | undefined |
| 56 | CONTENTS |
| 58 | FOREWORD |
| 60 | INTRODUCTION |
| 61 | 1 Scope 2 Normative references |
| 62 | 3 Terms and definitions |
| 64 | 4 Assessment of voltage changes, voltage fluctuations and flicker 4.1 Assessment of a relative voltage change, d(t) 4.2 Assessment of the short-term flicker value, Pst 4.2.1 General |
| 65 | 4.2.2 Flickermeter 4.2.3 Simulation method 4.2.4 Analytical method Tables Table 1 – Assessment method |
| 66 | 4.2.5 Use of Pst = 1 curve 4.3 Assessment of long-term flicker value, Plt 5 Limits |
| 67 | 6 Test conditions 6.1 General |
| 68 | 6.2 Measurement uncertainty 6.3 Test supply voltage 6.4 Reference impedance 6.5 Observation period |
| 69 | 6.6 General test conditions |
| 70 | Figures Figure 1 – Reference network for single-phase and three-phase supplies derived from a three-phase, four-wire supply |
| 71 | Figure 2 – Curve for Pst = 1 for rectangular equidistant voltage changes Figure 3 – Shape factors F for double-step and ramp-voltage characteristics |
| 72 | Figure 4 – Shape factors F for rectangular and triangular voltage characteristics Figure 5 – Shape factor F for motor-start voltage characteristics having various front times |
| 73 | Annex A (normative) Application of limits and type test conditionsfor specific equipment Table A.1 – Test conditions for hotplates |
| 78 | Table A.2 – Electrode parameters |
| 79 | Table A.3 – Frequency factor R related to repetition rate “r” |
| 81 | Annex B (normative) Test conditions and procedures for measuringdmax voltage changes caused by manual switching |
| 82 | Annex C (informative) Determination of steady state voltage and voltage change characteristics, as defined in IEC 61000-4-15:2010 |
| 85 | Table C.1 – Test specification for dc – dmax – td(t) > 3,3 % (from Table 12 of IEC 61000-4-15: 2010) Table C.2 – Test specification for dc – dmax – td(t) > 3,3 % (from Table 13 of IEC 61000-4-15: 2010) |
| 86 | Figure C.1 – Evaluation of Uhp(t) |
| 87 | Annex D (informative) Input relative voltage fluctuation ∆V/V for Pst = 1,0 at output [IEC/TR 61000-3-7:2008] Table D.1 – Input relative voltage fluctuation ∆V/V for Pst = 1,0 at output |
| 88 | Bibliography |
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