BS EN 61000-4-16:2016
$142.49
Electromagnetic compatibility (EMC) – Testing and measurement techniques. Test for immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz
| Published By | Publication Date | Number of Pages |
| BSI | 2016 | 32 |
This part of IEC 61000 relates to the immunity requirements and test methods for electrical and electronic equipment to conducted, common mode disturbances in the range d.c. to 150 kHz.
The object of this standard is to establish a common and reproducible basis for testing electrical and electronic equipment with the application of common mode disturbances to power supply, control, signal and communication ports.
This standard defines
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test voltage and current waveform;
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range of test levels;
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test equipment;
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test set-up;
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test procedures.
For some types of ports, for example ports intended to be used with highly balanced lines, additional test provisions may be established by product committee specifications.
The test is intended to demonstrate the immunity of electrical and electronic equipment when subjected to conducted, common mode disturbances such as those originating from power line currents and return leakage currents in the earthing/grounding system.
The disturbances produced by 400 Hz mains systems are not included in the scope of this standard.
Actual interference due to these disturbance phenomena is relatively rare, except in industrial plants. Product committees should therefore consider whether there is a justification for applying this standard in their product/product family standards (see also Clause 4).
This test is not relevant for equipment ports intended to be connected to short cables, having a length less than 20 m or less.
The immunity to harmonics and interharmonics, including mains signalling, on a.c. power ports (in differential mode) is not included in the scope of this standard and is covered by IEC 61000‑4‑13 and IEC 61000‑4‑19 .
The immunity to conducted disturbances generated by intentional radio-frequency transmitters is not included in the scope of this standard and is covered by IEC 61000‑4‑6 .
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 5 | English CONTENTS |
| 7 | FOREWORD |
| 9 | INTRODUCTION |
| 10 | 1 Scope |
| 11 | 2 Normative references 3 Terms and definitions |
| 12 | 4 General 5 Test levels 5.1 General |
| 13 | 5.2 Test levels at mains frequency 5.3 Test levels in the frequency range 15 Hz-150 kHz Tables Table 1 – Levels for continuous disturbance Table 2 – Levels for short duration disturbance |
| 14 | 6 Test equipment 6.1 Test generators 6.1.1 General 6.1.2 Characteristics and performance of the generator for d.c. tests Table 3 – Test levels in the frequency range 15 Hz to 150 kHz |
| 15 | 6.1.3 Characteristics and performance of the generator for tests at mains frequency: 162/3 Hz, 50 Hz and 60 Hz 6.1.4 Characteristics and performance of the generator for tests in the frequency range 15 Hz to 150 kHz |
| 16 | 6.2 Verification of the characteristics of the test generators 6.3 Coupling/decoupling networks 6.3.1 General 6.3.2 Coupling networks |
| 17 | 6.3.3 Decoupling devices 7 Test set-up 7.1 General |
| 18 | 7.2 Earthing connections 7.3 Equipment under test 7.4 Test generators 7.5 Decoupling/isolation devices 8 Test procedure 8.1 General |
| 19 | 8.2 Laboratory reference conditions 8.2.1 General 8.2.2 Climatic conditions 8.2.3 Electromagnetic conditions 8.3 Execution of the test |
| 20 | 9 Evaluation of test results |
| 21 | 10 Test report |
| 22 | Figures Figure 1 – Example of equipment ports and configuration Figure 2 – Profile of the test voltage |
| 23 | Figure 3 – Example of the generator for d.c. and frequency voltage tests 15 Hz up to 150 kHz Figure 4 – Example of the generator for tests at mains frequency (16⅔ Hz, 50 Hz and 60 Hz) |
| 24 | Figure 5 – Schematic circuit of the coupling T network for communication ports and other ports intended for connection to highly balanced pairs |
| 25 | Figure 6 – Schematic circuit for type tests |
| 26 | Annex A (informative) Sources of disturbances and coupling mechanisms A.1 Sources of disturbances A.2 Coupling mechanisms |
| 28 | Annex B (informative) Selection of test levels |
| 29 | Bibliography |
