BS EN 61000-4-31:2017
$189.07
Electromagnetic compatibility (EMC) – Testing and measurement techniques. AC mains ports broadband conducted disturbance immunity test
| Published By | Publication Date | Number of Pages |
| BSI | 2017 | 50 |
IEC 61000-4-31:2016 relates to the conducted immunity of electrical and electronic equipment to electromagnetic disturbances coming from intended and/or unintended broadband signal sources in the frequency range 150 kHz up to 80 MHz. It has the status of a basic EMC publication in accordance with IEC Guide 107.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 6 | English CONTENTS |
| 9 | FOREWORD |
| 11 | INTRODUCTION |
| 12 | 1 Scope and object 2 Normative references 3 Terms and definitions |
| 14 | 4 General |
| 15 | 5 Test levels Figures Figure 1 – Immunity test to broadband conducted disturbances |
| 16 | Tables Table 1 – Test levels |
| 17 | 6 Test equipment and level setting procedures 6.1 Test generator Figure 2 – Example of voltage spectrum of a broadband test signal measured with a 120 kHz resolution bandwidth |
| 18 | 6.2 Coupling and decoupling devices 6.2.1 General Figure 3 – Principle of the test generator Table 2 – Characteristics of the test generator |
| 19 | 6.2.2 CDND for the port under test 6.2.3 Coupling/decoupling networks (CDNs) for cables that are not under test Figure 4 – Example of simplified diagram for the circuit of CDND Table 3 – Specification of the main parameters of the CDND for current ≤ 16 A |
| 20 | Figure 5 – Example of coupling and decoupling network for power ports other than AC mains Table 4 – Usage of CDNs |
| 21 | 6.3 Verification of the test systems 6.3.1 General 6.3.2 Verification procedure of test generator flatness |
| 22 | 6.3.3 Verification procedure of the insertion loss of the CDND using transformer jigs Figure 6 – Test set-up regarding test generator flatness and typical test signal Figure 7 – Typical circuit diagram of the transformer jig showing 50 Ω side and 100 Ω side of the transformer and 2 pcs 0,1 μF coupling capacitors |
| 24 | 6.3.4 Insertion loss of the injection coupling system Figure 8 – Transformer jig specifications Figure 9 – Example of the set-up geometry to verify the insertion loss of the injection coupling system |
| 25 | 6.4 Test level setting procedure 6.4.1 General 6.4.2 Setting of the output level at the EUT port of the CDND Figure 10 – Set-up for the evaluation of the total insertion loss of the injection coupling system |
| 26 | 7 Test set-up and injection methods 7.1 Test set-up 7.2 EUT comprised of a single unit Figure 11 – Set-up for level setting |
| 27 | 7.3 EUT comprised of several units Figure 12 – Example of test set-up for an EUT comprised of a single unit (top view) |
| 28 | Figure 13 – Example of a test set-up for an EUT comprised of several units (top view) |
| 29 | 7.4 CDN and CDND termination application |
| 30 | 8 Test procedure Figure 14 – Immunity test to a 2-port EUT (when only CDNDs can be used) |
| 31 | 9 Evaluation of the test results 10 Test report |
| 33 | Annex A (informative) Measurement uncertainty of the power spectral density test level A.1 General A.2 Uncertainty budgets for test methods A.2.1 General symbols A.2.2 Definition of the measurand A.2.3 MU contributors of the measurand |
| 34 | A.2.4 Input quantities and calculation examples for expanded uncertainty Figure A.1 – Example of influences upon the power spectral density test level using a CDND |
| 35 | A.3 Expression of the calculated measurement uncertainty and its application Table A.1 – CDND level setting process |
| 37 | Annex B (informative) Rationale for the selection of the preferred broadband source – Information on test signal generation B.1 General B.2 Principles of band-limited broadband signal generation B.2.1 General B.2.2 (True) random noise generation |
| 38 | B.2.3 Pseudo-random noise sequence Figure B.1 – White noise source |
| 39 | Figure B.2 – Principle of band-limited broadband signal generation with an arbitrary waveform generator |
| 40 | Figure B.3 – Signal spectrum of a band-limited pseudo-random noise signal (measured with a 120 kHz resolution bandwidth) |
| 41 | Figure B.4 – Extract of the band-limited pseudo noise signalin time domain (measured with an oscilloscope) Figure B.5 – Signal spectrum of the band-limited pseudo noise signal without an anti-alias filter |
| 42 | B.2.4 Impulse Figure B.6 – Extract of the signal spectrum of a band-limitedpseudo noise signal (measured with a 200 Hz resolution bandwidth) |
| 43 | Figure B.7 – Signal spectrum of a band-limited impulse signal (measured with a 120 kHz resolution bandwidth) Figure B.8 – Extract of the band-limited impulse signal in time domain (measured with an oscilloscope) |
| 44 | B.2.5 OFDM scheme Figure B.9 – Extract of the signal spectrum of a band-limited impulse signal (measured with a 200 Hz resolution bandwidth) |
| 45 | Figure B.10 – Signal spectrum of an OFDM signal (measured with a 120 kHz resolution bandwidth) Figure B.11 – Extract of the signal spectrum of an OFDM signal (measured with a 200 Hz resolution bandwidth) |
| 46 | B.3 Selection of the preferred broadband source Figure B.12 – Signal spectrum of an OFDM signal with an amplitude step at 30 MHz (measured with a 120 kHz resolution bandwidth) Table B.1 – Comparison of white noise signal generation methods |
| 47 | Bibliography |
