BS EN 61000-4-4:2012
$189.07
Electromagnetic compatibility (EMC) – Testing and measurement techniques. Electrical fast transient/burst immunity test
| Published By | Publication Date | Number of Pages |
| BSI | 2012 | 47 |
IEC 61000-4-4:2012 is available as /2 which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition. IEC 61000-4-4:2012 relates to the immunity of electrical and electronic equipment to repetitive electrical fast transients. It has the status of a basic EMC publication in accordance with IEC Guide 107. It gives immunity requirements and test procedures related to electrical fast transients/bursts. It additionally defines ranges of test levels and establishes test procedures. The object of this standard is to establish a common and reproducible reference in order to evaluate the immunity of electrical and electronic equipment when subjected to electrical fast transient/bursts on supply, signal, control and earth ports. The test method documented in this standard describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon. This third edition cancels and replaces the second edition published in 2004 and its amendment 1 (2010). It constitutes a technical revision which improves and clarifies simulator specifications, test criteria and test setups.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 6 | English CONTENTS |
| 8 | INTRODUCTION |
| 9 | 1 Scope 2 Normative references 3 Terms, definitions and abbreviations 3.1 Terms and definitions |
| 12 | 3.2 Abbreviations 4 General 5 Test levels |
| 13 | 6 Test equipment 6.1 Overview 6.2 Burst generator 6.2.1 General Tables TableĀ 1 ā Test levels |
| 14 | 6.2.2 Characteristics of the fast transient/burst generator Figures Figure 1 ā Simplified circuit diagram showing major elements of a fast transient/burst generator |
| 15 | FigureĀ 2 ā Representation of an electrical fast transient/burst FigureĀ 3 ā Ideal waveform of a single pulse into a 50Ā ā¦ load with nominal parameters tr = 5Ā ns and tw = 50Ā ns |
| 16 | 6.2.3 Calibration of the characteristics of the fast transient/burst generator |
| 17 | 6.3 Coupling/decoupling network for a.c./d.c. power port 6.3.1 Characteristics of the coupling/decoupling network TableĀ 2 ā Output voltage peak values and repetition frequencies |
| 18 | 6.3.2 Calibration of the coupling/decoupling network FigureĀ 4 ā Coupling/decoupling network for a.c./d.c.power mains supply ports/terminals |
| 19 | 6.4 Capacitive coupling clamp 6.4.1 General FigureĀ 5 ā Calibration of the waveform at the output of thecoupling/decoupling network |
| 20 | 6.4.2 Calibration of the capacitive coupling clamp FigureĀ 6 ā Example of a capacitive coupling clamp |
| 21 | FigureĀ 7 ā Transducer plate for coupling clamp calibration FigureĀ 8 ā Calibration of a capacitive coupling clamp using the transducer plate |
| 22 | 7 Test setup 7.1 General 7.2 Test equipment 7.2.1 General 7.2.2 Verification of the test instrumentation FigureĀ 9 ā Block diagram for electrical fast transient/burst immunity test |
| 23 | 7.3 Test setup for type tests performed in laboratories 7.3.1 Test conditions FigureĀ 10 ā Example of a verification setup of the capacitive coupling clamp |
| 24 | FigureĀ 11 ā Example of a test setup for laboratory type tests |
| 25 | FigureĀ 12 ā Example of test setup using a floor standing system of two EUTs |
| 26 | 7.3.2 Methods of coupling the test voltage to the EUT FigureĀ 13 ā Example of a test setup for equipment with elevated cable entries |
| 27 | FigureĀ 14 ā Example of a test setup for direct couplingof the test voltage to a.c./d.c. power ports for laboratory type tests |
| 28 | 7.4 Test setup for in situ tests 7.4.1 Overview 7.4.2 Test on power ports and earth ports FigureĀ 15 ā Example for in situ test on a.c./d.c. power ports and protective earth terminals for stationary, floor standing EUT |
| 29 | 7.4.3 Test on signal and control ports Figure 16 ā Example of in situ test on signal and control ports without the capacitive coupling clamp |
| 30 | 8 Test procedure 8.1 General 8.2 Laboratory reference conditions 8.2.1 Climatic conditions 8.2.2 Electromagnetic conditions 8.3 Execution of the test |
| 31 | 9 Evaluation of test results 10 Test report |
| 32 | Annex A (informative) Information on the electrical fast transients |
| 34 | Annex B (informative) Selection of the test levels |
| 36 | Annex C (informative) Measurement uncertainty (MU) considerations |
| 38 | TableĀ C.1 ā Example of uncertainty budget for voltage rise time (tr) |
| 39 | TableĀ C.2 ā Example of uncertainty budget for EFT/B peak voltage value (VP) |
| 40 | TableĀ C.3 ā Example of uncertainty budget for EFT/B voltage pulse width (tw) |
| 42 | TableĀ C.4 ā Ī± factor (Equation (C.4)) of different unidirectional impulseresponses corresponding to the same bandwidth of the system B |
| 45 | Bibliography |
