BS EN 61000-4-6:2014
$215.11
Electromagnetic compatibility (EMC) – Testing and measurement techniques. Immunity to conducted disturbances, induced by radio-frequency fields
| Published By | Publication Date | Number of Pages |
| BSI | 2014 | 88 |
IEC 61000-4-6:2013 relates to the conducted immunity requirements of electrical and electronic equipment to electromagnetic disturbances coming from intended radio-frequency (RF) transmitters in the frequency range 150 kHz up to 80 MHz. Equipment not having at least one conducting wire and/or cable (such as mains supply, signal line or earth connection) which can couple the equipment to the disturbing RF fields is excluded from the scope of this publication. The object of this standard is to establish a common reference for evaluating the functional immunity of electrical and electronic equipment when subjected to conducted disturbances induced by RF fields. The test method documented in IEC 61000-4-6:2013 describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon. This fourth edition cancels and replaces the third edition published in 2008 and constitutes a technical revision. It includes the following significant technical changes with respect to the previous edition: – use of the CDNs; – calibration of the clamps; – reorganization of Clause 7 on test setup and injection methods; – Annex A which is now dedicated to EM and decoupling clamps; – Annex G which now addresses the measurement uncertainty of the voltage test level; – and informative Annexes H, I and J which are new. The contents of the corrigendum of June 2015 have been included in this copy.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 6 | English CONTENTS |
| 9 | INTRODUCTION |
| 10 | 1 Scope 2 Normative references 3 Terms and definitions |
| 12 | 4 General |
| 14 | 5 Test levels Figures Figure 1 – Immunity test to RF conducted disturbances |
| 15 | 6 Test equipment and level adjustment procedures 6.1 Test generator Figure 2 – Open circuit waveforms at the EUT portof a coupling device for test level 1 Tables Table 1 – Test levels |
| 16 | Table 2 – Characteristics of the test generator |
| 17 | 6.2 Coupling and decoupling devices 6.2.1 General Figure 3 – Test generator setup Table 3 – Main parameter of the combination of the coupling and decoupling device |
| 20 | 6.2.2 Coupling/decoupling networks (CDNs) Figure 4 – Principle of coupling and decoupling Table 4 – Usage of CDNs |
| 22 | 6.2.3 Clamp injection devices Figure 5 – Principle of coupling and decouplingaccording to the clamp injection method |
| 23 | Figure 6 – Example of circuit for level setting setup in a 150 Ω test jig |
| 24 | 6.2.4 Direct injection devices 6.2.5 Decoupling networks Figure 7 – Example circuit for evaluating the performance of the current clamp |
| 25 | 6.3 Verification of the common mode impedance at the EUT port of coupling and decoupling devices 6.3.1 General 6.3.2 Insertion loss of the 150 ( to 50 ( adapters |
| 27 | 6.4 Setting of the test generator 6.4.1 General Figure 8 – Details of setups and components to verify the essential characteristics of coupling and decoupling devices and the 150 Ω to 50 Ω adapters |
| 28 | 6.4.2 Setting of the output level at the EUT port of the coupling device |
| 29 | Figure 9 – Setup for level setting |
| 30 | 7 Test setup and injection methods 7.1 Test setup 7.2 EUT comprising a single unit |
| 31 | 7.3 EUT comprising several units Figure 10 – Example of test setup with a single unit EUT (top view) |
| 32 | 7.4 Rules for selecting injection methods and test points 7.4.1 General 7.4.2 Injection method Figure 11 – Example of a test setup with a multi-unit EUT (top view) |
| 33 | 7.4.3 Ports to be tested Figure 12 – Rules for selecting the injection method |
| 34 | 7.5 CDN injection application |
| 35 | 7.6 Clamp injection application when the common mode impedance requirements can be met Figure 13 – Immunity test to 2-port EUT (when only one CDN can be used) |
| 36 | Figure 14 – General principle of a test setup using clamp injection devices |
| 37 | 7.7 Clamp injection application when the common mode impedance requirements cannot be met 7.8 Direct injection application Figure 15 – Example of the test unit locations on the ground plane when using injection clamps (top view) |
| 38 | 8 Test procedure |
| 39 | 9 Evaluation of the test results 10 Test report |
| 41 | Annex A (normative) EM and decoupling clamps |
| 42 | Figure A.1 – Example: Construction details of the EM clamp |
| 43 | Figure A.2 – Example: Concept of the EM clamp |
| 44 | Figure A.3 – Dimension of a reference plane Figure A.4 – Test jig Figure A.5 – Test jig with inserted clamp |
| 45 | Figure A.6 – Impedance / decoupling factor measurement setup |
| 46 | Figure A.7 – Typical examples for clamp impedance, 3 typical clamps |
| 47 | Figure A.8 – Typical examples for decoupling factors, 3 typical clamps Figure A.9 – Normalization setup for coupling factor measurement |
| 48 | Figure A.10 – S21 coupling factor measurement setup Figure A.11 – Typical examples for coupling factor, 3 typical clamps |
| 49 | Figure A.12 – Decoupling clamp characterization measurement setup Figure A.13 – Typical examples for the decoupling clamp impedance |
| 50 | Figure A.14 – Typical examples for decoupling factors |
| 51 | Annex B (informative) Selection criteria for the frequency range of application Table B.1 – Main parameter of the combination of the coupling and decoupling device when the frequency range of test is extended above 80 MHz |
| 52 | Figure B.1 – Start frequency as function of cable length and equipment size |
| 53 | Annex C (informative) Guide for selecting test levels |
| 54 | Annex D (informative) Information on coupling and decoupling networks |
| 55 | Figure D.1 – Example of a simplified diagram for the circuit of CDN-S1 used with screened cables (see 6.2.2.5) Figure D.2 – Example of simplified diagram for the circuit of CDN-M1/-M2/-M3 used with unscreened supply (mains) lines (see 6.2.2.2) |
| 56 | Figure D.3 – Example of a simplified diagram for the circuit of CDN-AF2 used with unscreened unbalanced lines (see 6.2.2.4) Figure D.4 – Example of a simplified diagram for the circuit of a CDN-T2, used with an unscreened balanced pair (see 6.2.2.3) |
| 57 | Figure D.5 – Example of a simplified diagram of the circuit of a CDN-T4 used with unscreened balanced pairs (see 6.2.2.3) Figure D.6 – Example of a simplified diagram of the circuit of a CDN AF8 used with unscreened unbalanced lines (see 6.2.2.4) |
| 58 | Figure D.7 – Example of a simplified diagram of the circuit of a CDN-T8 used with unscreened balanced pairs (see 6.2.2.3) |
| 59 | Annex E (informative) Information for the test generator specification Table E.1 – Required power amplifier output power to obtain a test level of 10 V |
| 60 | Annex F (informative) Test setup for large EUTs |
| 61 | Figure F.1 – Example of large EUT test setupwith elevated horizontal reference ground plane |
| 62 | Figure F.2 – Example of large EUT test setupwith vertical reference ground plane |
| 63 | Annex G (informative) Measurement uncertainty of the voltage test level |
| 64 | Figure G.1 – Example of influences upon voltage test level using CDN Figure G.2 – Example of influences upon voltage test level using EM clamp |
| 65 | Figure G.3 – Example of influences upon voltage test level using current clamp Figure G.4 – Example of influences upon voltage test level using direct injection |
| 66 | Figure G.5 – Circuit for level setting setup |
| 67 | Table G.1 – CDN level setting process Table G.2 – CDN test process |
| 69 | Table G.3 – EM clamp level setting process Table G.4 – EM clamp test process |
| 70 | Table G.5 – Current clamp level setting process |
| 71 | Table G.6 – Current clamp test process |
| 72 | Table G.7 – Direct injection level setting process Table G.8 – Direct injection test process |
| 74 | Annex H (informative) Measurement of AE impedance Table H.1 – Impedance requirements for the AE |
| 75 | Figure H.1 – Impedance measurement using a voltmeter Table H.2 – Derived voltage division ratios for AE impedance measurements |
| 76 | Figure H.2 – Impedance measurement using a current probe Table H.3 – Derived voltage ratios for AE impedance measurements |
| 78 | Annex I (informative) Port to port injection |
| 79 | Figure I.1 – Example of setup, port to port injection |
| 80 | Annex J (informative) Amplifier compression and non-linearity |
| 82 | Figure J.1 – Amplifier linearity measurement setup |
| 83 | Figure J.2 – Linearity characteristic Figure J.3 – Measurement setup for modulation depth |
| 84 | Figure J.4 – Spectrum of AM modulated signal |
| 85 | Bibliography |
