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BS EN 62220-1-1:2015 – TC:2020 Edition

$217.84

Tracked Changes. Medical electrical equipment. Characteristics of digital x-ray imaging devices – Determination of the detective quantum efficiency. Detectors used in radiographic imaging

Published By Publication Date Number of Pages
BSI 2020 97
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IEC 62220-1-1:2015 specifies the method for the determination of the DETECTIVE QUANTUM EFFICIENCY (DQE) of DIGITAL X-RAY IMAGING DEVICES as a function of AIR KERMA and of SPATIAL FREQUENCY for the working conditions in the range of the medical application as specified by the MANUFACTURER. The intended users of this part of IEC 62220 are manufacturers and well equipped test laboratories. This first edition of IEC 62220-1-1 cancels and replaces IEC 62220-1:2003. It constitutes a technical revision of IEC 62220-1:2003 and assures a better alignment with the other parts of the IEC 62220 series. The main changes are as follows: – necessary modifications have been applied as a consequence of taking into account IEC 61267:2005. This influences HVL values and SNRin2; – the method for the determination of LAG EFFECTS now considers lag and ghosting compensation; – as part of the MTF determination, the method of obtaining the final averaged MTF has been restricted (only averaging of the ESF is allowed); – a description of (optionally) obtaining the diagonal (45°) MTF and NPS has been added.

PDF Catalog

PDF Pages PDF Title
1 compares BS EN 62220-1-1:2015
2 TRACKED CHANGES
Text example 1 — indicates added text (in green)
60 English
CONTENTS
62 FOREWORD
64 INTRODUCTION
65 1 Scope
2 Normative references
66 3 Terms and definitions
68 4 Requirements
4.1 Operating conditions
4.2 X-RAY EQUIPMENT
4.3 RADIATION QUALITY
69 4.4 TEST DEVICE
Tables
Table 1 – Radiation quality (IEC 61267:2005) for the determination of detective quantum efficiency and corresponding parameters
70 4.5 Geometry
Figures
Figure 1 – Test device for the determination of the modulation transfer function and the magnitude of lag effects
72 4.6 Irradiation conditions
4.6.1 General conditions
Figure 2 – Geometry for exposing the digital X-ray imaging device behind the test device in order to determine lag effects and the modulation transfer function
73 4.6.2 air kerma measurement
74 4.6.3 Avoidance of lag effects
4.6.4 Irradiation to obtain the conversion function
4.6.5 Irradiation for determination of the noise power spectrum
75 4.6.6 Irradiation for determination of the modulation transfer function
Figure 3 – Position of the test device for the determination of the modulation transfer function
76 4.6.7 Overview of all necessary irradiations
5 Corrections of raw data
Table 2 – Necessary irradiations
77 6 Determination of the detective quantum efficiency
6.1 Definition and formula of DQE(u,v)
6.2 Parameters to be used for evaluation
78 6.3 Determination of different parameters from the images
6.3.1 Linearization of data
6.3.2 The noise power spectrum (NPS)
Table 3 – Parameters mandatory for the application of this standard
79 Figure 4 – Geometric arrangement of the ROIs for NPS calculation
80 6.3.3 Determination of the modulation transfer function (MTF)
81 Figure 5 – Representation of the image acquired for the determination of the MTF
82 7 Format of conformance statement
83 8 Accuracy
84 Annex A (normative)Determination of lag effects
A.1 Overview
A.2 Estimation of lag effects (default method)
A.3 Estimation of lag effects, alternative method (only if no lag effect or ghosting compensation is applied)
A.3.1 General
85 A.3.2 Test of additive lag effects
86 Figure A.1 – Definition of the ROIs for the test of additive lag effects
Figure A.2 – Procedure flow diagram for the test of additive lag effects
87 A.3.3 Test of multiplicative lag effects
88 Figure A.3 – Definition of the ROIs for the test of the multiplicative lag effects
Figure A.4 – Procedure flow diagram for the test of multiplicative lag effects
89 A.3.4 Determination of the minimum time between consecutive images
90 Annex B (informative) Calculation of the input noise power spectrum
91 Bibliography
94 Index of defined terms used in this particular standard
BS EN 62220-1-1:2015 - TC
$217.84