BS EN 62220-1-1:2015 – TC:2020 Edition
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Tracked Changes. Medical electrical equipment. Characteristics of digital x-ray imaging devices – Determination of the detective quantum efficiency. Detectors used in radiographic imaging
Published By | Publication Date | Number of Pages |
BSI | 2020 | 97 |
IEC 62220-1-1:2015 specifies the method for the determination of the DETECTIVE QUANTUM EFFICIENCY (DQE) of DIGITAL X-RAY IMAGING DEVICES as a function of AIR KERMA and of SPATIAL FREQUENCY for the working conditions in the range of the medical application as specified by the MANUFACTURER. The intended users of this part of IEC 62220 are manufacturers and well equipped test laboratories. This first edition of IEC 62220-1-1 cancels and replaces IEC 62220-1:2003. It constitutes a technical revision of IEC 62220-1:2003 and assures a better alignment with the other parts of the IEC 62220 series. The main changes are as follows: – necessary modifications have been applied as a consequence of taking into account IEC 61267:2005. This influences HVL values and SNRin2; – the method for the determination of LAG EFFECTS now considers lag and ghosting compensation; – as part of the MTF determination, the method of obtaining the final averaged MTF has been restricted (only averaging of the ESF is allowed); – a description of (optionally) obtaining the diagonal (45°) MTF and NPS has been added.
PDF Catalog
PDF Pages | PDF Title |
---|---|
1 | compares BS EN 62220-1-1:2015 |
2 | TRACKED CHANGES Text example 1 — indicates added text (in green) |
60 | English CONTENTS |
62 | FOREWORD |
64 | INTRODUCTION |
65 | 1 Scope 2 Normative references |
66 | 3 Terms and definitions |
68 | 4 Requirements 4.1 Operating conditions 4.2 X-RAY EQUIPMENT 4.3 RADIATION QUALITY |
69 | 4.4 TEST DEVICE Tables Table 1 – Radiation quality (IEC 61267:2005) for the determination of detective quantum efficiency and corresponding parameters |
70 | 4.5 Geometry Figures Figure 1 – Test device for the determination of the modulation transfer function and the magnitude of lag effects |
72 | 4.6 Irradiation conditions 4.6.1 General conditions Figure 2 – Geometry for exposing the digital X-ray imaging device behind the test device in order to determine lag effects and the modulation transfer function |
73 | 4.6.2 air kerma measurement |
74 | 4.6.3 Avoidance of lag effects 4.6.4 Irradiation to obtain the conversion function 4.6.5 Irradiation for determination of the noise power spectrum |
75 | 4.6.6 Irradiation for determination of the modulation transfer function Figure 3 – Position of the test device for the determination of the modulation transfer function |
76 | 4.6.7 Overview of all necessary irradiations 5 Corrections of raw data Table 2 – Necessary irradiations |
77 | 6 Determination of the detective quantum efficiency 6.1 Definition and formula of DQE(u,v) 6.2 Parameters to be used for evaluation |
78 | 6.3 Determination of different parameters from the images 6.3.1 Linearization of data 6.3.2 The noise power spectrum (NPS) Table 3 – Parameters mandatory for the application of this standard |
79 | Figure 4 – Geometric arrangement of the ROIs for NPS calculation |
80 | 6.3.3 Determination of the modulation transfer function (MTF) |
81 | Figure 5 – Representation of the image acquired for the determination of the MTF |
82 | 7 Format of conformance statement |
83 | 8 Accuracy |
84 | Annex A (normative)Determination of lag effects A.1 Overview A.2 Estimation of lag effects (default method) A.3 Estimation of lag effects, alternative method (only if no lag effect or ghosting compensation is applied) A.3.1 General |
85 | A.3.2 Test of additive lag effects |
86 | Figure A.1 – Definition of the ROIs for the test of additive lag effects Figure A.2 – Procedure flow diagram for the test of additive lag effects |
87 | A.3.3 Test of multiplicative lag effects |
88 | Figure A.3 – Definition of the ROIs for the test of the multiplicative lag effects Figure A.4 – Procedure flow diagram for the test of multiplicative lag effects |
89 | A.3.4 Determination of the minimum time between consecutive images |
90 | Annex B (informative) Calculation of the input noise power spectrum |
91 | Bibliography |
94 | Index of defined terms used in this particular standard |