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BS EN 62496-2:2017

$189.07

Optical circuit boards. Basic test and measurement procedures – General guidance for definition of measurement conditions for optical characteristics of optical circuit boards

Published By Publication Date Number of Pages
BSI 2017 46
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IEC 62496-2:2017 specifies a method of defining the conditions for measurements of optical characteristics of optical circuit boards. The method comprises the use of code reference look-up tables to identify different critical aspects of the measurement environment. The values extracted from the tables are used to construct a measurement identification code, which, in itself, captures sufficient information about the measurement conditions, so as to ensure consistency of independently measured results within an acceptable margin. Recommended measurement conditions are specified to minimise further variation in independently measured results.

PDF Catalog

PDF Pages PDF Title
2 National foreword
5 Annex ZA(normative)Normative references to international publicationswith their corresponding European publications
7 CONTENTS
9 FOREWORD
11 INTRODUCTION
Figures
Figure 1 – Optical circuit board varieties
12 1 Scope
2 Normative references
3 Terms and definitions
14 4 Measurement definition system for optical circuit boards
4.1 General
4.2 Measurement definition system requirements
4.2.1 Accuracy
4.2.2 Accountability
15 4.2.3 Efficiency
4.2.4 Convenience
4.2.5 Independent
4.2.6 Scalable
4.2.7 Customised requirements
4.2.8 Prioritised structure
4.3 Measurement definition criteria
4.3.1 General
16 4.3.2 Source characteristics
4.3.3 Launch conditions
17 Tables
Table 1 – Recommended modal launch profiles
18 Figure 2 – Recommended test setup for single-mode fibre launch conditions
Figure 3 – Recommended test setup for multimode fibre launch conditions
19 4.3.4 Input coupling conditions
20 4.3.5 Output coupling conditions
Figure 4 – Cross-sectional views of channel under test at input
21 4.3.6 Capturing conditions
4.4 Launch and capturing position
Figure 5 – Cross-sectional views of the channel under test at output
22 4.5 Launch and capture direction
Figure 6 – Measurement setup with collinear launch and capture direction
23 Figure 7 – Measurement setup with orthogonal launch and capture direction
Figure 8 – Measurement setup with oblique launch and capture direction
24 5 Measurement identification code
5.1 General
5.2 Measurement identification code construction
5.2.1 General
5.2.2 AAA – Source characteristics
5.2.3 BBB(b1) – Launch conditions
Figure 9 – Measurement identification code construction
25 5.2.4 CCC – Input coupling conditions
5.2.5 DDD – Output coupling conditions
5.2.6 EEE – Capturing conditions
5.3 Extended measurement identification code with customisation parameters
5.3.1 General
5.3.2 Customisation parameters with placeholders
26 5.4 Reference measurements
5.5 Coordinate table AAA – Source characteristics
5.5.1 Mandatory parameters
5.5.2 Customisation parameters
Figure 10 – Reference measurements with the same MIC
27 Table 2 – AAA coordinate reference for source characteristics
29 5.6 Coordinate table BBB – Launch conditions
5.6.1 Mandatory parameter
5.6.2 Customisation parameters
30 Table 3 – BBB coordinate reference for launch conditions
32 5.7 Coordinate table CCC – Input coupling conditions
5.7.1 Mandatory parameters
5.7.2 Customisation parameters
33 Table 4 – CCC coordinate reference for input coupling conditions
34 5.8 Coordinate table DDD – Output coupling conditions
5.8.1 Mandatory parameters
5.8.2 Customisation parameters
35 Table 5 – DDD coordinate reference for output coupling conditions
36 5.9 Coordinate table EEE – Capturing conditions
5.9.1 Mandatory parameters
5.9.2 Customisation parameters
37 Table 6 – EEE coordinate reference for capturing conditions
39 5.10 Examples of deployment
5.10.1 General
5.10.2 MIC-042-113(400)-001-001-112 (integrating sphere device details including supplier and model number)
5.10.3 MIC-072-123(205)-053(1.56, X,X)-001-042 (integrating sphere device details including supplier and model number)
40 5.10.4 Fast polarisation axis: MIC-091-072(150)-042(1.53, 25, -30)-051-004; slow polarisation axis: MIC-091-072(75)-042(1.53, 25, -120)-051-004
41 Annex A (informative)State of the art in optical interconnect technologies
A.1 Diversity of optical interconnect technologies
A.2 Fibre-optic circuit laminates
A.3 Polymer waveguides
A.4 Planar glass waveguides
42 A.5 Free space optics
A.6 Target applications
43 Bibliography
BS EN 62496-2:2017
$189.07