BS EN 62562:2011
$142.49
Cavity resonator method to measure the complex permittivity of low-loss dielectric plates
| Published By | Publication Date | Number of Pages |
| BSI | 2011 | 24 |
IEC 62562:2010 describes a measurement method of dielectric properties in the planar direction of dielectric plate at microwave frequency, called a cavity resonator method. It has been created in order to develop new materials and to design microwave active and passive devices for which standardization of measurement methods of material properties is more and more important. This first edition cancels and replaces the PAS published in 2008. This bilingual version, published in 2010-05, corresponds to the English version. This publication contains colours which are considered to be useful for the correct understanding of its contents.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 5 | CONTENTS |
| 6 | 1 Scope 2 Measurement parameters |
| 7 | 3 Theory and calculation equations 3.1 Relative permittivity and loss tangent Figures Figure 1 – Resonator structures of two types |
| 10 | 3.2 Temperature dependence of ε’ and tanδ Figure 2 – Correction term Δε’/ε’a Figure 3 – Correction terms ΔA/A and ΔB/B |
| 11 | 3.3 Cavity parameters |
| 12 | 4 Measurement equipment and apparatus 4.1 Measurement equipment 4.2 Measurement apparatus for complex permittivity Figure 4 – Schematic diagram of measurement equipments |
| 13 | 5 Measurement procedure 5.1 Preparation of measurement apparatus 5.2 Measurement of reference level 5.3 Measurement of cavity parameters: D, H, rσ, cα, ρTC Figure 5 – Cavity resonator used for measurement Figure 6 – Photograph of cavity resonator for measurement around 10 GHz |
| 14 | Figure 7 – Mode chart of cavity resonator Figure 8 – Resonance peaks of cavity resonator |
| 15 | 5.4 Measurement of complex permittivity of test specimen: ε’, tanδ Figure 9 – Resonance frequency f0, insertion attenuation LA0 and half-power band width fBW |
| 16 | 5.5 Temperature dependence of ε’ and tanδ Figure 10 – Resonance frequency f0 of TE011 mode of cavity resonator with dielectric plate (D = 35 mm, H = 25 mm) |
| 17 | Annex A (informative) Example of measured result and accuracy Table A.1 – Measured results of cavity parameters |
| 18 | Figure A.1 – Measured temperature dependence of f1 and Quc |
| 19 | Figure A.2 – Resonance peaks of cavity resonator clamping sapphire plate Table A.2 – Measured results of ε’ and tanδ for sapphire plate |
| 20 | Figure A.3 – Measured results of temperature dependence of f0, Qu, ε’ and tanδ for sapphire plate |
| 21 | Bibliography |
