🔥🔥 Don’t Miss Out on Our End of Autumn Sale. If you have any questions, feel free to click the bottom right corner to contact our customer service..

Concat us[email protected]
Shopping Cart

No products in the cart.

🔍
BS EN 62586-2:2014

BS EN 62586-2:2014

$215.11

Power quality measurement in power supply systems – Functional tests and uncertainty requirements

Published By Publication Date Number of Pages
BSI 2014 112
PDF Format Searchable Printable Preview Now
Guaranteed Safe Checkout
Categories: ,

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

PDF Catalog

PDF Pages PDF Title
6 Annex ZZ (informative) Coverage of Essential Requirements of EU Directives
Untitled
7 English
CONTENTS
12 INTRODUCTION
13 1 Scope
2 Normative references
3 Terms, definitions, abbreviations, notations and symbols
14 3.1 General terms and definitions
3.2 Terms and definitions related to uncertainty
15 3.3 Notations
3.3.1 Functions
3.3.2 Symbols and abbreviations
3.3.3 Indices
4 Requirements
4.1 Requirements for products complying with class A
16 4.2 Requirements for products complying with class S
Tables
Table 1 – Summary of type tests for Class A
17 5 Functional type tests common requirements
5.1 General philosophy for testing
5.1.1 Measuring ranges
Table 2 – Summary of type tests for Class S
Table 3 – Testing points for each measured parameter
19 5.1.2 Single “power system influence quantities”
Table 4 – List of single “power system influence quantities”
20 5.1.3 Mixed “power system influence quantities” measuring range
Table 5 – List of mixed “power system influence quantities”
21 5.1.4 “External influence quantities”
5.1.5 Test criteria
Table 6 – Influence of Temperature
Table 7 – Influence of auxiliary power supply voltage
Table 8 – List of generic test criteria
22 5.2 Testing procedure
5.2.1 Device under test
5.2.2 Testing conditions
5.2.3 Testing equipment
6 Functional testing procedure for instruments complying with class A according to IEC 61000-4-30
6.1 Power frequency
6.1.1 General
6.1.2 Measurement method
23 6.1.3 Measurement uncertainty and measuring range
24 6.1.4 Measurement evaluation
6.1.5 Measurement aggregation
6.2 Magnitude of supply voltage
6.2.1 Measurement method
6.2.2 Measurement uncertainty and measuring range
6.2.3 Measurement evaluation
25 6.2.4 Measurement aggregation
26 6.3 Flicker
6.4 Supply voltage interruptions, dips and swells
6.4.1 General
29 Figures
Figure 1 – Overview of test for dips according to test A4.1.1
30 Figure 2 – Detail 1 of waveform for test of dips according to test A4.1.1
Figure 3 – Detail 2 of waveform for tests of dips according to A4.1.1
Figure 4 – Detail 3 of waveform for tests of dips according to test A4.1.1
31 Figure 5 – Detail 1 of waveform for test of dips according to test A4.1.2
Figure 6 – Detail 2 of waveform for tests of dips according to test A4.1.2
32 Figure 7 – Detail 1 of waveform for test of swells according to test A4.1.2
Figure 8 – Detail 2 of waveform for tests of swells according to test A4.1.2
33 Figure 9 – Sliding reference voltage test
Figure 10 – Sliding reference start up condition
34 6.4.2 Check dips / interruptions in polyphase system
Figure 11 – Detail 1 of waveform for test of polyphase dips/interruptions
35 Figure 12 – Detail 2 of waveform for test of polyphase dips/interruptions
Figure 13 – Detail 3 of waveform for test of polyphase dips/interruptions
36 6.4.3 Check swells in polyphase system
Figure 14 – Detail 1 of waveform for test of polyphase swells
37 6.5 Supply voltage unbalance
6.5.1 General
6.5.2 Measurement method, measurement uncertainty and measuring range
Figure 15 – Detail 2 of waveform for test of polyphase swells
38 6.5.3 Aggregation
6.6 Voltage harmonics
6.6.1 Measurement method
39 6.6.2 Measurement uncertainty and measuring range
40 6.6.3 Measurement evaluation
6.6.4 Measurement aggregation
42 6.7 Voltage inter-harmonics
6.7.1 Measurement method
6.7.2 Measurement uncertainty and measuring range
43 6.7.3 Measurement evaluation
6.7.4 Measurement aggregation
45 6.8 Mains signalling voltages on the supply voltage
6.8.1 Measurement method
47 6.8.2 Measurement uncertainty and measuring range
48 6.8.3 Aggregation
6.9 Measurement of underdeviation and overdeviation parameters
6.9.1 Measurement method
50 6.9.2 Measurement uncertainty and measuring range
6.9.3 Measurement evaluation
6.9.4 Measurement aggregation
52 6.10 Flagging
53 Figure 16 – Flagging test for class A
54 6.11 Clock uncertainty testing
6.12 Variations due to external influence quantities
6.12.1 General
Figure 17 – Clock uncertainty testing
55 6.12.2 Influence of temperature
58 6.12.3 Influence of power supply voltage
59 7 Functional testing procedure for instruments complying with class S according to IEC 61000-4-30
7.1 Power frequency
7.1.1 General
7.1.2 Measurement method
60 7.1.3 Measurement uncertainty and measuring range
61 7.1.4 Measurement evaluation
7.1.5 Measurement aggregation
7.2 Magnitude of the supply voltage
7.2.1 Measurement method
7.2.2 Measurement uncertainty and measuring range
62 7.2.3 Measurement evaluation
7.2.4 Measurement aggregation
63 7.3 Flicker
7.4 Supply voltage interruptions, dips and swells
7.4.1 General requirements
66 Figure 18 – Detail 1 of waveform for test of dips according to test S4.1.2
Figure 19 – Detail 2 of waveform for tests of dips according to test S4.1.2
67 Figure 20 – Detail 1 of waveform for test of swells according to test S4.1.2
Figure 21 – Detail 2 of waveform for tests of swells according to test S4.1.2
68 Figure 22 – Sliding reference voltage test
Figure 23 – Sliding reference start up condition
69 7.4.2 Check dips / interruptions in polyphase system
Figure 24 – Detail 1 of waveform for test of polyphase dips/interruptions
70 Figure 25 – Detail 2 of waveform for test of polyphase dips/interruptions
Figure 26 – Detail 3 of waveform for test of polyphase dips/interruptions
71 7.4.3 Check swells in polyphase system
Figure 27 – Detail 1 of waveform for test of polyphase swells
72 7.5 Supply voltage unbalance
7.5.1 General
7.5.2 Measurement method, measurement uncertainty and measuring range
Figure 28 – Detail 2 of waveform for test of polyphase swells
73 7.5.3 Aggregation
7.6 Voltage harmonics
7.6.1 General
7.6.2 Measurement method
75 7.6.3 Measurement method, measurement uncertainty and measuring range
76 7.6.4 Measurement evaluation
7.6.5 Measurement aggregation
77 7.7 Voltage inter-harmonics
78 7.8 Mains Signalling Voltages on the supply voltage
7.8.1 General
7.8.2 Measurement method
7.8.3 Measurement uncertainty and measuring range
7.8.4 Aggregation
7.9 Measurement of underdeviation and overdeviation parameters
7.10 Flagging
79 Figure 29 – Flagging test for class S
80 7.11 Clock uncertainty testing
7.12 Variations due to external influence quantities
7.12.1 General
Figure 30 – Clock uncertainty testing
81 7.12.2 Frequency measurement
7.12.3 Influence of temperature
82 7.12.4 Influence of power supply voltage
8 Calculation of measurement uncertainty and operating uncertainty
83 Table 9 – Uncertainty requirements
84 Annex A (normative) Intrinsic uncertainty, operating uncertainty, and overall system uncertainty
Figure A.1 – Different kinds of uncertainties
86 Annex B (normative) Calculation of measurement and operating uncertainty for voltage magnitude and power frequency
89 Annex C (informative) Further test on dips (amplitude and phase angles changes)
Figure C.1 – Phase-to-neutral testing on three-phase systems
Figure C.2 – Phase-to-phase testing on three-phase systems
90 Table C.1 – Tests pattern
91 Annex D (informative) Further tests on dips (polyphase): test procedure
92 Figure D.1 – Example for on phase of a typical N cycle injection
93 Figure D.2 – Dip/interruption accuracy (amplitude and timing) test
94 Figure D.3 – Swell accuracy (amplitude and timing) test
95 Annex E (normative) Gapless measurements of voltage amplitude and harmonics test
98 Annex F (informative) Gapless measurements of voltage amplitude and harmonics
Figure F.1 – Simulated signal under noisy conditions
99 Figure F.2 – Waveform for checking gapless RMS voltage measurement
Figure F.3 – 2,3 Hz Frequency fluctuation
100 Figure F.4 – Spectral leakage effects for a missing sample
101 Figure F.5 – Illustration of QRMS for missing samples
Figure F.6 – Detection of a single missing sample
102 Figure F.7 – QRMS for an ideal signal, sampling error = 300 x 10–6
Figure F.8 – QRMS for an ideal signal, sampling error = 400 x 10–6
103 Figure F.9 – QRMS for an ideal signal, sampling error = 200 x 10–6
104 Figure F.10 – QRMS with ideal test signal and perfect samplingfrequency synchronization
Figure F.11 – QRMS with 300 x 10–6 sampling frequency error and 100 x 10–6 modulation frequency error
105 Figure F.12 – QRMS with a 20/24 cycles sliding window with a output every 10/12 cycles
Figure F.13 – Amplitude test for fluctuating component
106 Annex G (informative) Testing equipment requirements
107 Annex H (informative) Example of test report
108 Annex I (informative) Mixed influence quantities
Table I.1 – Mixed influence quantities test for frequency
Table I.2 – Mixed influence quantities test for magnitude of voltage
109 Table I.3 – Mixed influence quantities test for dips and swells
110 Bibliography
BS EN 62586-2:2014
$215.11