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BS EN 62884-2:2017

BS EN 62884-2:2017

$142.49

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Phase jitter measurement method

Published By Publication Date Number of Pages
BSI 2017 30
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This part of IEC 62884 specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an “Oscillator”) and gives guidance for phase jitter that allows the accurate measurement of RMS jitter.

In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.

NOTE Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.

PDF Catalog

PDF Pages PDF Title
2 undefined
7 CONTENTS
9 FOREWORD
11 INTRODUCTION
12 1 Scope
2 Normative references
3 Terms and definitions
13 4 Test and measurement procedures
4.1 General
4.2 Test methods of phase jitter
4.2.1 General
4.2.2 Measurement in the time domain
14 4.2.3 Measurement in the data domain
4.2.4 Measurement in the frequency domain
Figures
Figure 1 – Phase jitter measurement with sampling oscilloscope
15 Tables
Table 1 – Fourier frequency range for phase noise test
16 Figure 2 – Block diagram of a jitter and wander analyser according to ITU-T O.172
17 Table 2 – Standard bit rates for various applications
18 4.3 Input and output impedances of the measurement system
4.4 Measurement equipment
4.4.1 General
4.4.2 Jitter floor
4.4.3 Output wave form
Figure 3 – Equivalent block diagram
19 4.4.4 Output voltage
4.5 Test fixture
4.6 Cable, tools and instruments, and so on
5 Measurement and the measurement environment
5.1 Set-up before taking measurements
5.2 Points to be considered and noted at the time of measurement
5.3 Treatment after the measurement
20 6 Measurement
6.1 Reference temperature
6.2 Measurement of temperature characteristics
6.3 Measurement under vibration
6.4 Measurement at the time of impact
6.5 Measurement in accelerated ageing
7 Other points to be noted
8 Miscellaneous
21 Annex A (normative)Calculation method for the amount of phase jitter
A.1 General
A.2 Explanation
A.3 Relations between phase noise and phase jitter
23 A.4 Commentary on theoretical positioning of phase jitter
A.5 Description
A.5.1 General
Figure A.1 – Concept diagram of SSB phase noise
24 A.5.2 RMS jitter
A.5.3 Peak-to-peak jitter
Figure A.2 – Voltage versus time
25 A.5.4 Random jitter
A.5.5 Deterministic jitter
A.5.6 Period (periodic) jitter
A.5.7 Data-dependent jitter
26 A.5.8 Total jitter
A.6 Points to be considered for measurement
A.6.1 Measurement equipment
Figure A.3 – Explanatory diagram of the amountof jitter applied to RMS jitter
27 A.6.2 Factors of measurement errors
Figure A.4 – Explanatory diagrams of random jitter,deterministic jitter, and total jitter
29 Bibliography

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BS EN 62884-2:2017
$142.49