BS EN IEC 55015:2019+A11:2020
$215.11
Limits and methods of measurement of radio disturbance characteristics of electrical lighting and similar equipment
Published By | Publication Date | Number of Pages |
BSI | 2020 | 84 |
PDF Catalog
PDF Pages | PDF Title |
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2 | undefined |
6 | Annex ZA(normative)Normative references to international publicationswith their corresponding European publications |
11 | English CONTENTS |
16 | FOREWORD |
18 | 1 Scope |
19 | 2 Normative references |
20 | 3 Terms, definitions and abbreviated terms 3.1 General 3.2 General terms and definitions |
21 | 3.3 Terms and definitions related to equipment |
25 | 3.4 Terms and definitions related to interfaces and ports |
27 | 3.5 Abbreviated terms Figures Figure 1 – EMC-ports of an EUT |
29 | 4 Limits 4.1 General 4.2 Frequency ranges Figure 2 – Generic depiction of the definitions of test-, ancillary-, auxiliary- and associated equipment w.r.t. EUT and the test/measurement environment(definitions given in CISPR 16-2-3) |
30 | 4.3 Limits and methods for the assessment of wired network ports 4.3.1 Electric power supply interface 4.3.2 Wired network interfaces other than power supply Tables Table 1 – Disturbance voltage limits at the electric power supply interface Table 2 – Disturbance voltage limits at wired network interfaces other than power supply |
31 | 4.4 Limits and methods for the assessment of local wired ports Table 3 – Disturbance current limits at wired network interfaces other than power supply Table 4 – Disturbance voltage limits of local wired ports: electrical power supply interface of non-restricted ELV lamps |
32 | 4.5 Limits and methods for the assessment of the enclosure port 4.5.1 General 4.5.2 Frequency range 9 kHz to 30 MHz Table 5 – Disturbance voltage limits at local wired ports: local wired ports other than electrical power supply interface of ELV lamp Table 6 – Disturbance current limits at local wired ports: local wired ports other than electrical power supply interface of ELV lamp |
33 | 4.5.3 Frequency range 30 MHz to 1 GHz Table 7 – Maximum EUT dimension that can be usedfor testing using LLAS with different diameters Table 8 – LLAS radiated disturbance limits in the frequency range 9 kHz to 30 MHz Table 9 – Loop antenna radiated disturbance limits in the frequency range 9 kHz to 30 MHz for equipment with a dimension > 1,6 m |
34 | 5 Application of the limits 5.1 General 5.2 Identification of the interfaces subject to test Table 10 – Radiated disturbance limits and associated measurement methodsin the frequency range 30 MHz to 1 GHz |
35 | 5.3 Application of limits to the interfaces 5.3.1 General 5.3.2 Conducted disturbance requirements for the wired network port 5.3.3 Conducted disturbance requirements for local wired ports 5.3.4 Radiated disturbance requirements for the enclosure port |
36 | 5.3.5 Multiple interfaces of the same type 5.3.6 Interfaces that can be categorised as multiple types of ports |
37 | 6 Product specific limit application requirements 6.1 General 6.2 Passive EUT 6.3 Rope lights 6.3.1 General 6.3.2 Requirements for rope lights 6.4 Modules 6.4.1 General |
38 | 6.4.2 Modules having multiple applications 6.4.3 Internal modules 6.4.4 External modules |
39 | 6.4.5 Single capped self-ballasted lamps 6.4.6 Double-capped self-ballasted lamps, double-capped lamp adapters, double-capped semi-luminaires and double-capped retrofit lamps used in fluorescent lamp luminaires 6.4.7 ELV lamps 6.4.8 Single-capped semi-luminaires 6.4.9 Independent igniters 6.4.10 Replaceable starters for fluorescent lamps |
40 | 7 Operating and test conditions of the EUT 7.1 General 7.2 Switching 7.3 Supply voltage and frequency 7.4 Rated lamp load and light regulation 7.5 Operating modes |
41 | 7.6 Ambient conditions 7.7 Lamps 7.7.1 Type of lamps used in lighting equipment 7.7.2 Ageing times 7.8 Stabilization times 7.9 Operation and loading of wired interfaces 7.9.1 General 7.9.2 Interface intended for a continuous signal or data transmission |
42 | 7.9.3 Interface not intended for a continuous signal or data transmission 7.9.4 Load 8 Methods of measurement of conducted disturbances 8.1 General 8.2 Measurement instrumentation and methods |
43 | 8.3 Electrical power supply interface disturbance measurement 8.4 Disturbance measurement of wired network interfaces other than power supply Table 11 – Overview of standardized conducted disturbance measurement methods |
44 | 8.5 Local wired port disturbance measurement 8.5.1 Electrical power supply of ELV lamps 8.5.2 Other than electrical power supply of ELV lamps 9 Methods of measurement of radiated disturbances 9.1 General 9.2 Intentional wireless transmitters |
45 | 9.3 Measurement instrumentation and methods 9.3.1 General 9.3.2 LLAS radiated disturbance measurement 9 kHz to 30 MHz Table 12 – Overview of standardized radiated disturbance measurement methods |
46 | 9.3.3 Loop antenna radiated disturbance measurement 9 kHz to 30 MHz 9.3.4 Radiated disturbance measurement 30 MHz to 1 GHz |
47 | 10 Compliance with this document 11 Measurement uncertainty 12 Test report |
48 | Figure 3 – EUT and its physical interfaces |
49 | Figure 4 – Decision process on the application of limits to the EUT |
50 | Figure 5 – Example of a host system with different types of modules |
51 | Annexes Annex A (normative) Product specific application notes referring to particular measurement set-ups or operating conditions A.1 Single-capped self-ballasted lamps A.1.1 Arrangement for conducted disturbance measurements A.1.2 Arrangement for radiated disturbance measurements A.2 Semi-luminaires A.3 Rope lights A.3.1 Preparation of the EUT |
52 | A.3.2 Arrangement for conducted disturbance measurements A.3.3 Arrangement for radiated disturbance measurements A.4 Double-capped lamp adapters, double-capped self-ballasted lamps, double-capped semi-luminaires and double-capped retrofit lamps used in fluorescent lamp luminaires A.4.1 For application in linear luminaires with electromagnetic controlgear A.4.2 For application in linear luminaires with electronic controlgear A.4.3 For application in other than linear luminaires A.4.4 Measurement methods |
53 | A.5 ELV lamps A.5.1 Conducted disturbance test A.5.2 Radiated disturbance tests A.6 Independent igniters |
54 | Figure A.1 – Reference luminaire for double-capped lamp adapter, double-capped self-ballasted lamp, double-capped semi-luminaire and double-capped retrofit lamp used in linear fluorescent lamp luminaires (see A.4.1) |
55 | Figure A.2 – Conical metal housing for single capped lamps (see A.1.1) |
56 | Figure A.3 – Arrangements for conducted disturbance measurements from non-restricted ELV lamps (see A.5.1) |
57 | Figure A.4 – Arrangements for conducted disturbance measurements from restricted ELV lamps (see A.5.1) |
58 | Figure A.5 – Hose-clamp reference luminaire for self-ballasted lamps with a GU10 bayonet cap (see A.1.1) Figure A.6 – Support plate for arranging long cablesand rope lights (see 9.3.2, Clauses A.3 and B.3) |
59 | Annex B (normative) Test arrangements for conducted disturbance measurements B.1 General B.2 Arrangement of cables connected to interfaces of wired network ports B.2.1 Arrangements of electric power supply cables B.2.2 Arrangement of other than electric power supply cables |
60 | B.3 Arrangement of cables connected to interfaces of local wired ports B.3.1 General B.3.2 Cables of local-wired ports indirectly connected to a network B.3.3 Cables of local-wired ports other than the type mentioned in B.3.2 |
61 | B.3.4 Power-supply cables of an ELV lamp B.3.5 Arrangement of measurement probes B.4 Loading and termination of cables B.5 Luminaires |
62 | B.6 Modules |
63 | Figure B.1 – Circuit for measuring conducted disturbances from a luminaire (Figure B.1a), an internal/mounted/replaceable module (Figure B.1b) and a single capped self-ballasted or independent non-gas-discharge lamp Figure B.1c) |
64 | Figure B.2 – Circuit for measuring conducted disturbances from an external module |
65 | Figure B.3 – Measuring arrangements for conducted disturbances (see Clause B.5) |
66 | Annex C (normative) Test arrangements for radiated disturbance measurements C.1 General C.2 Arrangements of electric power supply cables C.3 Arrangement of cables other than electric power supply cables C.4 Arrangements of EUT, auxiliary equipment and associated equipment C.4.1 General C.4.2 EUT arrangements for table-top, wall-mounted or ceiling-mounted applications C.4.3 EUT arrangements for floor-standing and pole-mounted applications C.5 Loading and termination of cables |
67 | Figure C.1 – EUT arrangement of ceiling-, wall-mounted and table-top applications during the radiated (OATS, SAC or FAR) disturbance measurement |
68 | Figure C.2 – EUT arrangement of floor-standing and pole-mounted applications during the radiated (OATS, SAC or FAR) disturbance measurement Figure C.3 – Example of arrangement of a luminaire during the radiated (OATS, SAC or FAR) disturbance measurement |
69 | Figure C.4 – Example of arrangement of an internal module during the radiated (OATS, SAC or FAR) disturbance measurement Figure C.5 – Example of arrangement of an external module during the radiated (OATS, SAC or FAR) disturbance measurement |
70 | Annex D (informative) Examples of application of limits and test methods D.1 General D.2 Case 1: Power controlgear with remote battery connection D.2.1 EUT description D.2.2 Interfaces, ports and limits Figure D.1 – Case 1 EUT |
71 | D.3 Case 2: Universal presence and light detector D.3.1 EUT description D.3.2 Interfaces, ports and limits Table D.1 – Case 1: Summary of interfaces, applicable ports and limits |
72 | Figure D.2 – Case 2 EUT Table D.2 – Case 2 – Application 1: Summary of interfaces, applicable ports and limits |
73 | D.4 Case 3: Driver with three load interfaces D.4.1 EUT description D.4.2 Interfaces, ports and limits Table D.3 – Case 2 – Application 2: Summary of interfaces, applicable ports and limits |
74 | Figure D.3 – Case 3 EUT Table D.4 – Case 3: Summary of interfaces, applicable ports and limits |
75 | D.5 Case 4: Ethernet powered OLED D.5.1 EUT description D.5.2 Interfaces, ports and limits D.6 Case 5: Stand-alone occupancy-daylight sensor D.6.1 EUT description Figure D.4 – Case 4 EUT Table D.5 – Case 4: Summary of interfaces, applicable ports and limits |
76 | D.6.2 Interfaces, ports and limits Figure D.5 – Case 5 EUT Table D.6 – Case 5: Summary of interfaces, applicable ports and limits |
77 | Annex E (informative) Statistical considerations in the determination of EMC compliance of mass-produced products E.1 General E.2 Test method based on a general margin to the limit |
78 | E.3 Test method based on the non-central t-distribution E.3.1 Practical implementation by using frequency sub-ranges Table E.1 – General margin to the limit for statistical evaluation |
79 | E.3.2 Frequency sub-ranges Table E.2 – Sample size and corresponding k factor in a non-central t-distribution |
80 | E.3.3 Data distortion occurring at a sub-range boundary E.4 Test method based on the binomial distribution Figure E.1 – Illustration of difficulties in case the maximum valueof the disturbance is at the boundary of a sub-range Table E.3 – Application of the binomial distribution |
81 | E.5 Application of larger sample size |
82 | Bibliography |