BS EN IEC 60669-2-1:2022+A11:2022:2023 Edition
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Switches for household and similar fixed electrical installations – Particular requirements. Electronic control devices
Published By | Publication Date | Number of Pages |
BSI | 2023 | 146 |
PDF Catalog
PDF Pages | PDF Title |
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2 | undefined |
5 | Annex ZA (normative)Normative references to international publicationswith their corresponding European publications |
9 | English CONTENTS |
13 | FOREWORD |
15 | 1 Scope |
16 | 2 Normative references |
18 | 3 Terms and definitions |
22 | 4 General requirements 5 General remarks on tests |
23 | Tables Table 1 – Number of specimens needed for the tests |
25 | 6 Ratings 7 Classification |
27 | 8 Marking |
30 | 9 Checking of dimensions 10 Protection against electrical shock |
33 | 11 Provision for earthing 12 Terminals |
34 | 13 Constructional requirements |
36 | 14 Mechanism 15 Resistance to ageing, protection provided by enclosures of switches and resistance to humidity 16 Insulation resistance and electric strength Table 15 – Test voltage, points of application and minimum values of insulating resistance for the verification of electric strength |
38 | 17 Temperature rise |
40 | Table 101 – Permissible temperature rise values |
42 | 18 Making and breaking capacity |
43 | Table 102 – Application of tests for making and breaking capacity and normal operation for electronic switches and HBES/BACS switches according to 7.102.2 |
44 | 19 Normal operation |
47 | Table 103 – Relationship between rated current and capacitance |
49 | Table 104 – Values for Ipeak and I2t depending on the type of distribution system |
50 | Table 105 – Calculated circuit parameters |
51 | 20 Mechanical strength Table 106 – Test loads for HBES/BACS switches for heating installations |
52 | 21 Resistance to heat 22 Screws, current-carrying parts and connections 23 Creepage distances, clearances and distances through sealing compound Table 23 – Creepage distances, clearances and distancesthrough insulating sealing compound |
54 | Figures Figure 101 – Protective separation between circuits |
55 | Table 107 – Relation between the rated voltage of the HBES/BACS switch,the rated insulation voltage and the rated impulse voltage |
56 | Table 108 – Minimum clearances without verification test |
57 | Table 109 – Test voltages and corresponding altitudes Table 110 – Minimum clearances with verification test |
58 | Table 111 – Minimum creepage distances of basic, supplementary and reinforced insulation without verification test for clearances Table 112 – Minimum creepage distances of basic, supplementary and reinforced insulation with verification test for clearances |
59 | 24 Resistance of insulating material to abnormal heat, to fire and to tracking 25 Resistance to rusting 26 EMC requirements |
61 | Table 113 – Immunity tests (overview) |
62 | Table 114 – Voltage dip and short-interruption test values |
63 | Table 115 – Surge immunity test voltages |
64 | Table 116 – Fast transient test values |
66 | Table 117 – Values for radiated electromagnetic field test of IEC 61000-4-3a |
69 | 101 Abnormal conditions Table 118 – Measurement methods |
71 | Table 119 – Protection methods and test conditions |
74 | 102 Components |
75 | Table 120 – Capacitors |
78 | 103 Electromagnetic fields (EMF) |
79 | Figure 102 – Current path tested in the looping through circuit Figure 103 – Circuit diagram for testing electronic switchesand HBES/BACS switches according to 17.101 and 101.4 |
80 | Figure 104 – Minimum creepage and clearances on printed circuit boards |
81 | Figure 105 – Surge test |
82 | Figure 106 – Test pin for checking the protection against electric shock |
83 | Annexes Annex A (normative)Replacement of title to Annex A as follows:Additional requirements for electronic control devices havingfacilities for the outlet and retention of flexible cables Table A.101 – Maximum current and minimum cross-sectional area |
84 | Annex B (informative)Changes planned for the future in order to align IEC 60669-1 with the requirements of IEC 60998 (all parts), IEC 60999 (all parts) and IEC 60228 |
85 | Annex C (informative)Circuit development (19.3) |
86 | Annex D (informative)Additional requirements for insulation-piercing terminals |
87 | Annex E (informative)Additional requirements and tests for switches intendedto be used at a temperature lower than −5 °C |
90 | Table E.101 – Energy for impact tests |
92 | Annex AA (informative)Examples of types of electronic switchesor HBES/BACS switches and their functions Table AA.1 – Functions overview |
93 | Annex BB (informative)Circuit development: 19.106 explained Table BB.1 – Lamp |
94 | Figure BB.1 – 120 V 15 W (LT spice model) |
95 | Figure BB.2 – 230 V 15 W (LT spice model) |
96 | Figure BB.3 – Model for multiple lamp loads |
97 | Figure BB.4 – Ipeak and I2t for multiple lamp loads |
98 | Annex CC (normative)Additional requirements for electronic control devicesusing DLT-technology in accordance with IEC 62756-1 |
100 | Annex DD (informative)Test set-ups Figure DD.1 – Test setup for AC mains connection according to IEC 61000-4-4 |
101 | Figure DD.2 – Test setup for bus and DC mains connection according to IEC 61000�4�4 |
102 | Figure DD.3 – Test setup for AC mains connection according to IEC 61000-4-5 |
103 | Figure DD.4 – Test setup for bus and DC mains connection according to IEC 61000�4�5 |
104 | Figure DD.5 – Test setup for the ESD according to IEC 61000-4-2 |
105 | Figure DD.6 – Test setup for AC mains connection according to IEC 61000-4-6 |
106 | Figure DD.7 – Test setup for bus and DC mainsconnection according to IEC 61000�4�6 |
107 | Annex EE (informative)Electrical interface specification for phase-cut dimmerin phase-cut dimmed lighting systems |
110 | Figure EE.1 – Example of wiring diagram |
113 | Figure EE.2 – Timing leading edge dimming method |
114 | Table EE.1 – Nominal mains voltage 100 V – Frequency 50 Hz or 60 Hz Table EE.2 – Nominal mains voltage 120 V – Frequency 50 Hz or 60 Hz Table EE.3 – Nominal mains voltage 200 V – Frequency 50 Hz or 60 Hz Table EE.4 – Nominal mains voltage 230 V – Frequency 50 Hz or 60 Hz Table EE.5 – Nominal mains voltage 277 V – Frequency 50 Hz or 60 Hz |
115 | Table EE.6 – Slew rate for voltage decrease across the phase-cut dimmer |
116 | Table EE.7 – Nominal mains voltage 100 V – Frequency 50 Hz or 60 Hz Table EE.8 – Nominal mains voltage 120 V – Frequency 50 Hz or 60 Hz Table EE.9 – Nominal mains voltage 200 V – Frequency 50 Hz or 60 Hz Table EE.10 – Nominal mains voltage 230 V – Frequency 50 Hz or 60 Hz |
117 | Table EE.11 – Nominal mains voltage 277 V – Frequency 50 Hz or 60 Hz |
118 | Figure EE.3 – Timing trailing edge dimming method |
119 | Table EE.12 – Nominal mains voltage from 100 V to 277 V – Frequency 50 Hz or 60 Hz |
120 | Table EE.13 – Nominal mains moltage 100 V – Frequency 50 Hz or 60 Hz Table EE.14 – Nominal mains voltage 120 V – Frequency 50 Hz or 60 Hz Table EE.15 – Nominal mains voltage 200 V – Frequency 50 Hz or 60 Hz |
121 | Table EE.16 – Nominal mains voltage 230 V – Frequency 50 Hz or 60 Hz Table EE.17 – Nominal mains voltage 277 V – Frequency 50 Hz or 60 Hz |
122 | Table EE.18 – Currents and voltages for controlgear during the electronic off state |
123 | Table EE.19 – Parameters for testing purposes |
124 | Figure EE.4 – Circuit to test the properties of the phase-cutdimmer during the non-conducting phase (Method 1) |
125 | Figure EE.5 – Circuit to test the properties of the phase-cutdimmer during the non-conducting phase (Method 2) |
126 | Figure EE.6 – Circuit to test the properties of the phase-cut dimmer during the transition from the non-conducting to the conducting phase |
128 | Figure EE.7 – Circuit to test the properties of the phase-cutdimmer during the electronic off-state |
129 | Figure EE.8 – Waveform of AC voltage source – Leading edge Figure EE.9 – Waveform of AC voltage source – Trailing edge |
130 | Figure EE.10 – Equivalent circuit for controlgear in the on state to be used during dimmer tests |
131 | Figure EE.11 – Equivalent circuit for controlgear being in off state |
132 | Table EE.20 – Parameters for testing purposes |
134 | Figure EE.12 – Test enclosure Figure EE.13 – Geometry of microphone placement in regard to device under test |
135 | Figure EE.14 – Test circuit to test stability of phase angle |
136 | Figure EE.15 – Possibilities for proper triggering |
137 | Figure EE.16 – Equivalent circuit EC_CG2 |
138 | Annex FF (normative)Requirements for electronic RCS and electronic TDS that provide the function, markings and connection configuration in accordance with IEC 60669-2-2 and IEC 60669-2-3 |
143 | Bibliography |