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BS EN IEC 60749-5:2024 – TC

BS EN IEC 60749-5:2024 – TC

$134.27

Tracked Changes. Semiconductor devices. Mechanical and climatic test methods – Steady-state temperature humidity bias life test

Published By Publication Date Number of Pages
BSI 2024 34
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IEC 60749-5:2023 is available as IEC 60749-5:2023 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 60749-5:2023 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments. This test method is considered destructive. This edition includes the following significant technical changes with respect to the previous edition: a) The specification of the test equipment is changed to require the need to minimize relative humidity gradients and maximize air flow between semiconductor devices under test; b) The specification of the test equipment fixtures is changed to require the avoidance of condensation on devices under test and on electrical fixtures connecting the devices to the test equipment; c) replacement of references to “virtual junction” with “die”.

PDF Catalog

PDF Pages PDF Title
21 undefined
24 Annex ZA (normative)Normative references to international publicationswith their corresponding European publications
25 English
CONTENTS
26 FOREWORD
28 1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Equipment
5.1 Equipment summary
29 5.2 Temperature and relative humidity
5.3 Devices under stress
5.4 Minimizing release of contamination
5.5 Ionic contamination
5.6 Deionized water
6 Test conditions
6.1 Test conditions summary
6.2 Temperature, relative humidity and duration
Table 1 – Temperature, relative humidity and duration
30 6.3 Biasing guidelines
6.4 Biasing choice and reporting
Table 2 – Criteria for choosing continuous or cyclical bias
31 7 Procedures
7.1 Mounting
7.2 Ramp-up
7.3 Ramp-down
7.4 Test clock
7.5 Bias
7.6 Read-out
7.7 Handling
32 8 Failure criteria
9 Safety
10 Summary

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BS EN IEC 60749-5:2024 - TC
$134.27