BS EN IEC 61000-4-20:2022 – TC
$280.87
Tracked Changes. Electromagnetic compatibility (EMC) – Testing and measurement techniques. Emission and immunity testing in transverse electromagnetic (TEM) waveguides
| Published By | Publication Date | Number of Pages |
| BSI | 2022 | 276 |
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | 30455902 |
| 157 | A-30350430 |
| 158 | undefined |
| 161 | Annex ZA (normative)Normative references to international publicationswith their corresponding European publications |
| 162 | Blank Page |
| 163 | English CONTENTS |
| 168 | FOREWORD |
| 170 | INTRODUCTION |
| 171 | 1 Scope |
| 172 | 2 Normative references 3 Terms, definitions and abbreviated terms 3.1 Terms and definitions |
| 175 | 3.2 Abbreviated terms |
| 176 | 4 General 5 TEM waveguide requirements 5.1 General |
| 177 | 5.2 General requirements for the use of TEM waveguides 5.2.1 Test volume and maximum EUT size 5.2.2 Validation of usable test volume |
| 179 | Tables Table 1 – Values k for expanded uncertainty with normal distribution |
| 184 | 5.3 Special requirements and recommendations for certain types of TEM waveguides 5.3.1 Set-up of open TEM waveguides 5.3.2 Alternative TEM mode verification for a two-port TEM waveguide 5.3.3 TEM mode generation for a four-port TEM waveguide |
| 185 | 5.4 Figures for Clause 5 Figures Figure 1 – Flowchart of TEM mode and field uniformity verification procedurewith the “constant forward power” method (see 5.2.2.4.1) |
| 186 | Figure 2 – Flowchart of TEM mode and field uniformity verification procedurewith the “constant field strength” method (see 5.2.2.4.2) |
| 187 | 6 Overview of EUT types 6.1 General 6.2 Small EUT 6.3 Large EUT 7 Laboratory test conditions 7.1 General 7.2 Climatic conditions 7.3 Electromagnetic conditions |
| 188 | 8 Evaluation and reporting of test results |
| 189 | Annex A (normative)Emission measurements in TEM waveguides A.1 Overview A.2 Test equipment A.3 Correlating TEM waveguide voltages to electric field strength data A.3.1 General |
| 190 | A.3.2 Correlation algorithms |
| 194 | A.4 Emission measurement correction factors A.4.1 Reference emission sources |
| 195 | A.4.2 Arrangement of small EUTs A.4.3 Calculation of the small EUT correction factor |
| 198 | A.5 Emission measurement procedures in TEM waveguides A.5.1 EUT types A.5.2 EUT arrangement |
| 199 | A.6 Test report |
| 200 | A.7 Figures for Annex A Figure A.1 – Routing the exit cable to the corner at the ortho-angleand the lower edge of the test volume in a TEM waveguide (see A.5.2) |
| 201 | Figure A.2 – Basic ortho-axis EUT positioner or manipulator(see 3.1.13, A.4.2, A.5.1.2, A.5.2) |
| 202 | Figure A.3 – Die pattern and axis alignment for an EUT [26] (see A.3.2.3.2) |
| 203 | Figure A.4 – Non-redundant twelve-face and axis orientationsfor a typical EUT [26] (see A.3.2.3.2) |
| 204 | Figure A.5 – Open-area test site (OATS) emission measurements geometry (see A.3.2.4) |
| 205 | Annex B (normative)Immunity testing in TEM waveguides B.1 Overview B.2 Test equipment B.2.1 General B.2.2 Description of the test facility |
| 206 | B.3 Field uniformity area calibration B.4 Test levels B.5 Test set-up B.5.1 Arrangement of table-top equipment Table B.1 – Uniform area calibration points Table B.2 – Test levels |
| 207 | B.5.2 Arrangement of floor-standing equipment B.5.3 Arrangement of wiring B.6 Test procedures B.7 Test results and test report |
| 208 | B.8 Figures for Annex B Figure B.1 – Example of test set-up for single-polarization TEM waveguide(see Clause B.5) |
| 209 | Figure B.2 – Uniform area calibration points in a TEM waveguide (see Clause B.3) |
| 210 | Annex C (normative)HEMP transient testing in TEM waveguides C.1 Overview C.2 Immunity tests C.2.1 General |
| 211 | C.2.2 Radiated test facilities Table C.1 – Radiated immunity test levels definedfor this document |
| 212 | C.2.3 Frequency domain spectrum requirements C.3 Test equipment |
| 213 | C.4 Test set-up C.5 Test procedure C.5.1 General |
| 214 | C.5.2 Severity level and test exposures C.5.3 Test procedure |
| 215 | C.5.4 Test execution C.5.5 Execution of the radiated immunity test |
| 216 | C.6 Figure for Annex C Figure C.1 – Pulse waveform frequency domain spectral magnitudebetween 100 kHz and 300 MHz (see C.2.1) |
| 217 | Annex D (informative)TEM waveguide characterization D.1 Overview D.2 Distinction between wave impedance and characteristic impedance |
| 218 | D.3 TEM wave D.3.1 General D.3.2 Free-space TEM mode D.3.3 Waveguides |
| 219 | D.4 Wave propagation D.4.1 General D.4.2 Spherical propagation D.4.3 Plane wave propagation in free space D.4.4 Velocity of propagation D.5 Polarization |
| 220 | D.6 Types of TEM waveguides D.6.1 General |
| 221 | D.6.2 Open TEM waveguides (striplines, etc.) D.6.3 Closed TEM waveguides (TEM cells) D.7 Frequency limitations |
| 222 | D.8 Figures for Annex D Figure D.1 – Simple waveguide (no TEM mode) (see D.3.3) Figure D.2 – Example of waveguides supporting TEM-mode propagation (see D.3.3) Figure D.3 – E-field polarization vector (see Clause D.5) |
| 223 | Figure D.4 – Simple transmission line model for TEM mode propagation (see D.6.1) Figure D.5 – One- and two-port TEM waveguide concepts (see D.6.1) Figure D.6 – Operation of four-port TEM waveguides (see D.6.1) |
| 224 | Figure D.7 – Two-port TEM cell (symmetric septum) (see D.6.1 and D.6.3) |
| 225 | Figure D.8 – One-port TEM cell (asymmetric septum) (see D.6.1 and D.6.3) |
| 227 | Figure D.9 – Stripline (two plates) (see D.6.1 and D.6.2) |
| 228 | Figure D.10 – Stripline (four plates, balanced feed) (see D.6.1) |
| 229 | Figure D.11 – Four-port TEM waveguide (symmetric parallel septa) (see D.6.1 and D.6.3) |
| 230 | Annex E (informative)Calibration method for E-field probes in TEM waveguides E.1 Overview E.2 Probe calibration requirements E.2.1 General E.2.2 Calibration frequency range |
| 231 | E.2.3 Calibration volume E.2.4 Probe dimensions E.2.5 Perturbations of TEM waveguide fields due to the probe |
| 232 | E.2.6 Frequency steps E.2.7 Field strength E.3 Requirements for calibration instrumentation E.3.1 Specifications of TEM waveguide Table E.1 – Calibration frequencies Table E.2 – Calibration field strength level |
| 233 | E.3.2 Harmonics and spurious signals E.3.3 Probe fixture E.3.4 Measuring net power to a transmitting device using directional couplers |
| 234 | E.4 E-field probe calibration E.4.1 Calibration methods E.4.2 Calibration procedure using a two-port TEM waveguide |
| 235 | E.4.3 Calibration procedure using one-port TEM waveguide |
| 238 | E.5 Figures for Annex E Figure E.1 – Example of test points for calibration volume validation (see E.2.3) Figure E.2 – Set-up for validation of probe perturbation (see E.2.5) Figure E.3 – Set-up for measuring net power toa transmitting device (not to scale) (see E.3.4) |
| 239 | Figure E.4 – Example set-up for E-field probecalibration with two-port TEM waveguide (see E.4.2) Figure E.5 – Example set-up for E-field probe calibration withone-port TEM waveguide and alternative method (see E.4.3.2) Figure E.6 – Equivalent circuit of monopole antennaand measuring apparatus (see E.4.3.3) |
| 240 | Annex F (informative)Instrumentation uncertainty of emission measurement results F.1 Radiated disturbance measurements using a TEM waveguide F.1.1 Measurand for radiated disturbance measurements using a TEM waveguide F.1.2 Symbols of input quantities common to all disturbance measurements F.1.3 Symbols of input quantities specific to TEM waveguide measurements F.2 Input quantities to be considered for radiated disturbance measurements using a TEM waveguide |
| 241 | F.3 Uncertainty budget and rationale for the input quantities for radiated disturbance measurements using a TEM waveguide F.3.1 Uncertainty budget for radiated disturbance measurements using a TEM waveguide Table F.1 – Uncertainty budget for radiated disturbance measurement resultsusing a TEM waveguide from 30 MHz to 1 000 MHz (example) |
| 242 | F.3.2 Rationale for the estimates of input quantities for radiated disturbance measurements using a TEM waveguide Table F.2 – Uncertainty budget for radiated disturbance measurement resultsusing a TEM waveguide from 1 GHz to 6 GHz (example) |
| 244 | Table F.3 – Values of Slim for 30 MHz to 1 000 MHz |
| 245 | Table F.4 – Values of Slim for 1 GHz to 6 GHz |
| 248 | F.4 Figures for Annex F Figure F.1 – Deviation of the QP detector level indication from the signal level at receiver input for two cases, a sine-wave signal and an impulsive signal with a pulse repetition frequency of 100 Hz |
| 249 | Figure F.2 – Deviation of the peak detector level indication from the signal level at receiver input for two cases, a sine-wave signal and an impulsive signal with a pulse repetition frequency of 100 Hz |
| 250 | Annex G (informative)Measurement uncertainty of immunity testingdue to test instrumentation G.1 General symbols G.2 Symbol and definition of the measurand G.3 Symbols for input quantities G.4 Example: Uncertainty budget for immunity test |
| 251 | G.5 Rationale for the estimates of input quantities Table G.1 – Example uncertainty budget of the immunity test level |
| 254 | Annex H (informative)Correlation of emission and immunity limitsbetween EMC test facilities H.1 Overview H.2 Dipole in free space (representing FAR set-up) |
| 256 | H.3 Dipole in half space (representing OATS or SAC set-up) |
| 257 | H.4 Dipole in a TEM-mode transmission line |
| 258 | H.5 Dipole in a reverberation chamber |
| 259 | H.6 Correlation |
| 260 | H.7 Example of emission limits Table H.1 – Summary of the emission correlation parameters |
| 261 | H.8 Figures for Annex H Figure H.1 – Representation of a short centre-fed dipole anda more general source representing an EUT (see Clause H.2) Figure H.2 – Vertical source and receiving dipoles located overa perfectly-conducting ground plane of infinite extent (see Clause H.3) |
| 262 | Figure H.3 – Two types of TEM cells with a vertically polarized dipole sourceand the source to receive port geometry defined (see Clause H.4) Figure H.4 – Reverberation chamber with a source dipole, a stirrer torandomize the fields, and a general receive antenna (see Clause H.5) |
| 263 | Figure H.5 – TEM waveguide Class A and Class B emission limits correlatedfrom CISPR 32 [68] (see Clause H.7) |
| 264 | Annex I (informative)TEM waveguide transient characterization I.1 Overview I.2 Test equipment I.3 Test set-up |
| 265 | I.4 TEM waveguide characterization by correlation |
| 266 | I.5 Quantification of the Pcc I.6 Performable transient test signals |
| 267 | I.7 Figures for Annex I Figure I.1 – Test set-up |
| 268 | Figure I.2 – Signal windowing Figure I.3 – Example of a heatmap – Pcc for a test point in the uniform area |
| 269 | Bibliography |
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