🔥🔥 Don’t Miss Out on Our End of Autumn Sale. If you have any questions, feel free to click the bottom right corner to contact our customer service..

Concat us[email protected]
Shopping Cart

No products in the cart.

🔍
BS EN IEC 61000-4-6:2023 – TC

BS EN IEC 61000-4-6:2023 – TC

$280.87

Tracked Changes. Electromagnetic compatibility (EMC) – Testing and measurement techniques. Immunity to conducted disturbances, induced by radio-frequency fields

Published By Publication Date Number of Pages
BSI 2023 218
PDF Format Searchable Printable Preview Now
Guaranteed Safe Checkout
Categories: ,

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

This part of IEC 61000 relates to the conducted immunity requirements of electrical and electronic equipment to electromagnetic disturbances coming from intended radio-frequency (RF) transmitters in the frequency range 150 kHz up to 80 MHz. NOTE 1 Product committees might decide to use the methods described in this document also for frequencies up to 230 MHz (see Annex B) although the methods and test instrumentation is intended to be used in the frequency range up to 80 MHz. Equipment not having at least one conducting wire and/or cable (such as mains supply, signal line or earth connection) which can couple the equipment to the disturbing RF fields is excluded from the scope of this publication. NOTE 2 Test methods are specified in this part of IEC 61000 to assess the effect that conducted disturbing signals, induced by electromagnetic radiation, have on the equipment concerned. The simulation and measurement of these conducted disturbances are not adequately exact for the quantitative determination of effects. The test methods specified are structured for the primary objective of establishing adequate repeatability of results at various facilities for quantitative analysis of effects. The object of this standard is to establish a common reference for evaluating the functional immunity of electrical and electronic equipment when subjected to conducted disturbances induced by RF fields. The test method documented in this part of IEC 61000 describes a consistent method to assess the immunity of an equipment or system against a specified phenomenon. NOTE 3 As described in IEC Guide 107, this standard is a basic EMC publication for use by product committees of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity test standard should be applied or not, and if applied, they are responsible for determining the appropriate test levels and performance criteria.

PDF Catalog

PDF Pages PDF Title
1 compares BS EN IEC 61000-4-6:2023
2 TRACKED CHANGES
Text example 1 — indicates added text (in green)
132 undefined
135 Annex ZA (normative)Normative references to international publicationswith their corresponding European publications
136 CONTENTS
140 FOREWORD
142 INTRODUCTION
143 1 Scope
2 Normative references
3 Terms and definitions
145 4 General
146 Figures
Figure 1 – Diagram showing EM fields near the EUT due to common-mode currents on its cables
147 5 Test levels
Figure 2 – Schematic setup for immunity test to RF conducted disturbances
148 Figure 3 – Example of unmodulated and modulated RF signal
Tables
Table 1 – Test levels
149 6 Test equipment and level adjustment procedure
6.1 Test generator
Table 2 – Characteristics of the test generator
150 6.2 Coupling and decoupling devices
6.2.1 General
Figure 4 – Test generator setup
Table 3 – Main parameter of the combination of the coupling and decoupling device
151 Figure 5 – Principle of coupling and decoupling – Symbols used for the indicated setup principles
Figure 6 – Principle of coupling and decoupling – Principle of direct injection to screened cables
152 6.2.2 Coupling/decoupling networks (CDNs)
Figure 7 – Principle of coupling and decoupling – Principle of coupling to unscreened cables according to the CDN method
Figure 8 – Principle of coupling and decoupling – Principle of decoupling
153 Table 4 – Usage of CDNs
154 6.2.3 Clamp injection devices
155 Figure 9 – Example of circuit for level-setting setup in a 150 Ω test jig
Figure 10 –Example of circuit for evaluating the transmission lossof the current clamp level-setting
156 6.2.4 Direct injection devices
6.2.5 Decoupling networks
6.3 Verification of the common-mode impedance at the EUT port of coupling and decoupling devices
6.3.1 General
157 6.3.2 Insertion loss of the 150 Ω to 50 Ω adapters
Figure 11 – Example of the setup geometry to verify the impedance characteristics of the coupling and decoupling devices
158 Figure 12 – Setup principle to verify Zce of the coupling and decoupling device
Figure 13 – Setup principle for measuring the insertion loss of two 150 Ω to 50 Ω adapters
Figure 14 – Circuit and construction of the 150 Ω to 50 Ω adapter
159 6.4 Setting of the test generator
6.4.1 General
6.4.2 Setting of the output level at the EUT port of the coupling device
160 Figure 15 – Definition of a common-mode point for unscreened and screened cables
161 7 Test setup and injection methods
7.1 Test setup
Figure 16 – Setup for level-setting at the EUT port of the coupling/decoupling devices
162 7.2 EUT comprising a single unit
Figure 17 – Example of test setup with a single unit EUT with only one CDN for injection (top view)
163 Figure 18 – Example of test setup with a single unit EUT (top view) using multiple CDNs
164 7.3 EUT comprising several units
Figure 19 – Example of a test setup with a multi-unit EUT (top view)
165 7.4 Rules for selecting injection methods and test points
7.4.1 General
7.4.2 Injection method
Figure 20 – Rules for selecting the injection method
166 7.4.3 Ports to be tested
7.5 CDN injection application
168 7.6 Clamp injection application
Figure 21 – Immunity test for two-port EUT (when only one CDN can be used)
169 Figure 22 – General principle of a test setup using clamp injection devices
170 7.7 Direct injection application
8 Test procedure
Figure 23 – Example of the test unit locations on the ground plane when using injection clamps (top view)
171 9 Evaluation of the test results
172 10 Test report
173 Annexes
Annex A (normative) EM and decoupling clamps
A.1 EM clamps
A.1.1 General
A.1.2 Specification of EM clamps
174 Figure A.1 – Example: Construction details of the EM clamp
175 A.2 EM clamp characterization
A.2.1 Specification of the clamp test jig
Figure A.2 – Example: Concept of the EM clamp
176 A.2.2 Clamp characterization
Figure A.3 – Dimension of a reference plane
Figure A.4 – Test jig
Figure A.5 – Test jig with inserted clamp
177 Figure A.6 – Impedance / decoupling factor measurement setup
179 Figure A.7 – Typical examples for clamp impedance, three typical clamps
Figure A.8 – Typical examples for decoupling factors, three typical clamps
180 Figure A.9 – Normalization setup for coupling factor measurement
Figure A.10 – S21 coupling factor measurement setup
181 A.3 Decoupling clamp characterization
A.3.1 General
A.3.2 Specification of decoupling clamps
A.3.3 Impedance
Figure A.11 – Typical examples for coupling factor, three typical clamps
182 A.3.4 Decoupling factor
Figure A.12 – Decoupling clamp characterization measurement setup
Figure A.13 – Typical examples for the decoupling clamp impedance
183 Figure A.14 – Typical examples for decoupling factors
184 Annex B (informative) Selection criteria for the frequency range of application
Table B.1 – Main parameter of the combination of the coupling and decoupling device when the frequency range of the test is extended above 80 MHz
185 Figure B.1 – Start frequency as function of cable length and equipment size
186 Annex C (informative) Guidelines for selecting test levels
187 Annex D (informative) Information on coupling and decoupling networks
D.1 Basic features of the coupling and decoupling networks
D.2 Examples of coupling and decoupling networks
188 Figure D.1 – Example of a simplified diagram for the circuit of CDN-S1 used with screened cables (see 6.2.2.5)
Figure D.2 – Example of simplified diagram for the circuit of CDN-M1, CDN-M2 andCDN-M3 used with unscreened supply (mains) lines (see 6.2.2.2)
189 Figure D.3 – Example of a simplified diagram for the circuit of CDN-AF2 used with unscreened unbalanced lines (see 6.2.2.4)
Figure D.4 – Example of a simplified diagram for the circuit of CDN-T2, used with an unscreened balanced pair (see 6.2.2.3)
190 Figure D.5 – Example of a simplified diagram of the circuit of CDN-T4 used with unscreened balanced pairs (see 6.2.2.3)
Figure D.6 – Example of a simplified diagram of the circuit of CDN AF8 used with unscreened unbalanced lines (see 6.2.2.4)
191 Figure D.7 – Example of a simplified diagram of the circuit of CDN-T8 used with unscreened balanced pairs (see 6.2.2.3)
192 Annex E (informative) Information for the test generator specification
Table E.1 – Required power amplifier output power to obtain a test level of 10 V
193 Annex F (informative) Test setup for large EUTs
F.1 General
F.2 Test setup for large EUTs
194 Figure F.1 – Example of large EUT test setup with elevated horizontal reference ground plane
195 Figure F.2 – Example of large EUT test setup with vertical reference ground plane
196 Annex G (informative) Measurement uncertainty of the voltage test level
G.1 General
G.2 General symbols
G.3 Uncertainty budgets for test methods
G.3.1 Definition of the measurand
197 G.3.2 MU contributors of the measurand
Figure G.1 – Example of influences upon voltage test level using CDN
Figure G.2 – Example of influences upon voltage test level using EM clamp
Figure G.3 – Example of influences upon voltage test level using current clamp
198 G.3.3 Input quantities and calculation examples for expanded uncertainty
Figure G.4 – Example of influences upon voltage test level using direct injection
199 Figure G.5 – Circuit for level-setting setup of CDN
Table G.1 – CDN level-setting process
Table G.2 – CDN test process
201 Table G.3 – EM clamp level-setting process
202 Table G.4 – EM clamp test process
203 Table G.5 – Current clamp level-setting process
Table G.6 – Current clamp test process
204 Table G.7 – Direct injection level-setting process
205 G.4 Expression of the calculated measurement uncertainty and its application
Table G.8 – Direct injection test process
207 Annex H (informative) Testing with multiple signals
H.1 General
H.2 Intermodulation
Figure H.1 – Test frequencies f1 and f2 and intermodulation frequencies of the second and third order
208 H.3 Power requirements
209 H.4 Level-setting requirements
H.5 Linearity check and harmonics checks of the test generator
H.6 EUT performance criteria with multiple signals
210 Annex I (informative) Port-to-port injection
I.1 General
I.2 Test setup for injection on identical ports
I.2.1 Selection of ports
I.2.2 Procedure for port-to-port injection
211 Figure I.1 – Example of setup, port-to-port injection
212 Annex J (informative) Amplifier compression and non-linearity
J.1 Objective of limiting amplifier distortion
J.2 Possible problems caused by harmonics and saturation
J.3 Limiting the harmonic content in the disturbance signal
213 J.4 Effect of linearity characteristic on the immunity test
J.4.1 General
J.4.2 Evaluation of the amplifier linearity characteristic
214 Figure J.1 – Amplifier linearity measurement setup
215 Figure J.2 – Linearity characteristic
Figure J.3 – Measurement setup for modulation depth
216 Figure J.4 – Spectrum of AM modulated signal
217 Bibliography

Related products

BS EN IEC 61000-4-6:2023 - TC
$280.87