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BS EN IEC 61007:2020:2021 Edition

BS EN IEC 61007:2020:2021 Edition

$215.11

Transformers and inductors for use in electronic and telecommunication equipment. Measuring methods and test procedures

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BSI 2021 98
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IEC 61007:2020 describes a number of tests for use in determining the significant parameters and performance characteristics of transformers and inductors for use in electronics and telecommunication equipment. These test methods are designed primarily for transformers and inductors used in all types of electronics applications that can be involved in any specification for such components. Even though these tests can be useful to the other types of transformers used in power distribution applications in utilities, industry, and others, the tests discussed in this document can supplement or complement the tests but are not intended to replace the tests in standards for transformers. Some of the tests described are intended for qualifying a product for a specific application, while others are test practices used for manufacturing and customer acceptance testing. The test methods described here include those parameters most commonly used in the electronics transformer and inductor industry: electric strength, resistance, power loss, inductance, impedance, balance, transformation ratio and many others used less frequently. This edition includes the following significant technical changes with respect to the previous edition: a) scope: the application of the scope of IEC 61007 was extended; b) Clause 2: added new references and updated the references; c) Clause 3: new definitions were added in 3.3, and in 3.7 the voltage-time product was redefined; d) test procedures were updated; e) environmental test procedures: new references were added; f) Annexes A to G were added.

PDF Catalog

PDF Pages PDF Title
2 undefined
5 Annex ZA(normative)Normative references to international publicationswith their corresponding European publications
7 English
CONTENTS
11 FOREWORD
13 1 Scope
2 Normative references
14 3 Terms and definitions
16 Figures
Figure 1 – Pulse waveform parameters
18 4 Test procedures
4.1 Test and measurement conditions
4.1.1 General
19 Tables
Table 1 – Recommended tests and specifications for specific transformer and inductor groups
21 4.1.2 Measurement uncertainty
4.1.3 Alternative test methods
4.2 Visual inspection
4.2.1 General
4.2.2 Safety screen position
4.2.3 Quality of joints
22 Figure 2 – Examples of good solder joints
23 Figure 3 – Examples of defective joints
24 4.3 Dimensioning and gauging procedure
4.4 Electrical test procedures
4.4.1 Winding resistance
25 4.4.2 Insulation tests
Table 2 – Voltage of dielectric withstanding voltage test
28 4.4.3 Losses
29 Figure 4 – No-load current test schematic
Figure 5 – No-load loss test schematic
31 Figure 6 – Simplified diagram for short-circuit power test
32 4.4.4 Inductance
4.4.5 Unbalance
33 Figure 7 – Circuit for measuring capacitance unbalance
Figure 8 – Circuit for determining common mode rejection ratio
34 Figure 9 – Circuit for measuring impedance unbalance
35 Figure 10 – Circuit for determining cross-talk attenuation
37 4.4.6 Capacitance
Figure 11 – Schematic diagram of phase unbalance and amplitude unbalance
39 Figure 12 – Typical graph for determining self-capacitance
40 4.4.7 Transformation ratios
Figure 13 – Circuit for determining inter-winding capacitance
43 Figure 14 – Circuit for measurement of voltage transformation ratio
44 Figure 15 – Circuit for measuring current transformation ratio and phase displacement
45 Figure 16 – Measuring circuit of current transformation ratio and phase displacement
46 4.4.8 Resonant frequency
Figure 17 – Circuit for determining parallel self-resonant frequency
47 4.4.9 Signal transfer characteristics
Figure 18 – Circuit for determining resonant frequency of resonant assemblies
48 Figure 19 – Circuit for determination of insertion loss
49 Figure 20 – Use of two identical transformers when the transformation ratio is not unity and/or a DC bias is required
50 Figure 21 – Illustration of return loss
51 4.4.10 Cross-talk
Figure 22 – Basic return loss test circuit
52 4.4.11 Frequency response
Figure 23 – Circuit diagram for measuring the crossover interference between two transformer coils
53 4.4.12 Pulse characteristics
54 4.4.13 Voltage-time product rating
Figure 24 – Impulse waveform measuring circuit
55 4.4.14 Total harmonic distortion
Figure 25 – Non-linearity of magnetizing current
56 4.4.15 Voltage regulation
Figure 26 – Voltage regulation test schematic
57 4.4.16 Temperature rise
58 4.4.17 Surface temperature
59 4.4.18 Polarity
Figure 27 – Phase (polarity) test using voltage measurement
60 Figure 28 – Series connection method
61 4.4.19 Screens
62 4.4.20 Noise
Table 3 – Sound-level corrections for audible noise tests
63 4.4.21 Corona tests
4.4.22 Magnetic fields
64 Figure 29 – Helmholtz structure
65 Table 4 – Cube dimensions, together with corresponding search coil data
66 4.4.23 Inrush current
4.5 Environmental test procedures
4.5.1 General
4.5.2 Soldering
4.5.3 Robustness of terminations and integral mounting devices
4.5.4 Shock
67 4.5.5 Bump
4.5.6 Vibration (sinusoidal)
4.5.7 Acceleration, steady state
4.5.8 Rapid change of temperature (thermal shock in air)
4.5.9 Sealing
4.5.10 Climatic sequence
4.5.11 Damp heat, steady state
68 4.5.12 Dry heat
4.5.13 Mould growth
4.5.14 Salt mist, cyclic (sodium chloride solution)
4.5.15 Sulphur dioxide test for contacts and connections
4.5.16 Fire hazard
4.5.17 Immersion in cleaning solvents
4.6 Endurance test procedures
4.6.1 Short-term endurance (load run)
69 4.6.2 Long-term endurance (life test)
70 Annex A (normative)DC resistance test
A.1 General
A.2 Resistance values under 1 Ω – Kelvin double-bridge method
Figure A.1 – Measurement of low resistance
71 A.3 Resistance values from 1 Ω to many kilo-ohms
A.3.1 General
A.3.2 Ammeter and voltmeter method
Figure A.2 – Kelvin double-bridge method of measuring low resistance
72 A.3.3 Substitution method
Figure A.3 – Ammeter and voltmeter method of resistance measurement
73 A.3.4 Wheatstone bridge
Figure A.4 – Measurement of resistance by substitution
Figure A.5 – Connections of Wheatstone bridge
74 A.3.5 Ohmmeter
Figure A.6 – Principle of series ohmmeter
75 A.4 Digital ohmmeter – Resistance values from under 1 Ω to many kilo-ohms
Figure A.7 – Digital ohmmeter method of resistance measurement
76 Annex B (normative)Dielectric voltage withstand test
Figure B.1– Typical high-potential test, showing section 1 under test
Figure B.2– Typical high-potential test of inductor
78 Annex C (normative)Induced voltage test
C.1 Induced voltage test
C.2 General test conditions
C.3 General test methods
Figure C.1 – Block diagram of induced voltage surge test
80 C.4 Induced excitation voltage and frequency
C.5 Repeated induced voltage testing
C.6 Excitation current
81 Annex D (normative)No-load loss
D.1 General
D.2 Excitation waveform
D.2.1 General
D.2.2 Sine-voltage (sine-flux) excitation
82 D.2.3 Sine-current excitation
D.2.4 Square-wave voltage excitation
83 D.3 Test method and instrumentation
D.3.1 General
D.3.2 Wattmeter
Figure D.1 – Triangular flux-density variation in transformer core
Figure D.2 – Test circuit for transformer no-load losses
84 D.3.3 Ammeters
D.3.4 Voltmeters
D.4 Test specifications and results
85 Annex E (normative)Quality factor, Q
E.1 General
E.2 Accuracy
E.3 Generators
E.3.1 Signal generator
E.3.2 Pulse generator
E.3.3 Antenna
Figure E.1 – Damped oscillation method
86 E.4 Capacitor
E.5 Measuring circuit
E.5.1 Oscilloscope
E.5.2 Probe
E.6 Measuring procedure
87 E.7 Calculation
Figure E.2 – Oscilloscope sweep for damped oscillation method
89 Annex F (normative)Electrostatic shielding
F.1 Symbols
Figure F.1 – Shielded single winding, core floating
Figure F.2 – Basic electrostatic symbol
Figure F.3 – Multiple-shielded single winding, core terminal (lead) provided
90 Figure F.4 – Shielded two-winding secondary, core grounded
Figure F.5 – Shielded group of windings, core floating
Figure F.6 – Multiple-shielded group of windings, core terminal (lead) provided
91 F.2 Theoretical discussion
Figure F.7 – Combination of shielding conditions
Figure F.8 – Typical two-winding shielded transformer
Figure F.9 – Simplified representation of Figure F.8
92 F.3 Measurement methods
F.3.1 Indirect method
Figure F.10 – Indirect measuring method for electrostatic shielding
93 F.3.2 Direct method
94 Annex G (normative)Corona test
G.1 Detection of corona
G.2 Analysis of corona
Figure G.1 – Typical circuit for corona measurement (circuit 1)
95 G.3 Test conditions and specifications
Figure G.2 – Typical circuit for corona measurement (circuit 2)
96 Bibliography

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