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BS EN IEC 62228-3:2019

BS EN IEC 62228-3:2019

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Integrated circuits. EMC evaluation of transceivers – CAN transceivers

Published By Publication Date Number of Pages
BSI 2019 80
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IEC 62228-3:2019 specifies test and measurement methods for EMC evaluation of CAN transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. It is applicable for CAN standard transceivers, CAN transceivers with partial networking functionality and CAN transceivers with flexible data rate capability and covers – the emission of RF disturbances, – the immunity against RF disturbances, – the immunity against impulses, and – the immunity against electrostatic discharges (ESD). This first edition cancels and replaces the first edition of IEC TS 62228 published in 2007 and constitutes a technical revision. This edition includes the following significant technical changes with respect to IEC TS 62228: a) introduction of CAN transceivers with partial networking functionality and CAN transceivers with flexible data rate capability and addition of operation modes and test descriptions in the respective subclauses of the document; b) introduction of minimal communication network with two CAN transceivers; c) update of the test requirements and targets in Annex C; d) addition of Annex D for common mode choke characterization.

PDF Catalog

PDF Pages PDF Title
2 undefined
5 Annex ZA(normative)Normative references to international publicationswith their corresponding European publications
7 English
CONTENTS
11 FOREWORD
13 1 Scope
2 Normative references
14 3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
15 3.2 Abbreviated terms
4 General
16 5 Test and operating conditions
5.1 Supply and ambient conditions
Tables
Table 1 ā€“ Overview of measurements and tests
17 5.2 Test operation modes
5.3 Test configuration
5.3.1 General test configuration for transceiver network
Table 2 ā€“ Supply and ambient conditions for functional operation
18 5.3.2 General test configuration for unpowered ESD test
Figures
Figure 1 ā€“ General test configuration for tests in transceiver network
Figure 2 ā€“ General test configuration for unpowered ESD test
19 5.3.3 Transceiver network tests ā€“ Coupling ports and networks
Figure 3 ā€“ Transceiver network tests ā€“ Coupling ports and networks
20 5.3.4 ESD tests ā€“ Coupling ports and networks
Table 3 ā€“ Transceiver network tests ā€“ Component value definitionsof coupling ports and networks
21 5.4 Test signals
5.4.1 General
5.4.2 Test signals for normal operation mode
Figure 4 ā€“ Coupling ports and networks for ESD tests
Table 4 ā€“ Definitions of coupling ports for ESD tests
22 Table 5 ā€“ Communication test signal TX1
Table 6 ā€“ Communication test signal TX2a
23 5.4.3 Test signal for wake-up from low power mode
Table 7 ā€“ Communication test signal TX2b
Table 8 ā€“ Wake-up test signal TX3
24 Table 9 ā€“ Communication test signal TX4a
Table 10 ā€“ Communication test signal TX4b
Table 11 ā€“ Communication test signal TX4c
25 Table 12 ā€“ Communication test signal TX4d
Table 13 ā€“ Communication test signal TX4e
Table 14 ā€“ Communication test signal TX4f1
26 Table 15 ā€“ Communication test signal TX4f2
Table 16 ā€“ Communication test signal TX4g
Table 17 ā€“ Communication test signal TX4h
27 5.5 Evaluation criteria
5.5.1 General
5.5.2 Evaluation criteria for functional operation modes
Table 18 ā€“ Communication test signal TX4i
28 Table 19 ā€“ Evaluation criteria for CAN transceiver standard functions
Table 20 ā€“ Evaluation criteria for CAN transceivers with partial networking functionality
29 Table 21 ā€“ Specific definition for test procedure for evaluationof CAN transceiver partial networking function
30 Table 22 ā€“ Evaluation criteria for CAN transceivers with flexible data rate capability
31 Figure 5 ā€“ Definition for trigger points and violation masksfor CAN transceivers with flexible data rate capability
32 Table 23 ā€“ Definitions for violation masks for CAN transceiverswith flexible data rate capability
33 5.5.3 Evaluation criteria in unpowered condition after exposure to disturbances
Figure 6 ā€“ Principal drawing of the maximum deviation on an IV characteristic
34 5.5.4 Status classes
6 Test and measurement
6.1 Emission of RF disturbances
6.1.1 Test method
6.1.2 Test setup
Table 24 ā€“ Definition of functional status classes
35 6.1.3 Test procedure and parameters
Figure 7 ā€“ Test setup for measurement of RF disturbances
36 6.2 Immunity to RF disturbances
6.2.1 Test method
6.2.2 Test setup
Table 25 ā€“ Settings of the RF measurement equipment
Table 26 ā€“ RF emission measurements
37 6.2.3 Test procedure and parameters
Figure 8 ā€“ Test setup for DPI tests
38 Table 27 ā€“ Specifications for DPI tests
39 Table 28 ā€“ DPI tests for functional status class AIC evaluation of CAN transceiver standard function
40 Table 29 ā€“ DPI tests for functional status class AIC evaluation of CAN transceiver partial networking function
41 Table 30 ā€“ DPI tests for functional status class AIC evaluation of CAN transceiver CAN FD function
Table 31 ā€“ DPI tests for functional status class CIC or DIC evaluation of CAN transceivers
42 6.3 Immunity to impulses
6.3.1 Test method
6.3.2 Test setup
Figure 9 ā€“ Test setup for impulse immunity tests
43 6.3.3 Test procedure and parameters
Table 32 ā€“ Specifications for impulse immunity tests
Table 33 ā€“ Parameters for impulse immunity test
44 Table 34 ā€“ Impulse immunity tests for functional status class AIC evaluation of CAN transceiver standard function
45 Table 35 ā€“ Impulse immunity tests for functional status class AIC evaluation of CAN transceiver partial networking function
Table 36 ā€“ Impulse immunity tests for functional status class AIC evaluation of CAN transceiver CAN FD function
46 6.4 Electrostatic discharge (ESD)
6.4.1 Test method
6.4.2 Test setup
Table 37 ā€“ Impulse immunity tests for functional statusclass CIC or DIC evaluation of CAN transceivers
47 Figure 10 ā€“ Test setup for direct ESD tests ā€“ Principal arrangement
48 6.4.3 Test procedure and parameters
Figure 11 ā€“ Test setup for direct ESD tests ā€“ Stimulation and monitoring
Table 38 ā€“ Specifications for direct ESD tests
49 7 Test report
Table 39 ā€“ ESD tests in unpowered mode for functionalstatus class DIC evaluation of CAN transceivers
50 Annex A (normative)CAN test circuits
A.1 General
A.2 Test circuit for CAN transceivers for functional tests
52 Figure A.1 ā€“ General drawing of the circuit diagram of test networkfor CAN standard transceivers for functional test
54 A.3 Test circuit for CAN transceiver for ESD test
Figure A.2 ā€“ General drawing of the circuit diagram of test network for CAN PN transceivers for functional test
55 Figure A.3 ā€“ General drawing of the circuit diagram for direct ESD tests of CAN transceivers in unpowered mode
56 Annex B (normative)Test circuit boards
B.1 Test circuit board for functional tests
B.2 ESD test
Figure B.1 ā€“ Example of IC interconnections of CAN signal
57 Figure B.2 ā€“ Example of ESD test board for CAN transceivers
Table B.1 ā€“ Parameters of ESD test circuit board
58 Annex C (informative)Examples for test limits for CAN transceiverin automotive application
C.1 General
C.2 Emission of RF disturbances
Figure C.1 ā€“ Example of limits for RF emission ā€“ CAN with bus filter
59 C.3 Immunity to RF disturbances
Figure C.2 ā€“ Example of limits for RF emission ā€“ Other global pins
Figure C.3 ā€“ Example of limits for RF emission ā€“ Local supplies
60 Figure C.4 ā€“ Example of limits for RF immunity for functionalstatus class AIC ā€“ CAN with bus filter
Figure C.5 ā€“ Example of limits for RF immunity for functional status class AIC ā€“ CAN
61 Figure C.6 ā€“ Example of limits for RF immunity for functionalstatus class AIC ā€“ Other global pins
Figure C.7 ā€“ Example of limits for RF immunity for functionalstatus class CIC or DIC ā€“ CAN with bus filter
62 C.4 Immunity to impulses
C.5 Electrostatic discharge (ESD)
Figure C.8 ā€“ Example of limits for RF immunity for functionalstatus class CIC or DIC ā€“ Other global pins
Table C.1 ā€“ Example of limits for impulse immunity for functional status class CIC or DIC
63 Annex D (informative)Characterization of common mode choke for CAN bus interfaces
D.1 General
D.2 Abbreviations
D.3 CMC test
D.3.1 General
64 D.3.2 Leakage inductance mismatch measurement
Figure D.1 ā€“ General electrical drawing of a CMC
Figure D.2 ā€“ Test setup for 2-port S-parameter measurements for leakage inductance evaluation
65 Figure D.3 ā€“ Example of a two-port test boardfor CMC leakage inductance characterization
66 Table D.1 ā€“ Test procedure and parameters for leakage inductance evaluation
67 Table D.2 ā€“ Leakage inductance measurements
68 D.3.3 S-parameter measurement mixed mode
Figure D.4 ā€“ Example of CMC characterization measurement results
Table D.3 ā€“ Leakage inductance mismatch classes
69 Figure D.5 ā€“ Test setup for S-parameter measurements
Table D.4 ā€“ Test procedure and parameters for 3-port test board characterization
70 Figure D.6 ā€“ Example test board S-parameter measurement ā€“ Mixed mode, top layer
Figure D.7 ā€“ Example test board S-parameter measurement ā€“ Single ended, top layer
71 Table D.5 ā€“ Test procedure and parameters for S-parameter measurements
72 Figure D.8 ā€“ Recommended characteristics for Sdd21 (IL)
Table D.6 ā€“ Required S-parameter measurements
73 D.3.4 ESD damage
Figure D.9 ā€“ Recommended characteristic for Scc21 (CMR)
Figure D.10 ā€“ Recommended characteristic for Ssd21 and Ssd12 (DCMR)
74 Figure D.11 ā€“ Test setup for ESD damage tests
75 Figure D.12 ā€“ Example test board ESD, top layer
Table D.7 ā€“ Test parameters for ESD damage tests
76 D.3.5 Saturation test at RF disturbances
Figure D.13 ā€“ Test setup for RF saturation measurements
Table D.8 ā€“ Required ESD tests for damage
77 Figure D.14 ā€“ Example RF saturation/S-parameter test board, top layer
Table D.9 ā€“ Test procedure and parameters for RF saturation tests
78 Table D.10 ā€“ Required RF saturation tests
79 Bibliography

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