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BS EN IEC 62228-6:2022

BS EN IEC 62228-6:2022

$152.82

Integrated circuit. EMC evaluation of transceivers – PSI5 transceivers

Published By Publication Date Number of Pages
BSI 2022 56
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This document specifies test and measurement methods for EMC evaluation of Peripheral Sensor Interface 5 (PSI5) transceiver integrated circuits (ICs) under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. It is applicable for PSI5 satellite ICs (e.g. sensors) and ICs with embedded PSI5 transceivers (e.g. PSI5 Electronic control unit IC). The document covers – the emission of RF disturbances, – the immunity against RF disturbances, – the immunity against impulses and – the immunity against electrostatic discharges (ESD).

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PDF Pages PDF Title
2 undefined
5 Annex ZA (normative)Normative references to international publicationswith their corresponding European publications
6 Blank Page
7 English
CONTENTS
10 FOREWORD
12 1 Scope
2 Normative references
13 3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
3.2 Abbreviated terms
4 General
14 Figures
Figure 1 ā€“ PSI5 system overview
Tables
Table 1 ā€“ PSI5 physical layer electrical characteristics
15 Figure 2 ā€“ Example PSI5 wiring diagram with a single sensor and equivalent model
Table 2 ā€“ Overview of required measurements and tests
16 5 Test and operating conditions
5.1 Supply and ambient conditions
5.2 Test operation modes
Table 3 ā€“ Supply and ambient conditions for functional operation
17 Figure 3 ā€“ PSI5-A configuration with a single sensor connection with two wires
Figure 4 ā€“ PSI5-P configuration with two sensor connection
18 5.3 Test configuration
5.3.1 General test configuration for functional test
Figure 5 ā€“ General test configuration for tests in functional operation modes
Table 4 ā€“ Sensor sink current specification
19 5.3.2 General test configuration for unpowered ESD test
5.3.3 Coupling ports for functional tests
Figure 6 ā€“ General test configuration for unpowered ESD test of an ECU IC
Figure 7 ā€“ General test configuration for unpowered ESD test of a satellite IC
20 Figure 8 ā€“ Coupling ports for transceiver emission and immunity tests
Table 5 ā€“ Definitions for component values of coupling portsfor transceiver emission and immunity tests
21 5.3.4 Coupling ports for unpowered ESD tests
Figure 9 ā€“ Coupling ports for unpowered ESD tests
22 5.4 Test signals
5.4.1 General
5.4.2 Test signals for Asynchronous mode
Table 6 ā€“ Definitions of coupling ports for unpowered ESD tests
23 Table 7 ā€“ Communication test signal TX1 for Asynchronous mode (125 kbps)
24 Table 8 ā€“ Communication test signal TX2 for Asynchronous mode (189 kbps)
25 5.4.3 Test signal for Synchronous parallel bus mode
Table 9 ā€“ Communication test signal TX3 for Asynchronous low-power mode
26 5.5 Evaluation criteria
5.5.1 General
Table 10 ā€“ Communication test signal TX4 for Synchronous parallel bus mode
Table 11 ā€“ Communication test signal TX5 for Synchronous parallel bus mode
27 5.5.2 Evaluation criteria in functional operation modes during exposure to disturbances
5.5.3 Evaluation criteria in unpowered condition after exposure to disturbances
Table 12 ā€“ Evaluation criteria for standalone and embedded PSI5transceiver IC in functional operation modes
28 6 Test and measurement
6.1 Emission of RF disturbances
6.1.1 Test method
6.1.2 Test setup
Figure 10 ā€“ Example drawing of the maximum deviation on an IV characteristic
29 Figure 11 ā€“ Test setup for measurement of RF disturbances
30 6.1.3 Test procedure and parameters
6.2 Immunity to RF disturbances
6.2.1 Test method
6.2.2 Test setup
Table 13 ā€“ Parameters for emission measurements
Table 14 ā€“ Settings of the RF measurement equipment
31 Figure 12 ā€“ Test setup for DPI tests
32 6.2.3 Test procedure and parameters
Table 15 ā€“ Specifications for DPI tests
33 Table 16 ā€“ Required DPI tests for functional status class AIC evaluation of Standard PSI5 transceiver ICs and embedded PSI5 transceiver ICs
Table 17 ā€“ Required DPI tests for functional status class CIC or DIC evaluation of standard PSI5 transceiver ICs and ICs with embedded PSI5 transceiver
34 6.3 Immunity to impulses
6.3.1 Test method
6.3.2 Test setup
Figure 13 ā€“ Test setup for impulse immunity tests
35 6.3.3 Test procedure and parameters
Table 18 ā€“ Specifications for impulse immunity tests
36 Table 19 ā€“ Parameters for impulse immunity test
Table 20 ā€“ Required impulse immunity tests for functional status class AIC evaluation of standard and embedded PSI5 transceiver ICs
Table 21 ā€“ Required impulse immunity tests for functional status class CIC or DIC evaluation of Standard PSI5 transceiver ICs and ICs with embedded PSI transceiver
37 6.4 Electrostatic discharge (ESD)
6.4.1 Test method
6.4.2 Test setup
38 Figure 14 ā€“ Test setup for direct ESD tests
39 6.4.3 Test procedure and parameters
40 7 Test report
Table 22 ā€“ Specifications for direct ESD tests
41 Annex A (normative)PSI5 test circuits
A.1 General
A.2 Test circuit for emission and immunity tests on a PSI5 ECU IC
43 Figure A.1 ā€“ General circuit diagram of the PSI5 test networkfor emission and immunity tests on ECU IC
44 A.3 Test circuit for emission and immunity tests on a PSI5 satellite IC
45 Figure A.2 ā€“ General circuit diagram of the PSI5 test networkfor emission and immunity tests on Satellite IC
46 A.4 Test circuit for an unpowered ESD test on a PSI5 IC
Figure A.3 ā€“ General circuit diagram of the PSI5 ECU ICfor testing of direct ESD in unpowered mode
47 Figure A.4 ā€“ General circuit diagram of the PSI5 sensor ICfor testing of direct ESD in unpowered mode
48 Annex B (normative)Test circuit boards
B.1 Test circuit board for emission and immunity tests
B.2 ESD test
Table B.1 ā€“ Parameter ESD test circuit board
49 Annex C (informative)Examples of test limits for PSI5 transceiver in automotive applications
C.1 General
C.2 Emission of RF disturbances
Figure C.1 ā€“ Example of limits for RF emission ā€“ PSI5 pins
50 C.3 Immunity to RF disturbances
Figure C.2 ā€“ Example of limits for RF emission ā€“ Other global pins
51 Figure C.3 ā€“ Example of limits for RF immunity for functional status class AIC ā€“ PSI5 pins
Figure C.4 ā€“ Example of limits for RF immunity for functional status class AIC ā€“ Other global pins
52 Figure C.5 ā€“ Example of limits for RF immunity for functional status class CIC or DIC ā€“ PSI5 pins
Figure C.6 ā€“ Example of limits for RF immunity for functional status class CIC or DIC ā€“ Other global pins
53 C.4 Immunity to Impulses
C.5 ESD
Table C.1 ā€“ Example of limits for impulse immunity for functional status class CIC or DIC
54 Bibliography

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BS EN IEC 62228-6:2022
$152.82