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BS EN IEC 62228-7:2022

BS EN IEC 62228-7:2022

$198.66

Integrated circuits. EMC evaluation of transceivers – Part 7. CXPI transceivers

Published By Publication Date Number of Pages
BSI 2022 56
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This part of IEC 62228 specifies test and measurement methods for the EMC evaluation of CXPI transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. This specification is applicable for standard CXPI transceiver ICs and ICs with embedded CXPI transceiver and covers – the emission of RF disturbances, – the immunity against RF disturbances, – the immunity against impulses and – the immunity against electrostatic discharges (ESD).

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PDF Pages PDF Title
2 undefined
5 Annex ZA (normative)Normative references to international publicationswith their corresponding European publications
6 Blank Page
7 English
CONTENTS
10 FOREWORD
12 1 Scope
2 Normative references
13 3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
3.2 Abbreviated terms
14 4 General
Tables
Table 1 ā€“ Types for CXPI transceiver
15 Figures
Figure 1 ā€“ PHY sub-layers overview and CXPI transceiver types
Table 2 ā€“ Overview of required measurement and tests
16 5 Test and operating conditions
5.1 Supply and ambient conditions
5.2 Test operation modes
Table 3 ā€“ Supply and ambient conditions for functional operation
17 5.3 Test configuration
5.3.1 General test configuration for functional test
Figure 2 ā€“ General test configuration for tests in functional operation modes
18 5.3.2 General test configuration for unpowered ESD test
5.3.3 Coupling ports and coupling networks for functional tests
Figure 3 ā€“ General test configuration for unpowered ESD test
Figure 4 ā€“ Coupling ports and networks for functional tests
19 5.3.4 Coupling ports and coupling networks for unpowered ESD tests
Figure 5 ā€“ Coupling ports and networks for unpowered ESD tests
Table 4 ā€“ Definition of coupling ports and couplingnetwork components for functional tests
20 5.3.5 Power supply with decoupling network
5.4 Test signals
5.4.1 General
5.4.2 Test signals for normal operation mode
Table 5 ā€“ Definitions of coupling ports for unpowered ESD tests
21 Table 6 ā€“ Communication test signal TX1
22 5.4.3 Test signal for wake-up from sleep mode
Table 7 ā€“ Communication test signal TX2
Table 8 ā€“ Communication test signal TX3
23 5.5 Evaluation criteria
5.5.1 General
5.5.2 Evaluation criteria in functional operation modes during exposure to disturbances
Table 9 ā€“ Wake-up test signal TX4
24 Table 10 ā€“ Evaluation criteria for standard type-A in functional operation modes
Table 11 ā€“ Evaluation criteria for standard type-B in functional operation modes
25 5.5.3 Evaluation criteria in unpowered condition after exposure to disturbances
Figure 6 ā€“ Principal drawing of the maximum deviation in the I-V characteristic
Table 12 ā€“ Evaluation criteria for ICs with embedded CXPItransceiver in functional operation modes
26 5.5.4 Status classes
6 Test and measurement
6.1 Emission of RF disturbances
6.1.1 Test method
6.1.2 Test setup
Figure 7 ā€“ Test setup for measurement of RF disturbances
27 6.1.3 Test procedure and parameters
6.2 Immunity to RF disturbances
6.2.1 Test method
Table 13 ā€“ Parameters for emission measurements
Table 14 ā€“ Settings for the RF measurement equipment
28 6.2.2 Test setup
Figure 8 ā€“ Test setup for DPI tests
29 6.2.3 Test procedure and parameters
Table 15 ā€“ Specifications for DPI tests
30 Table 16 ā€“ Required DPI tests for functional statusclass AIC evaluation of standard type-A
Table 17 ā€“ Required DPI tests for functional statusclass AIC evaluation of standard type-B
Table 18 ā€“ Required DPI tests for functional statusclass AIC evaluation of ICs with embedded CXPI transceiver
31 6.3 Immunity to impulses
6.3.1 Test method
6.3.2 Test setup
Table 19 ā€“ Required DPI tests for functional status class CIC, D1IC or D2IC evaluation of standard CXPI transceiver ICs and ICs with embedded CXPI transceiver
32 6.3.3 Test procedure and parameters
Figure 9 ā€“ Test setup for impulse immunity tests
33 Table 20 ā€“ Specifications for impulse immunity tests
Table 21 ā€“ Parameters for impulse immunity tests
34 Table 22 ā€“ Required impulse immunity tests for functional statusclass AIC evaluation of standard type-A
Table 23 ā€“ Required impulse immunity tests for functional statusclass AIC evaluation of standard type-B
Table 24 ā€“ Required impulse immunity tests for functional statusclass AIC evaluation of ICs with embedded CXPI transceiver
35 6.4 Electrostatic discharge (ESD)
6.4.1 Test method
6.4.2 Test setup
Table 25 ā€“ Required impulse immunity tests for functional status class CIC, D1IC or D2IC evaluation of standard CXPI transceiver ICs and ICs with embedded CXPI transceiver
36 Figure 10 ā€“ Test setup for direct ESD tests
37 6.4.3 Test procedure and parameters
7 Test report
Table 26 ā€“ Specifications for direct ESD tests
38 Annex A (normative)CXPI test circuits
A.1 General
A.2 CXPI test circuit for functional tests on standard type-A CXPI transceiverICs
40 Figure A.1 ā€“ General drawing of the circuit diagram of the test networkfor standard type-A CXPI transceiver ICs for functional tests
41 A.3 CXPI test circuit for functional tests on standard type-B CXPI transceiverICs
42 Figure A.2 ā€“ General drawing of the circuit diagram of the test networkfor standard type-B CXPI transceiver ICs for functional tests
43 A.4 CXPI test circuit for functional tests on ICs with embedded CXPItransceiver
44 A.5 CXPI test circuit for unpowered ESD test on a standard type-A CXPI transceiver IC
Figure A.3 ā€“ General drawing of the circuit diagram of the test networkfor ICs with embedded CXPI transceiver for functional tests
45 A.6 CXPI test circuit for unpowered ESD test on a standard type-B CXPI transceiver IC
Figure A.4 ā€“ A general drawing of the test circuit diagram fortesting direct ESD of CXPI transceiver in unpowered mode
46 Figure A.5 ā€“ A general drawing of the test circuit diagram for testing direct ESD of CXPI standard Type-B transceiver in unpowered mode
47 Annex B (normative)Test circuit boards
B.1 Test circuit board for functional tests
Figure B.1 ā€“ Example of IC interconnections of CXPI signal
48 B.2 ESD test
Figure B.2 ā€“ Example of ESD test board for CXPI transceiver ICs
Table B.1 ā€“ Parameter ESD test circuit board
49 Annex C (informative)Examples for test limits for CXPI transceiver in automotive application
C.1 General
C.2 Emission of RF disturbances
C.3 Immunity to RF disturbances
C.4 Immunity to impulse
C.5 Electrostatic discharge (ESD)
Table C.1 ā€“ Example of limits for impulse immunity for functional status class CIC or DIC
50 Annex D (informative)Example of setting for test signals
Figure D.1 ā€“ Example of signal setting for standardtype-A in 2 transceiver configuration
51 Figure D.2 ā€“ Example of signal setting for standardtype-B in 2 transceiver configuration
52 Annex E (informative)Points to note for impulse immunity measurementfor functional status class AIC
E.1 General
E.2 Points to note when testing Pulse 1
Figure E.1 ā€“ Relationship between ISO 7637-2 Pulse 1 and transceiver VBAT supply
53 Figure E.2 ā€“ Transceiver VBAT supply image when t2 time is shortened
54 Bibliography

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BS EN IEC 62228-7:2022
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