BS IEC 60747-14-4:2011
$215.11
Semiconductor devices. Discrete devices – Semiconductor accelerometers
Published By | Publication Date | Number of Pages |
BSI | 2011 | 102 |
IEC 60747-14-4:2011 applies to semiconductor accelerometers for all types of products. This standard applies not only to typical semiconductor accelerometers with built-in electric circuits, but also to semiconductor accelerometers accompanied by external circuits. This standard does not (or should not) violate (or interfere with) the agreement between customers and suppliers in terms of a new model or parameters for business. NOTE 1: This standard, although directed toward semiconductor accelerometers, may be applied in whole or in part to any mass produced type of accelerometer. NOTE 2: The purpose of this standard is to allow for a systematic description, which covers the subjects initiated by the advent of semiconductor accelerometers. The tasks imposed on the semiconductor accelerometers are not only common to all accelerometers but also inherent to them and not yet totally solved. The descriptions are based on latest research results. One typical example is the multi-axis accelerometer. This standard states the method of measuring acceleration as a vector quantity using multi-axis accelerometers. NOTE 3: This standard does not conflict in any way with any existing parts of either ISO 16063 or ISO 5347. This standard intends to provide the concepts and the procedures of calibration of the semiconductor multi-axis accelerometers which are used not only for the measurement of acceleration but also for the control of motion in the wide frequencies ranging from DC. This publication is to be read in conjunction with /2.
PDF Catalog
PDF Pages | PDF Title |
---|---|
4 | English CONTENTS |
7 | FOREWORD |
9 | INTRODUCTION |
10 | 1 Scope 2 Normative references |
11 | 3 Terminology and letter symbols 3.1 Terms and definitions |
17 | 3.2 Letter symbols Tables Table 1 – List of letter symbols |
18 | 4 Essential ratings and characteristics 4.1 General |
19 | Figures Figure 1 – Single axis accelerometer Figure 2 – Multi-axis accelerometer |
20 | Figure 3 – Concept of the mathematical definition of accelerometers Table 2 – Level of accelerometers and the definition |
22 | 4.2 Ratings (limiting values) 4.3 Recommended operating conditions |
23 | 4.4 Characteristics |
25 | 5 Measuring methods 5.1 General |
26 | Table 3 – Test items and the recommended corresponding measurement methods |
27 | 5.2 Testing methods for characteristics Table 4 – Relation between recommended applicable calibration methods and type of accelerometers |
30 | Figure 4 – Concept of dynamic linearity of an accelerometer on gain |
31 | Figure 5 – Concept of dynamic linearity of an accelerometer on phase |
35 | Figure 6 – The semiconductor accelerometer as a system |
36 | Figure 7 – Example of the structure of assembled semiconductor accelerometer s ystem for the concept of accelerometer frequency response |
37 | Figure 8 – Schematic diagram of frequency response measurement by electrical input |
38 | 6 Acceptance and reliability 6.1 General 6.2 Environmental test |
40 | 6.3 Reliability test |
41 | Annex A (informative) Definition of sensitivity matrix of an accelerometer |
48 | Figure A.1 – Example of direction cosine Table A.1 – Symbols for the relationship between input acceleration and the output signal from an accelerometer using one-dimensional vibration table |
49 | Table A.2 – Symbols for input acceleration and output signals from an accelerometer Table A.3 – Definition of symbols for describing the input acceleration, output signal from the target accelerometer and the direction cosine repeated three times |
51 | Table A.4 – Relationship between the expression of transfer function in a matrix form and the number of axis of the target accelerometers |
55 | Figure A.2 – Accelerometers or pick-offs assembled in a normal co-ordinate system (top figure) and the acceleration component projection to the three co-ordinate axis plains, XY, YZ and ZX (bottom figure) |
59 | Table A.5 – Definition of vector space related to the generalization of the transverse sensitivity using the vector space concept |
61 | Table A.6 – Relation between input acceleration and output signal for the calibration, using the six-dimensional vibration table |
77 | Table A.7 – Normal sensitivities, explicit cross-sensitivities and implicit cross-sensitivities obtained by the calibration carried out in the application acceleration vector space with three dimensions |
78 | Table A.8 – Normal sensitivities, explicit cross-sensitivities and implicit cross-sensitivities obtained by the calibration carried out in the application acceleration vector space with six dimensions |
79 | Table A.9 – List of symbols in terms of measurement uncertainty using an accelerometer with M output axis assuming that N is larger than M |
81 | Annex B (informative) Dynamic linearity measurement using an impact acceleration generator Table B.1 – Dynamic linearity when both input and output are vector quantities |
82 | Table B.2 – Relations between the direction cosine of the input acceleration to one-axis accelerometers and the signal from the output axis |
83 | Table B.3 – Relationship between the direction cosine of the input acceleration to one-axis accelerometers and the signal from the output axis |
84 | Table B.4 – Conditions on the direction cosine for dynamic linearity measurement Table B.5 – Relations between the direction cosine of the input acceleration to two-axis accelerometers and the signal from the output axis |
85 | Table B.6 – Relations between the direction cosine of the input acceleration to two-axis accelerometers and the signal from the output axis Table B.7 – Conditions on the direction cosine for the dynamic linearity measurement |
86 | Table B.8 – Relationship between the direction cosine of the input acceleration to three-axis accelerometers and the signal from the output axis |
87 | Table B.9 – Relations between the direction cosine of the input acceleration to three-axis accelerometers and the signal from the output axis Table B.10 – Conditions on the direction cosine for dynamic linearity measurement |
88 | Figure B.1 – Set-up for dynamic linearity measurement |
90 | Annex C (informative) Measurement of peak sensitivity Figure C.1 – Peak sensitivity as a function of each frequency bandwidth from DC to fn Table C.1 – Definition of elements in one-axis accelerometer peak sensitivity |
91 | Table C.2 – Peak sensitivity of one-axis accelerometer Table C.3 – Relationship of direction cosine and the co-ordinate system of the target accelerometer |
93 | Table C.4 – Definition of elements in two-axis accelerometer peak sensitivity |
95 | Table C.5 – Definition of elements in three-axis accelerometer peak sensitivity |
98 | Figure C.2 – Set-up for the control of frequency bandwidth of shock acceleration |
99 | Bibliography |