BS IEC 60747-5-15:2022
$102.76
Semiconductor devices – Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the electroreflectance spectroscopy
Published By | Publication Date | Number of Pages |
BSI | 2022 | 18 |
PDF Catalog
PDF Pages | PDF Title |
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2 | undefined |
4 | CONTENTS |
5 | FOREWORD |
7 | 1 Scope 2 Normative references 3 Terms, definitions and abbreviated terms 3.1 Terms and definitions |
8 | 3.2 Abbreviated terms 4 Measuring methods 4.1 Basic requirements 4.1.1 Measuring conditions 4.1.2 Measuring instruments and equipment 4.2 Purpose |
9 | 4.3 Measurement 4.3.1 Measurement setup 4.3.2 Measurement principle Figures Figure 1 ā Schematic diagram of the ER setup |
10 | Figure 2 ā Schematic illustration of the quantum welland the ER signal under different voltages |
11 | 4.3.3 Measurement sequence 5 Test report Figure 3 ā Sequence of the measurement of the flat-band voltage |
12 | Annex A (informative)Test example Figure A.1 ā ĪR/R versus wavelength at different bias voltages |
13 | Figure A.2 ā ER peak as a function of reverse-bias voltage |
14 | Table A.1 ā Summary of test report |
15 | Annex B (informative)Background information Figure B.1 ā Schematic illustration of polarizations in the InGaN/GaN materialsystem and resulting internal electric field |
16 | Bibliography |